Patents by Inventor Thilo Weitzel
Thilo Weitzel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 8885906Abstract: Positron emission tomography, possibly in combination with computed tomography, allows in addition to medical diagnostic imaging the quantitative determination of various parameters. Quantitative measurements using tomographs exhibit a severe and unavoidable dependency on the imaging properties of the respective tomograph, which makes quantitative assessment of the results difficult. This relates particularly to multicentric medical studies, which obligatorily require quantitative comparability of the data measured by the participating centers. The methods claimed herein include the definition of a virtual tomograph with defined imaging properties. The claimed methods also cover determination of the imaging properties of different tomographs on the basis of suitable reference measurements and possibly by using a calibration phantom.Type: GrantFiled: April 7, 2011Date of Patent: November 11, 2014Assignees: Universitat Bern, Universitatsklinik fur NuklearmedizinInventor: Thilo Weitzel
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Publication number: 20130202172Abstract: Positron emission tomography, possibly in combination with computed tomography, allows in addition to medical diagnostic imaging the quantitative determination of various parameters. Quantitative measurements using tomographs exhibit a severe and unavoidable dependency on the imaging properties of the respective tomograph, which makes quantitative assessment of the results difficult. This relates particularly to multicentric medical studies, which obligatorily require quantitative comparability of the data measured by the participating centers. The methods claimed herein include the definition of a virtual tomograph with defined imaging properties. The claimed methods also cover determination of the imaging properties of different tomographs on the basis of suitable reference measurements and possibly by using a calibration phantom.Type: ApplicationFiled: April 7, 2011Publication date: August 8, 2013Inventor: Thilo Weitzel
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Publication number: 20120105861Abstract: The present invention relates to a method for determining optical path length differences and for optical coherence tomography, having the steps of: generating spatially coherent light by a light source (SQ, BQ) emitting a spatial monomode, or the emission thereof being limited to a single spatial mode by suitable means (F); dividing at least a part of the light coming from said light source into two spatially separated paths; placing a sample (P) to be measured in the measurement path; using as at least two detectors (D) or one detector (D, A) having at least two detector elements (D) and further means (S, T, BP, F, Q, L, G, Z) for guiding beams, said means bringing light from a reference path and a measurement path together to the detectors/detector elements (D) and bringing said light to interference; receiving and analyzing the light intensities at the detectors/detector elements (D) in order to obtain a data set; and numerically analyzing and displaying the data set such that conclusions are possible aboType: ApplicationFiled: January 20, 2009Publication date: May 3, 2012Inventor: Thilo Weitzel
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Patent number: 7826062Abstract: The present invention relates to a device for detecting or generating and modulating optical signals, and having an angular dispersive element arranged to change angles of the optical signals or carrier and/or reference rays brought to interference.Type: GrantFiled: July 9, 2007Date of Patent: November 2, 2010Assignee: Campus Technologies AGInventor: Thilo Weitzel
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Patent number: 7466421Abstract: A diffractive interferometric optical device is provided for measuring spectral properties of light. The device includes means for coupling in a single spatial mode of an incoming light field to be examined, means for splitting the single spatial mode of incoming light field into at least two partial fields, means for changing one of a shape or a direction of propagation of the wavefront of at least one of the at least two partial fields in dependence on the wavelength and means for generating an interference pattern superimposing the at least two partial fields. The device further comprises detection means to record and evaluate the interference pattern at a plurality of discrete spatial positions in order to derive spectral properties of the incoming light field.Type: GrantFiled: July 15, 2002Date of Patent: December 16, 2008Assignee: CAMPus Technologies AGInventor: Thilo Weitzel
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Publication number: 20080152349Abstract: The present invention relates to a device for detecting or generating and modulating optical signals, and having an angular dispersive element arranged to change angles of the optical signals or carrier and/or reference rays brought to interference.Type: ApplicationFiled: July 9, 2007Publication date: June 26, 2008Inventor: Thilo Weitzel
