Patents by Inventor Thilo Michel

Thilo Michel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11958009
    Abstract: A filter device for ambient air filtration has a blower housing with air inlet and air outlet. A device for generating an air flow is arranged in the blower housing and generates an air flow in operation from air inlet to air outlet. A flexible air conducting hose is provided with a first open end connected to the air outlet of the blower housing and with a second closed end. The flexible air conducting hose has openings arranged between first open end and second closed end. Filter elements are arranged in the openings, respectively. The filter elements separate a raw side inside the air conducting hose from a clean side downstream of the filter element. The air conducting hose is inflated in operation of the device by the air flow. The flexible air conducting hose has a reduced air permeability compared to the air permeability of the filter elements.
    Type: Grant
    Filed: March 1, 2021
    Date of Patent: April 16, 2024
    Assignee: MANN+HUMMEL GmbH
    Inventors: Christoph Schulz, Tobias Warth, Marc Hittinger, Jens Gusek, Maximilian Bauch, Thilo Mueller, Anja Koronai-Bauer, Sylvain Michel Tchale, Roman Eder
  • Patent number: 9498171
    Abstract: A method, for examining an object using an X-ray recording system, includes aligning the object in the X-ray beam and the X-ray recording system with one another such that regions in the X-ray beam are uncovered for measurement of a free field. During an X-ray image recording, the components are moved relative to one another with a lateral displacement. In a position of the relative lateral displacement of the components, a reference image containing free fields is recorded. The X-ray image recording is generated from partial images during the displacement and the position of the second component relative to the first component is determined for each partial recording such that the displacement distances of the displacements and the reference phases are calculated from a selected set of pixels and the measured intensity values thereof. Finally, the image information is determined from the partial images, the displacements and the reference phases.
    Type: Grant
    Filed: September 17, 2014
    Date of Patent: November 22, 2016
    Assignee: SIEMENS AKTIENGESELLSCHAFT
    Inventors: Gisela Anton, Florian Bayer, Jürgen Durst, Thilo Michel, Georg Pelzer, Jens Rieger, Thomas Weber
  • Patent number: 9500602
    Abstract: A method, for examining an object using an X-ray recording system, includes during an X-ray image recording, moving components relative to one another with the lateral displacement by displacement distances. The method includes generating the X-ray image recording during the displacement from n partial images, so that the total exposure time of the X-ray image recording is made up from a sum of partial exposure times. In each of the partial images, the intensity is determined in each pixel. The position of the second component relative to the first component is determined for each recording of the partial images. Finally, the image information is determined from the partial images and the displacements.
    Type: Grant
    Filed: September 17, 2014
    Date of Patent: November 22, 2016
    Assignee: SIEMENS AKTIENGESELLSCHAFT
    Inventors: Gisela Anton, Florian Bayer, Jürgen Durst, Thilo Michel, Georg Pelzer, Jens Rieger, Thomas Weber
  • Patent number: 9297912
    Abstract: The present invention relates to a pixel detector (10), comprising a semiconductor sensor layer (12), in which charges can be generated upon interaction with particles to be detected. The semiconductor layer defines an X-Y-plane and has a thickness extending in Z-direction. The detector further comprises a read-out electronics layer (14) connected to said semiconductor layer (12), said read-out electronics layer (14) comprising an array of read-out circuits (20) for detecting signals indicative of charges generated in a corresponding volume of said semiconductor sensor layer (12). The neighboring read-out circuits (20) are connected by a relative timing circuit configured to determine time difference information between signals detected at said neighboring read-out circuits (20).
    Type: Grant
    Filed: September 21, 2011
    Date of Patent: March 29, 2016
    Assignees: CERN—European Organization for Nuclear Resesarch, Friedrich-Alexander-Universitat Erlange-Nurnberg, Czech Technical University in Prague
    Inventors: Michael Campbell, Thilo Michel, Jan Jakubek
  • Patent number: 9069081
    Abstract: Radiation detector for measuring one or more characteristics of a radiation, comprising one or more detector pixels, a clock pulse generator, each detector pixel comprising a sensor producing an electrical signal in response to an event of a photon or charged particle of said radiation impinging on said sensor; a pixel electronics adapted for receiving and processing said electrical signal, comprising an analog processing unit for amplifying and shaping said electrical signal and producing a shaped pulse said pixel electronics comprises time determination unit for counting the TOT-count, the TOT-count being the number of clock pulses occurring during the time interval when said shaped pulse is above a threshold. Said pixel electronics comprises a plurality of event counters, each event counter counting the number of events having a TOT-count in a predefined ranges.
