Patents by Inventor Thilo Rubehn

Thilo Rubehn has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10693057
    Abstract: A component is provided comprising at least one substrate, at least one magnetic field sensor and at least one trench in the at least one substrate surrounds the at least one magnetic field sensor at least partially. At least one cap covers the at least one trench and the at least one magnetic field sensor, and at least one layer element arranged between the at least one cap and the at least one substrate.
    Type: Grant
    Filed: April 11, 2018
    Date of Patent: June 23, 2020
    Assignee: TDK-MICRONAS GMBH
    Inventors: Marc Baumann, Thilo Rubehn, Christian Joos, Jochen Stephan
  • Patent number: 10139255
    Abstract: A method for increasing a reliability of transducers having a first IC and a second IC, each has a sensor and a signal output and a signal input and a comparator, and a sensor signal generated as a function of the physical quantity sensed by the relevant sensor is applied to the respective signal outputs. The signal outputs are each connected to a first input of the comparator, and the signal inputs are each connected to a second input of the comparator. The two ICs can be integrated into a common IC package, and the signal output of the first IC is connected to the first input of the comparator on the first IC and to the signal input of the second IC and to a first contact area passing through the IC package.
    Type: Grant
    Filed: November 13, 2015
    Date of Patent: November 27, 2018
    Assignee: TDK-Micronas GmbH
    Inventor: Thilo Rubehn
  • Patent number: 10103320
    Abstract: A component with a magnetic field sensor. The electronic component is located in a semiconductor substrate or on the surface of the semiconductor substrate and is surrounded at least partially, preferably largely, by a trench in the semiconductor substrate. The trench is filled with a filling material.
    Type: Grant
    Filed: May 4, 2016
    Date of Patent: October 16, 2018
    Assignee: TDK-Micronas GmbH
    Inventors: Marc Baumann, Thilo Rubehn, Christian Joos, Jochen Stephan
  • Patent number: 10080288
    Abstract: A circuit package having a first semiconductor body with a first monolithic integrated circuit having a first signal output that is interconnected with a bonding surface, and a first signal input that is interconnected with a bonding surface. The circuit package also has a second semiconductor body with a second monolithic integrated circuit having a second signal output that is interconnected with a bonding surface, and a second signal input that is interconnected with a bonding surface. The circuit package further features a contact element with at least one bonding surface, and a carrier element, wherein the bonding surface of the first signal output and the bonding surface of the second signal input are interconnected with the contact element so that an electrical connection exists between the first signal output and the second signal input, and a portion of the contact element penetrates the circuit package.
    Type: Grant
    Filed: November 12, 2015
    Date of Patent: September 18, 2018
    Assignee: TDK-Micronas GmbH
    Inventor: Thilo Rubehn
  • Publication number: 20180233658
    Abstract: A component is provided comprising at least one substrate, at least one magnetic field sensor and at least one trench in the at least one substrate surrounds the at least one magnetic field sensor at least partially. At least one cap covers the at least one trench and the at least one magnetic field sensor, and at least one layer element arranged between the at least one cap and the at least one substrate.
    Type: Application
    Filed: April 11, 2018
    Publication date: August 16, 2018
    Applicant: TDK-Micronas GmbH
    Inventors: Marc Baumann, Thilo Rubehn, Christian Joos, Jochen Stephan
  • Publication number: 20170324028
    Abstract: A component with a magnetic field sensor. The electronic component is located in a semiconductor substrate or on the surface of the semiconductor substrate and is surrounded at least partially, preferably largely, by a trench in the semiconductor substrate. The trench is filled with a filling material.
    Type: Application
    Filed: May 4, 2016
    Publication date: November 9, 2017
    Inventors: Marc Baumann, Thilo Rubehn, Christian Joos, Jochen Stephan
  • Patent number: 9520059
    Abstract: Method for a deterministic selection of a sensor from a plurality of sensors, having a control unit and multiple sensors connected to the control unit by means of a three-wire bus, wherein the sensors are connected parallel to one another at a three-wire bus by at least two lines and a protocol frame according to SENT specification is used between the control unit and the sensors for a data exchange, and within the protocol frame a specified sensor is selected from a plurality of sensors by means of a selection signal sent by the control unit, wherein each sensor is associated with an unambiguous number of pulses for the selection of the sensor, and the selection of the sensor is performed by means of the selection signal having a predetermined number of pulses occurring immediately in succession.
    Type: Grant
    Filed: February 24, 2016
    Date of Patent: December 13, 2016
    Assignee: Micronas GmbH
    Inventors: Eckart Wagner, Thilo Rubehn
  • Publication number: 20160247391
    Abstract: Method for a deterministic selection of a sensor from a plurality of sensors, having a control unit and multiple sensors connected to the control unit by means of a three-wire bus, wherein the sensors are connected parallel to one another at a three-wire bus by at least two lines and a protocol frame according to SENT specification is used between the control unit and the sensors for a data exchange, and within the protocol frame a specified sensor is selected from a plurality of sensors by means of a selection signal sent by the control unit, wherein each sensor is associated with an unambiguous number of pulses for the selection of the sensor, and the selection of the sensor is performed by means of the selection signal having a predetermined number of pulses occurring immediately in succession.