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Patent number: 7330267Abstract: The invention relates to an apparatus for optical spectroscopy having means to produce an interference pattern and having a spatially resolving detector which can record the interference pattern produced. In accordance with the invention, the wavefronts of at least one of the part rays involved in the interference pattern is influenced in dependence on the wavelength by spectrally dispersive or diffractive optical elements.Type: GrantFiled: April 7, 2000Date of Patent: February 12, 2008Assignee: Campus Technologies AGInventor: Thilo Weitzel
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Patent number: 7257334Abstract: The present invention relates to a device for detecting or generating and modulating optical signals, and having an angular dispersive element arranged to change angles of the optical signals or carrier and/or reference rays brought to interference.Type: GrantFiled: January 15, 1999Date of Patent: August 14, 2007Assignee: CAMPus Technologies AGInventor: Thilo Weitzel
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Patent number: 7161683Abstract: The present invention relates to a spectrally dispersive interferometric optical apparatus having a light source, generating a phase shift, measuring the intensity of the interference signals, selectively measuring the intensity of the interference signal and determining the phase angles and/or a relative phase shift of the intensity of the interference signals. In accordance with the invention, the generating of a phase shift between components of different polarization directions in at least one of the branches of the interferometer includes a diffraction grating. The selective determination of the intensity of the interference signal in dependence on the polarization moreover permits determination of the respective intensity for the TE components and for the TM components of the interference signal with respect to the coordinate system of the diffraction grating.Type: GrantFiled: January 21, 2003Date of Patent: January 9, 2007Assignee: CAMPus Technologies AGInventor: Thilo Weitzel
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Publication number: 20050248769Abstract: The present invention relates to an apparatus and a method for optical spectroscopy and for optical sensory technology and to the use of the apparatus. An apparatus having high spectral resolution with simultaneously comparatively low demands on the quality of the optical components is provided in that the apparatus for optical spectroscopy comprises means for the generation of an interference pattern, means for the coupling of the incoming light field to be examined such that only one or several individual spatial modes of the field are permitted, and a detector which can record the intensity of the generated interference pattern at a plurality of spatially different positions, with the wavefronts and/or the propagation direction of at least one of the light fields involved in the interference pattern being changed by spectrally dispersive or diffractive optical elements in dependence on the wavelength.Type: ApplicationFiled: July 15, 2002Publication date: November 10, 2005Inventor: Thilo Weitzel
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Publication number: 20050117169Abstract: The present invention relates to a spectrally dispersive interferometric optical apparatus comprising a light source, means for the generation of a phase shift, means for the measurement of the intensity of the interference signals, means for the selective measurement of the intensity of the interference signal and means for the determination of the phase angles and/or of a relative phase shift of the intensity of the interference signals. In accordance with the invention, the means for the generation of a phase shift between components of different polarisation directions in at least one of the branches of the interferometer include a diffraction grating. The means for the selective determination of the intensity of the interference signal in dependence on the polarisation moreover permit a determination of the respective intensity for the TE components and for the TM components of the interference signal with respect to the coordinate system of the diffraction grating.Type: ApplicationFiled: January 21, 2003Publication date: June 2, 2005Inventor: Thilo Weitzel
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Patent number: 6147889Abstract: A high memory capacity with relatively low demands on the optical quality of the components used is possible in accordance with the invention by the means to generate the at least two light rays and/or the memory element and/or means to guide the light rays are designed in such a way that the spatial orientation of the interference sample generated in the memory element by the light rays can be changed in any spatial direction over the spatial orientation of an interference pattern stored in the memory element and/or a light diffracting structure present in the memory element. The invention further relates to a device for the readout of optical information and a method for the optical recording and for the optical readout of information.Type: GrantFiled: January 15, 1999Date of Patent: November 14, 2000Assignee: CAMPus Technologies AGInventor: Thilo Weitzel