    Type: Grant
    Filed: August 11, 2008
    Date of Patent: June 30, 2015
    Assignees: European Organization For Nuclear Research (CERN), Friedrich-Alexander-Universitat Erlangen-Nurnberg, Ion Beam Applications S.A.
    Inventors: Michael Campbell, Xavier Llopart Cudie, Lukas Tlustos, Winnie Sze-Wing Wong, Rafael Ballabriga Suñe, Gisela Anton, Thilo Michel, Michael Böhnel, Karl L. Schwartz, Uwe Mollenhauer, Ernst Fritsch
  • Publication number: 20150092915
    Abstract: A method, for examining an object using an X-ray recording system, includes aligning the object in the X-ray beam and the X-ray recording system with one another such that regions in the X-ray beam are uncovered for measurement of a free field. During an X-ray image recording, the components are moved relative to one another with a lateral displacement. In a position of the relative lateral displacement of the components, a reference image containing free fields is recorded. The X-ray image recording is generated from partial images during the displacement and the position of the second component relative to the first component is determined for each partial recording such that the displacement distances of the displacements and the reference phases are calculated from a selected set of pixels and the measured intensity values thereof. Finally, the image information is determined from the partial images, the displacements and the reference phases.
    Type: Application
    Filed: September 17, 2014
    Publication date: April 2, 2015
    Inventors: Gisela ANTON, Florian BAYER, Jürgen DURST, Thilo MICHEL, Georg PELZER, Jens RIEGER, Thomas WEBER
  • Publication number: 20150092914
    Abstract: A method, for examining an object using an X-ray recording system, includes during an X-ray image recording, moving components relative to one another with the lateral displacement by displacement distances. The method includes generating the X-ray image recording during the displacement from n partial images, so that the total exposure time of the X-ray image recording is made up from a sum of partial exposure times. In each of the partial images, the intensity is determined in each pixel. The position of the second component relative to the first component is determined for each recording of the partial images. Finally, the image information is determined from the partial images and the displacements.
    Type: Application
    Filed: September 17, 2014
    Publication date: April 2, 2015
    Inventors: Gisela ANTON, Florian BAYER, Jürgen DURST, Thilo MICHEL, Georg PELZER, Jens RIEGER, Thomas WEBER
  • Patent number: 8913714
    Abstract: A detector arrangement is disclosed for performing phase-contrast measurements, including at least two transducer layers arranged one behind the other, wherein at least the first transducer layer arranged in the radiation direction includes alternate sensitive areas having a high absorptance for the conversion of incident radiation quanta into signals and less sensitive areas having a lower absorptance in comparison thereto. Further, a corresponding X-ray tomography device and a method for performing phase-contrast measurements are also enclosed.
    Type: Grant
    Filed: April 13, 2010
    Date of Patent: December 16, 2014
    Assignee: Siemens Aktiengesellschaft
    Inventors: Thilo Michel, Peter Bartl, Gisela Anton
  • Publication number: 20140332691
    Abstract: The present invention relates to a pixel detector (10), comprising a semiconductor sensor layer (12), in which charges can be generated upon interaction with particles to be detected. The semiconductor layer defines an X-Y-plane and has a thickness extending in Z-direction. The detector further comprises a read-out electronics layer (14) connected to said semiconductor layer (12), said read-out electronics layer (14) comprising an array of read-out circuits (20) for detecting signals indicative of charges generated in a corresponding volume of said semiconductor sensor layer (12). The neighbouring read-out circuits (20) are connected by a relative timing circuit configured to determine time difference information between signals detected at said neighbouring read-out circuits (20).
    Type: Application
    Filed: September 21, 2011
    Publication date: November 13, 2014
    Applicants: CERN - EUROPEAN ORGANIZATION FOR NUCLEAR RESEARCH, Friedrich-Alexander-Universitat Erlangen-Numberg, Czech Technical University in Prague Institute of Experimental and Applied Physics
    Inventors: Michael Campbell, Thilo Michel, Jan Jakubek
  • Publication number: 20120033785
    Abstract: A detector arrangement is disclosed for performing phase-contrast measurements, including at least two transducer layers arranged one behind the other, wherein at least the first transducer layer arranged in the radiation direction includes alternate sensitive areas having a high absorptance for the conversion of incident radiation quanta into signals and less sensitive areas having a lower absorptance in comparison thereto. Further, a corresponding X-ray tomography device and a method for performing phase-contrast measurements are also enclosed.
