Abstract: A tracer device having a tracer arm is mounted in an axial guide and is movable back and forth in the x direction while measuring the path, and a tracer head is mounted at the free area of the tracer arm, is in contact with the surface of a part during a measurement and, during its travel in the x direction, is deflected by the surface contours in a z direction that is perpendicular to the x direction, and having an analyzer device for detecting and analyzing the deflections in the z direction as a function of the path in the x direction. An easy to handle, compact design is provided since the front section of the tracer arm, which is rigid per se, is provided with a tracer leg that forms an articulated link of the tracer head to the tracer arm, and a measuring element that detects the deflection in the z direction is arranged on the tracer leg.

Abstract: A tracer device having a tracer arm is mounted in an axial guide and is movable back and forth in the x direction while measuring the path, and a tracer head is mounted at the free area of the tracer arm, is in contact with the surface of a part during a measurement and, during its travel in the x direction, is deflected by the surface contours in a z direction that is perpendicular to the x direction, and having an analyzer device for detecting and analyzing the deflections in the z direction as a function of the path in the x direction. An easy to handle, compact design is provided since the front section of the tracer arm, which is rigid per se, is provided with a tracer leg that forms an articulated link of the tracer head to the tracer arm, and a measuring element that detects the deflection in the z direction is arranged on the tracer leg.