Abstract: The present disclosure relates to a test and/or measurement system. The test and/or measurement system comprises: a vector network analyzer, VNA, comprising a test port for forwarding RF signals; a switch matrix comprising an input port which is arranged for being connected to the test port of the VNA, and a plurality of output ports which are arranged for being connected to a device-under-test, wherein the switch matrix is configured to electrically connect the input port to one of the plurality of output ports.

Abstract: A system includes a noise circuit, a first port, a second port, a receiver circuit, and a processing circuit. The noise circuit is configured to generate a noise signal having a frequency spectrum that extends over a predetermined frequency band of interest. The noise circuit is connected to the first port. The first port is connectable to a first DUT port. The second port is connectable to a second DUT port and receives a test signal from the DUT. The receiver circuit is connected to the second port for receiving the test signal. The receiver circuit is configured to digitize the test signal. The processing circuit is configured to transform the digitized test signal into frequency domain, having a plurality of frequency bins. The processing circuit is configured to determine a signal power of the transformed test signal for at least two frequency bins simultaneously.

Abstract: The present disclosure relates to a calibration system for a vector network analyzer (VNA), having a plurality of N ports. The calibration system comprises a distribution unit having a plurality of D?N ports; and a plurality of D?N calibration units, respectively comprising a calibration circuit having first, second and third ports and an isolation circuit having first, second and third ports.

Abstract: A measurement system includes a signal analysis circuit, a signal generator circuit, a control circuit, and a DUT connector. The DUT connector is connectable to a device under test for receiving a measurement signal outputted by the DUT. The signal analysis circuit is connected to the DUT connector for receiving the measurement signal. The signal generator circuit is configured to generate a radio frequency (RF) test signal that is transmitted to the DUT. The signal analysis circuit is configured to digitize the measurement signal, thereby obtaining a digitized measurement signal. The control circuit is configured to control the signal generator circuit to generate the RF test signal based on the digitized measurement signal, based on known error parameters of an error model of the measurement system, and based on a desired reflection coefficient at a reference plane associated with the DUT.

Abstract: The present disclosure relates to a calibration system for a vector network analyzer (VNA), having a plurality of N ports. The calibration system comprises a distribution unit having a plurality of D?N ports; and a plurality of D?N calibration units, respectively comprising a calibration circuit having first, second and third ports and an isolation circuit having first, second and third ports.

Abstract: A measuring device includes a first measuring port connected to an optical interface which can be connected to an optical input or output of a device under test (DUT). The device includes a second measuring port which can be connected to a radio frequency (RF) input or output of the DUT. The optical interface is connected to the optical input of the DUT and the second measuring port is connected to the RF output of the DUT. The first measuring port generates an analog measuring signal and provides it to the optical interface. The optical interface generates an optical measuring signal based on the analog measuring signal and provides it to the optical input of the DUT. The second measuring port receives an analog measuring signal generated by the DUT based on the optical measuring signal. The processor determines S-parameters of the DUT based on the two analog measuring signals.

Abstract: The present disclosure relates to a calibration unit for a vector network analyzer (VNA). The calibration unit comprises a calibration circuit which is configured to provide the calibration standards open, short and match; and an isolation circuit. The calibration circuit comprises a first port which is arranged for being connected to a port of the VNA, a second port which is arranged for being connected to a device-under-test (DUT), and a third port which is connected to a first port of the isolation circuit; and the isolation circuit comprises a second port which is arranged for being connected to one or more further calibration units.

Abstract: The present disclosure relates to a calibration unit for a vector network analyzer (VNA). The calibration unit comprises a calibration circuit which is configured to provide the calibration standards open, short and match; and an isolation circuit. The calibration circuit comprises a first port which is arranged for being connected to a port of the VNA, a second port which is arranged for being connected to a device-under-test (DUT), and a third port which is connected to a first port of the isolation circuit; and the isolation circuit comprises a second port which is arranged for being connected to one or more further calibration units.

Abstract: A measuring device includes a first measuring port connected to an optical interface which can be connected to an optical input or output of a device under test (DUT). The device includes a second measuring port which can be connected to a radio frequency (RF) input or output of the DUT. The optical interface is connected to the optical input of the DUT and the second measuring port is connected to the RF output of the DUT. The first measuring port generates an analog measuring signal and provides it to the optical interface. The optical interface generates an optical measuring signal based on the analog measuring signal and provides it to the optical input of the DUT. The second measuring port receives an analog measuring signal generated by the DUT based on the optical measuring signal. The processor determines S-parameters of the DUT based on the two analog measuring signals.

Abstract: A vector network analyzer is provided which includes a first measuring port, a digital interface connected to the first measuring port, a second measuring port adapted to be connected to a radio frequency (RF) input or output of a device under test (DUT), and a processor. The digital interface is adapted to be connected to a digital input or output of the DUT. The processor is adapted to determine scattering parameters (S-parameters) of the DUT based on measuring signals transmitted to the DUT and received from the DUT by the first measuring port and the second measuring port.

