Abstract: An atomic-force microscope system is provided including: an electrically conducting cantilever support; an electrically insulating element; and an electrically conducting cantilever anchored at a first end to the cantilever support via the insulating element, the cantilever including a probe tip at a second end opposite to the first end and the cantilever support is configured as a backside electrode of the cantilever for backside actuation thereof; a Fabry-Perot interferometer including: a resonator with a first mirror defined on the cantilever; and a second mirror defined on the cantilever support having a first side and a second side configured to allow light injection, opposite to the first side, the latter extending at least partly vis-à-vis the first mirror. The interferometer includes a light-emitting device, and a detector configured for detecting a property of the system impacted by interferences of light emitted by the light-emitting device. Methods of operations are also provided.

Abstract: An electromagnetic wave resonator comprising a body, wherein the body: has a structure extending essentially in a plane (r, ?), comprises a material in a region between limit radii ri and ro, where 0?ri<ro and ro corresponds to a radius of a convex hull () of the structure; and allows for electromagnetic wave propagation, and wherein an effective refractive index ne(r), as obtained from angularly averaging a refractive index of the material in the plane (r, ?), decreases within said region.

Abstract: An electromagnetic wave resonator comprising a body, wherein the body: has a structure extending essentially in a plane (r, ?), comprises a material in a region between limit radii ri and ro, where 0?ri<rO and ro corresponds to a radius of a convex hull () of the structure; and allows for electromagnetic wave propagation, and wherein an effective refractive index ne(r), as obtained from angularly averaging a refractive index of the material in the plane (r, ?), decreases within said region.