    Type: Application
    Filed: April 13, 2010
    Publication date: February 9, 2012
    Applicant: SIEMENS AKTIENGESELLSCHAFT
    Inventors: Thilo Michel, Peter Bartl, Gisela Anton
  • Patent number: 7983397
    Abstract: The present invention relates to a device and method for determining one or more characteristics of radiation using a sensor comprising one or more detector units capable of counting the number of photon or charged particle of said radiation impinging on said sensor in or above a determined energy range.
    Type: Grant
    Filed: February 8, 2007
    Date of Patent: July 19, 2011
    Assignee: Friedrich-Alexander-Universitat Erlangen-Nurnberg
    Inventors: Thilo Michel, Alexander Korn, Gisela Anton, Daniel Niederlohner, Michael Bohnel, Markus Firsching, Jurgen Durst
  • Publication number: 20110051901
    Abstract: The present invention relates to a device and method for determining one or more characteristics of radiation using a sensor comprising one or more detector units capable of counting the number of photon or charged particle of said radiation impinging on said sensor in or above a determined energy range.
    Type: Application
    Filed: February 8, 2007
    Publication date: March 3, 2011
    Applicant: FRIEDRICH-ALEXANDER-UNIVERSITAT ERLANGEN-NURNBERG
    Inventors: Thilo Michel, Alexander Korn, Gisela Anton, Daniel Niederlohner, Michael Bohnel, Markus Firsching, Jurgen Durst
  • Publication number: 20110036988
    Abstract: Radiation detector (1) for measuring one or more characteristics of a radiation, comprising one or more detector pixels (3), a clock pulse generator, each detector pixel (3) comprising a sensor (20) producing an electrical signal in response to an event of a photon or charged particle of said radiation impinging on said sensor (20); a pixel electronics (24) adapted for receiving and processing said electrical signal, comprising an analog processing unit (62) for amplifying and shaping said electrical signal and producing a shaped pulse said pixel electronics (24) comprises time determination unit (51) for counting the TOT-count, the TOT-count being the number of clock pulses occurring during the time interval when said shaped pulse is above a threshold. Said pixel electronics comprises a plurality of event counters (82), each event counter (82) counting the number of events having a TOT-count in a predefined ranges.
    Type: Application
    Filed: August 11, 2008
    Publication date: February 17, 2011
    Inventors: Michael Campbell, Xavier Llopart Cudie, Lukas Tlustos, Winnie Sze-Wing Wong, Rafael Ballabriga Sune, Gisela Anton, Thilo Michel, Michael Bohnel, Karl L. Schwartz, Uwe Mollenhauer, Ernst Fritsch
  • Patent number: 7601937
    Abstract: A photon detector has a photocathode for the photon-induced triggering of measuring electrons. Spatial position information is supplied by an at least one-dimensional electron-detector pixel array. An electron optics unit serves for guiding the measuring electrons to the array. Each pixel (19) has an electronic converter unit (20) for converting an analog measuring signal of the pixel (19) into a digital measuring signal, which incorporates a discriminator for background suppression. An electronic post-processing unit (39) serves for processing the digital measuring signal. The converter unit (20) of each pixel (19) has at least one clock generator (36), as well as at least one counter (29, 30), which is in signal connection with the clock generator (36) and discriminator (27) for generation of a digital timing signal.
    Type: Grant
    Filed: June 25, 2007
    Date of Patent: October 13, 2009
    Assignee: Friedrich-Alexander-Universität Erlangen-Nürnberg
    Inventors: Gisela Anton, Thilo Michel
  • Publication number: 20080033673
    Abstract: A photon detector has a photocathode for the photon-induced triggering of measuring electrons. Spatial position information is supplied by an at least one-dimensional electron-detector pixel array. An electron optics unit serves for guiding the measuring electrons to the array. Each pixel (19) has an electronic converter unit (20) for converting an analog measuring signal of the pixel (19) into a digital measuring signal, which incorporates a discriminator for background suppression. An electronic post-processing unit (39) serves for processing the digital measuring signal. The converter unit (20) of each pixel (19) has at least one clock generator (36), as well as at least one counter (29, 30), which is in signal connection with the clock generator (36) and discriminator (27) for generation of a digital timing signal.
    Type: Application
    Filed: June 25, 2007
    Publication date: February 7, 2008
    Applicant: Friedrich-Alexander-Univeritat Erlangen-Nurnberg
    Inventors: Gisela ANTON, Thilo Michel