Abstract: A vector network analyzer is provided which includes a first measuring port, a digital interface connected to the first measuring port, a second measuring port adapted to be connected to a radio frequency (RF) input or output of a device under test (DUT), and a processor. The digital interface is adapted to be connected to a digital input or output of the DUT. The processor is adapted to determine scattering parameters (S-parameters) of the DUT based on measuring signals transmitted to the DUT and received from the DUT by the first measuring port and the second measuring port.

Abstract: A vector network analyzer comprises a first measuring port, a first digital interface, connected to the first measuring port, adapted to be connected to a digital input or output of a device under test, and a second measuring port, adapted to be connected to a radio frequency input or output of the device under test. It also comprises a processor, adapted to determine S-parameters of the device under test based upon measuring signals transmitted to the device under test and receive from the device under test by the first measuring port and the second measuring port.

Abstract: A method of measuring the AM/PM conversion of a device under test having a local oscillator is described. A device under test with an embedded local oscillator is provided. A signal source is connected to an input of the device under test. A receiver is connected to an output of the device under test. An input signal is provided by the signal source. The input signal has an initial power level. The input signal is input to the device under test. The power level of the input signal is changed. An output signal of the device under test is measured at different power levels of the input signal.

Abstract: A method of measuring the AM/PM conversion of a device under test having a local oscillator is described. A device under test with an embedded local oscillator is provided. A signal source is connected to an input of the device under test. A receiver is connected to an output of the device under test. An input signal is provided by the signal source. The input signal has an initial power level. The input signal is input to the device under test. The power level of the input signal is changed. An output signal of the device under test is measured at different power levels of the input signal.

Abstract: A measurement device comprising a measurement unit adapted to measure a transmission characteristic for providing an eye pattern; and a conversion unit adapted to convert automatically the eye pattern into a character separated values, CSV, file.

Abstract: A vector network analyzer comprises a first measuring port, a first digital interface, connected to the first measuring port, adapted to be connected to a digital input or output of a device under test, and a second measuring port, adapted to be connected to a radio frequency input or output of the device under test. It also comprises a processor, adapted to determine S-parameters of the device under test based upon measuring signals transmitted to the device under test and receive from the device under test by the first measuring port and the second measuring port.

Abstract: A measurement device comprising a measurement unit adapted to measure a transmission characteristic for providing an eye pattern; and a conversion unit adapted to convert automatically the eye pattern into a character separated values, CSV, file.

Abstract: A network analyzer for measuring a group delay time, which is caused by a device under test to be measured, generates an excitation signal comprising two signals (xIn1(t),xIn2(t)) spaced by a frequency difference, excites the device with the excitation signal and measures a response signal comprising two signals (xOut1(t),xOut2(t)), which are respectively phase distorted by the device relative to the signals (xIn1(t),xIn2(t)) of the excitation signal. It determines the phase difference (??In) between the signals (xIn1(t),xIn2(t)) associated with the excitation signal and a phase difference (??Out) between the signals (xOut1(t), xOut2(t)) associated with the response signal. Finally, it calculates the group delay time from the phase difference (??In) of the signals (xIn1(t),xIn2(t)) associated with the excitation signal, the phase difference (??Out) of the signals (xOut1(t),xOut2(t) associated with the response signal and the frequency difference.

Abstract: A network analyzer for measuring a group delay time, which is caused by a device under test to be measured, generates an excitation signal comprising two signals (xIn1(t),xIn2(t)) spaced by a frequency difference, excites the device with the excitation signal and measures a response signal comprising two signals (xOut1(t),xOut2(t)), which are respectively phase distorted by the device relative to the signals (xIn1(t),xIn2(t)) of the excitation signal. It determines the phase difference (??In) between the signals (xIn1(t),xIn2(t)) associated with the excitation signal and a phase difference (??Out) between the signals (xOut1(t), xOut2(t)) associated with the response signal. Finally, it calculates the group delay time from the phase difference (??In) of the signals (xIn1(t),xIn2(t)) associated with the excitation signal, the phase difference (??Out) of the signals (xOut1(t),xOut2(t) associated with the response signal and the frequency difference.

Abstract: A method for operating a measuring device, in particular, a vectorial network analyzer, which can be connected via at least two ports to a device under test, with excitation units assigned to each port, wherein each excitation unit provides a signal generator, with which the assigned port can be supplied with an excitation signal, provides the following procedural stages: a measurement at measuring positions of the actual phase offset between the excitation signals output at the ports; and a variation of the frequency of at least one of the two signal generators during a correction interval so that a specified set phase offset is achieved at reference positions between the excitation signals output at the ports.