Patents by Inventor Thilo Bednorz
Thilo Bednorz has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20230408617Abstract: The present disclosure relates to a calibration unit for a vector network analyzer (VNA). The calibration unit comprises a calibration circuit which is configured to provide the calibration standards open, short and match; and an isolation circuit. The calibration circuit comprises a first port which is arranged for being connected to a port of the VNA, a second port which is arranged for being connected to a device-under-test (DUT), and a third port which is connected to a first port of the isolation circuit; and the isolation circuit comprises a second port which is arranged for being connected to one or more further calibration units.Type: ApplicationFiled: June 9, 2022Publication date: December 21, 2023Inventors: Maximilian FRIESINGER, Thilo BEDNORZ
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Publication number: 20230213564Abstract: A measuring device includes a first measuring port connected to an optical interface which can be connected to an optical input or output of a device under test (DUT). The device includes a second measuring port which can be connected to a radio frequency (RF) input or output of the DUT. The optical interface is connected to the optical input of the DUT and the second measuring port is connected to the RF output of the DUT. The first measuring port generates an analog measuring signal and provides it to the optical interface. The optical interface generates an optical measuring signal based on the analog measuring signal and provides it to the optical input of the DUT. The second measuring port receives an analog measuring signal generated by the DUT based on the optical measuring signal. The processor determines S-parameters of the DUT based on the two analog measuring signals.Type: ApplicationFiled: March 14, 2023Publication date: July 6, 2023Applicant: Rohde & Schwarz GmbH & Co. KGInventors: Steffen HEUEL, Steffen NEIDHARDT, Thilo BEDNORZ
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Patent number: 11630141Abstract: A vector network analyzer is provided which includes a first measuring port, a digital interface connected to the first measuring port, a second measuring port adapted to be connected to a radio frequency (RF) input or output of a device under test (DUT), and a processor. The digital interface is adapted to be connected to a digital input or output of the DUT. The processor is adapted to determine scattering parameters (S-parameters) of the DUT based on measuring signals transmitted to the DUT and received from the DUT by the first measuring port and the second measuring port.Type: GrantFiled: March 18, 2021Date of Patent: April 18, 2023Assignee: Rohde & Schwarz GmbH & Co. KGInventors: Steffen Heuel, Steffen Neidhardt, Thilo Bednorz
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Publication number: 20210223301Abstract: A vector network analyzer is provided which includes a first measuring port, a digital interface connected to the first measuring port, a second measuring port adapted to be connected to a radio frequency (RF) input or output of a device under test (DUT), and a processor. The digital interface is adapted to be connected to a digital input or output of the DUT. The processor is adapted to determine scattering parameters (S-parameters) of the DUT based on measuring signals transmitted to the DUT and received from the DUT by the first measuring port and the second measuring port.Type: ApplicationFiled: March 18, 2021Publication date: July 22, 2021Inventors: Steffen HEUEL, Steffen NEIDHARDT, Thilo BEDNORZ
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Patent number: 11041894Abstract: A vector network analyzer comprises a first measuring port, a first digital interface, connected to the first measuring port, adapted to be connected to a digital input or output of a device under test, and a second measuring port, adapted to be connected to a radio frequency input or output of the device under test. It also comprises a processor, adapted to determine S-parameters of the device under test based upon measuring signals transmitted to the device under test and receive from the device under test by the first measuring port and the second measuring port.Type: GrantFiled: February 19, 2018Date of Patent: June 22, 2021Assignee: Rohde & Schwarz GmbH & Co. KGInventors: Steffen Heuel, Steffen Neidhardt, Thilo Bednorz
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Patent number: 10768215Abstract: A method of measuring the AM/PM conversion of a device under test having a local oscillator is described. A device under test with an embedded local oscillator is provided. A signal source is connected to an input of the device under test. A receiver is connected to an output of the device under test. An input signal is provided by the signal source. The input signal has an initial power level. The input signal is input to the device under test. The power level of the input signal is changed. An output signal of the device under test is measured at different power levels of the input signal.Type: GrantFiled: October 5, 2018Date of Patent: September 8, 2020Assignee: Rohde & Schwarz GmbH & Co. KGInventors: Martin Leibfritz, Werner Held, Thilo Bednorz, Walter Weiss, Jan-Patrick Schultheis
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Publication number: 20200110118Abstract: A method of measuring the AM/PM conversion of a device under test having a local oscillator is described. A device under test with an embedded local oscillator is provided. A signal source is connected to an input of the device under test. A receiver is connected to an output of the device under test. An input signal is provided by the signal source. The input signal has an initial power level. The input signal is input to the device under test. The power level of the input signal is changed. An output signal of the device under test is measured at different power levels of the input signal.Type: ApplicationFiled: October 5, 2018Publication date: April 9, 2020Applicant: Rohde & Schwarz GmbH & Co. KGInventors: Martin Leibfritz, Werner Held, Thilo Bednorz, Walter Weiss, Jan-Patrick Schultheis
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Patent number: 10353917Abstract: A measurement device comprising a measurement unit adapted to measure a transmission characteristic for providing an eye pattern; and a conversion unit adapted to convert automatically the eye pattern into a character separated values, CSV, file.Type: GrantFiled: February 27, 2017Date of Patent: July 16, 2019Assignee: ROHDE & SCHWARZ GMBH & CO. KGInventors: Ruben Villarino Villa, Martin Leibfritz, Ulrich Tuerk, Thilo Bednorz