    Type: Application
    Filed: February 24, 2016
    Publication date: August 25, 2016
    Applicant: Micronas GmbH
    Inventors: Eckart WAGNER, Thilo RUBEHN
  • Publication number: 20160161305
    Abstract: A method for increasing a reliability of transducers having a first IC and a second IC, each has a sensor and a signal output and a signal input and a comparator, and a sensor signal generated as a function of the physical quantity sensed by the relevant sensor is applied to the respective signal outputs. The signal outputs are each connected to a first input of the comparator, and the signal inputs are each connected to a second input of the comparator. The two ICs can be integrated into a common IC package, and the signal output of the first IC is connected to the first input of the comparator on the first IC and to the signal input of the second IC and to a first contact area passing through the IC package.
    Type: Application
    Filed: November 13, 2015
    Publication date: June 9, 2016
    Applicant: MICRONAS GMBH
    Inventor: Thilo RUBEHN
  • Publication number: 20160135298
    Abstract: A circuit package having a first semiconductor body with a first monolithic integrated circuit having a first signal output that is interconnected with a bonding surface, and a first signal input that is interconnected with a bonding surface. The circuit package also has a second semiconductor body with a second monolithic integrated circuit having a second signal output that is interconnected with a bonding surface, and a second signal input that is interconnected with a bonding surface. The circuit package further features a contact element with at least one bonding surface, and a carrier element, wherein the bonding surface of the first signal output and the bonding surface of the second signal input are interconnected with the contact element so that an electrical connection exists between the first signal output and the second signal input, and a portion of the contact element penetrates the circuit package.
    Type: Application
    Filed: November 12, 2015
    Publication date: May 12, 2016
    Applicant: MICRONAS GMBH
    Inventor: Thilo RUBEHN
  • Patent number: 8594225
    Abstract: The invention relates to an integrated circuit arrangement with connection contacts for the serial exchange of data and/or signals with external components and apparatuses and with a control apparatus and/or a serial interface for the clocked receiving of data by means of a signal voltage on such a connection contact, which voltage is modulated between at least one low, one middle and one high voltage state. The control apparatus and/or the interface are designed in such a manner that data is sent in a sending mode via the connection contact in that the switching apparatus, after having received a slope changing in particular from the middle voltage state into in particular the higher or the lower voltage state, pulls the voltage state into the in particular opposite lower or higher voltage state. Furthermore, the invention relates to an apparatus and a process for operating such a circuit arrangement.
    Type: Grant
    Filed: February 13, 2009
    Date of Patent: November 26, 2013
    Assignee: Micronas GmbH
    Inventors: Thilo Rubehn, Joachim Ritter, Gert Umbach, Dieter Baecher, Wolfgang Horn, Joerg Franke
  • Patent number: 7975191
    Abstract: A method and circuitry for checking the programming (P) and deletion (L) operations of memory cells (5) in a nonvolatile memory device (1). Parallel to the programming (P) or deletion (L) operations of the actual memory cells (5) the respective programming or deletion process is carried out on at least one similar checking cell (4.1, 4.2, 4.3), with the programming (P) or deletion (L) operations being less favorable by a defined extent than the programming (P) or deletion (L) operations of the actual memory cells (5). From the content of the checking cell (4.1, 4.2, 4.3) an evaluation device (6) determines whether the programming (P) or deletion (L) operation was successful or not, and a corresponding output signal (ak) indicative thereof is produced.
    Type: Grant
    Filed: May 4, 2006
    Date of Patent: July 5, 2011
    Assignee: Micronas GmbH
    Inventors: Manfred Ullrich, Martin Bayer, Hans-Jörg Fink, Reiner Bidenbach, Thilo Rubehn
  • Publication number: 20090252210
    Abstract: The invention relates to an integrated circuit arrangement with connection contacts for the serial exchange of data and/or signals with external components and apparatuses and with a control apparatus and/or a serial interface for the clocked receiving of data by means of a signal voltage on such a connection contact, which voltage is modulated between at least one low, one middle and one high voltage state. The control apparatus and/or the interface are designed in such a manner that data is sent in a sending mode via the connection contact in that the switching apparatus, after having received a slope changing in particular from the middle voltage state into in particular the higher or the lower voltage state, pulls the voltage state into the in particular opposite lower or higher voltage state. Furthermore, the invention relates to an apparatus and a process for operating such a circuit arrangement.
    Type: Application
    Filed: February 13, 2009
    Publication date: October 8, 2009
    Inventors: Thilo Rubehn, Joachim Ritter, Gert Umbach, Dieter Baecher, Wolfgang Horn, Joerg Franke
  • Publication number: 20070260946
    Abstract: A method and circuitry for checking the programming (P) and deletion (L) operations of memory cells (5) in a nonvolatile memory device (1). Parallel to the programming (P) or deletion (L) operations of the actual memory cells (5) the respective programming or deletion process is carried out on at least one similar checking cell (4.1, 4.2, 4.3), with the programming (P) or deletion (L) operations being less favorable by a defined extent than the programming (P) or deletion (L) operations of the actual memory cells (5). From the content of the checking cell (4.1, 4.2, 4.3) an evaluation device (6) determines whether the programming (P) or deletion (L) operation was successful or not, and a corresponding output signal (ak) indicative thereof is produced.
    Type: Application
    Filed: May 4, 2006
    Publication date: November 8, 2007
    Inventors: Manfred Ullrich, Martin Bayer, Hans-Jorg Fink, Reiner Bidenbach, Thilo Rubehn