Patents by Inventor Thierry Lieu

Thierry Lieu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System test scope and plan optimization
    Patent number: 8954931
    Abstract: Various embodiments include at least one or systems, methods, and software providing abilities to automatically generate a test plan that mitigates risk involved in testing less than an entirety of a software system following modification. Some embodiments operate to allow a user to influence the scope of an optimized test plan while also reducing a number of tests and test execution effort involved. Such embodiments may identify portions of the software system to test and portions of the software system that will not be tested in a manner that reduces a total testing effort involved. Reductions in testing effort are performed in generation of the test plan in view of testing preferences which are utilized not only to reduce the total effort in executing a test plan, but also does so to optimize the test plan.
    Type: Grant
    Filed: August 3, 2012
    Date of Patent: February 10, 2015
    Assignee: SAP SE
    Inventors: Marcus Wefers, Reinhold Konnerth, Thierry Lieu, Abdelhak Nezzari, Michael Schaffrath, Torsten Kamenz, Andreas Kemmler
  • SYSTEM TEST SCOPE AND PLAN OPTIMIZATION
    Publication number: 20140040867
    Abstract: Various embodiments include at least one or systems, methods, and software providing abilities to automatically generate a test plan that mitigates risk involved in testing less than an entirety of a software system following modification. Some embodiments operate to allow a user to influence the scope of an optimized test plan while also reducing a number of tests and test execution effort involved. Such embodiments may identify portions of the software system to test and portions of the software system that will not be tested in a manner that reduces a total testing effort involved. Reductions in testing effort are performed in generation of the test plan in view of testing preferences which are utilized not only to reduce the total effort in executing a test plan, but also does so to optimize the test plan.
    Type: Application
    Filed: August 3, 2012
    Publication date: February 6, 2014
    Applicant: SAP AG
    Inventors: Marcus Wefers, Reinhold Konnerth, Thierry Lieu, Abdelhak Nezzari, Michael Schaffrath, Torsten Kamenz, Andreas Kemmler