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Publication number: 20190056441Abstract: A vector network analyzer comprises a first measuring port, a first digital interface, connected to the first measuring port, adapted to be connected to a digital input or output of a device under test, and a second measuring port, adapted to be connected to a radio frequency input or output of the device under test. It also comprises a processor, adapted to determine S-parameters of the device under test based upon measuring signals transmitted to the device under test and receive from the device under test by the first measuring port and the second measuring port.Type: ApplicationFiled: February 19, 2018Publication date: February 21, 2019Inventors: Steffen HEUEL, Steffen NEIDHARDT, Thilo BEDNORZ
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Publication number: 20170272431Abstract: A measurement device comprising a measurement unit adapted to measure a transmission characteristic for providing an eye pattern; and a conversion unit adapted to convert automatically the eye pattern into a character separated values, CSV, file.Type: ApplicationFiled: February 27, 2017Publication date: September 21, 2017Inventors: Ruben Villarino-Villa, Martin Leibfritz, Ulrich Tuerk, Thilo Bednorz
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Patent number: 8983796Abstract: A network analyzer for measuring a group delay time, which is caused by a device under test to be measured, generates an excitation signal comprising two signals (xIn1(t),xIn2(t)) spaced by a frequency difference, excites the device with the excitation signal and measures a response signal comprising two signals (xOut1(t),xOut2(t)), which are respectively phase distorted by the device relative to the signals (xIn1(t),xIn2(t)) of the excitation signal. It determines the phase difference (??In) between the signals (xIn1(t),xIn2(t)) associated with the excitation signal and a phase difference (??Out) between the signals (xOut1(t), xOut2(t)) associated with the response signal. Finally, it calculates the group delay time from the phase difference (??In) of the signals (xIn1(t),xIn2(t)) associated with the excitation signal, the phase difference (??Out) of the signals (xOut1(t),xOut2(t) associated with the response signal and the frequency difference.Type: GrantFiled: January 15, 2010Date of Patent: March 17, 2015Assignee: Rohde & Schwarz GmbH & Co., KGInventors: Thilo Bednorz, Steffen Neidhardt
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Publication number: 20110288820Abstract: A network analyzer for measuring a group delay time, which is caused by a device under test to be measured, generates an excitation signal comprising two signals (xIn1(t),xIn2(t)) spaced by a frequency difference, excites the device with the excitation signal and measures a response signal comprising two signals (xOut1(t),xOut2(t)), which are respectively phase distorted by the device relative to the signals (xIn1(t),xIn2(t)) of the excitation signal. It determines the phase difference (??In) between the signals (xIn1(t),xIn2(t)) associated with the excitation signal and a phase difference (??Out) between the signals (xOut1(t), xOut2(t)) associated with the response signal. Finally, it calculates the group delay time from the phase difference (??In) of the signals (xIn1(t),xIn2(t)) associated with the excitation signal, the phase difference (??Out) of the signals (xOut1(t),xOut2(t) associated with the response signal and the frequency difference.Type: ApplicationFiled: January 15, 2010Publication date: November 24, 2011Applicant: Rohde & Schwarz GmbH & Co. KGInventors: Thilo Bednorz, Steffen Neidhardt
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Patent number: 7772827Abstract: A method for operating a measuring device, in particular, a vectorial network analyzer, which can be connected via at least two ports to a device under test, with excitation units assigned to each port, wherein each excitation unit provides a signal generator, with which the assigned port can be supplied with an excitation signal, provides the following procedural stages: a measurement at measuring positions of the actual phase offset between the excitation signals output at the ports; and a variation of the frequency of at least one of the two signal generators during a correction interval so that a specified set phase offset is achieved at reference positions between the excitation signals output at the ports.Type: GrantFiled: June 19, 2006Date of Patent: August 10, 2010Assignee: Rohde & Schwarz GmbH & Co. KGInventors: Christian Evers, Thilo Bednorz, Georg Ortler
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Publication number: 20080164861Abstract: A method for operating a measuring device, in particular, a vectorial network analyzer, which can be connected via at least two ports to a device under test, with excitation units assigned to each port, wherein each excitation unit provides a signal generator, with which the assigned port can be supplied with an excitation signal, provides the following procedural stages: a measurement at measuring positions of the actual phase offset between the excitation signals output at the ports; and a variation of the frequency of at least one of the two signal generators during a correction interval so that a specified set phase offset is achieved at reference positions between the excitation signals output at the ports.Type: ApplicationFiled: June 19, 2006Publication date: July 10, 2008Applicant: Rohde & Schwarz GmbH & Co. KGInventors: Christian Evers, Thilo Bednorz, Georg Ortler
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Patent number: 7123023Abstract: A measuring device is provided for measuring intermodulation distortion of a measuring object. The measuring device includes a first signal generator which produces a first signal that is supplied to an input of a measuring object, a signal combining device having a first input which is connected to the output of the measuring object, and a signal analyzing device which is connected to the output of the signal combining device. According to the disclosure, a second signal generator which is synchronized with the first signal generator is provided, and second signal generator producing a second signal that is supplied to a second input of the signal combining device.Type: GrantFiled: March 28, 2003Date of Patent: October 17, 2006Assignee: Rohde & Schwarz GmbH & Co. KGInventors: Roland Minihold, Thilo Bednorz
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Publication number: 20050159908Abstract: A measuring device is provided for measuring intermodulation distortion of a measuring object. The measuring device includes a first signal generator which produces a first signal that is supplied to an input of a measuring object, a signal combining device having a first input which is connected to the output of the measuring object, and a signal analyzing device which is connected to the output of the signal combining device. According to the disclosure, a second signal generator which is synchronized with the first signal generator is provided, and second signal generator producing a second signal that is supplied to a second input of the signal combining device.Type: ApplicationFiled: March 28, 2003Publication date: July 21, 2005Inventors: Ronald Minihold, Thilo Bednorz