Patents by Inventor Thilo Weitzel

Thilo Weitzel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8885906
    Abstract: Positron emission tomography, possibly in combination with computed tomography, allows in addition to medical diagnostic imaging the quantitative determination of various parameters. Quantitative measurements using tomographs exhibit a severe and unavoidable dependency on the imaging properties of the respective tomograph, which makes quantitative assessment of the results difficult. This relates particularly to multicentric medical studies, which obligatorily require quantitative comparability of the data measured by the participating centers. The methods claimed herein include the definition of a virtual tomograph with defined imaging properties. The claimed methods also cover determination of the imaging properties of different tomographs on the basis of suitable reference measurements and possibly by using a calibration phantom.
    Type: Grant
    Filed: April 7, 2011
    Date of Patent: November 11, 2014
    Assignees: Universitat Bern, Universitatsklinik fur Nuklearmedizin
    Inventor: Thilo Weitzel
  • Publication number: 20130202172
    Abstract: Positron emission tomography, possibly in combination with computed tomography, allows in addition to medical diagnostic imaging the quantitative determination of various parameters. Quantitative measurements using tomographs exhibit a severe and unavoidable dependency on the imaging properties of the respective tomograph, which makes quantitative assessment of the results difficult. This relates particularly to multicentric medical studies, which obligatorily require quantitative comparability of the data measured by the participating centers. The methods claimed herein include the definition of a virtual tomograph with defined imaging properties. The claimed methods also cover determination of the imaging properties of different tomographs on the basis of suitable reference measurements and possibly by using a calibration phantom.
    Type: Application
    Filed: April 7, 2011
    Publication date: August 8, 2013
    Inventor: Thilo Weitzel
  • Publication number: 20120105861
    Abstract: The present invention relates to a method for determining optical path length differences and for optical coherence tomography, having the steps of: generating spatially coherent light by a light source (SQ, BQ) emitting a spatial monomode, or the emission thereof being limited to a single spatial mode by suitable means (F); dividing at least a part of the light coming from said light source into two spatially separated paths; placing a sample (P) to be measured in the measurement path; using as at least two detectors (D) or one detector (D, A) having at least two detector elements (D) and further means (S, T, BP, F, Q, L, G, Z) for guiding beams, said means bringing light from a reference path and a measurement path together to the detectors/detector elements (D) and bringing said light to interference; receiving and analyzing the light intensities at the detectors/detector elements (D) in order to obtain a data set; and numerically analyzing and displaying the data set such that conclusions are possible abo
    Type: Application
    Filed: January 20, 2009
    Publication date: May 3, 2012
    Inventor: Thilo Weitzel
  • Patent number: 7826062
    Abstract: The present invention relates to a device for detecting or generating and modulating optical signals, and having an angular dispersive element arranged to change angles of the optical signals or carrier and/or reference rays brought to interference.
    Type: Grant
    Filed: July 9, 2007
    Date of Patent: November 2, 2010
    Assignee: Campus Technologies AG
    Inventor: Thilo Weitzel
  • Patent number: 7466421
    Abstract: A diffractive interferometric optical device is provided for measuring spectral properties of light. The device includes means for coupling in a single spatial mode of an incoming light field to be examined, means for splitting the single spatial mode of incoming light field into at least two partial fields, means for changing one of a shape or a direction of propagation of the wavefront of at least one of the at least two partial fields in dependence on the wavelength and means for generating an interference pattern superimposing the at least two partial fields. The device further comprises detection means to record and evaluate the interference pattern at a plurality of discrete spatial positions in order to derive spectral properties of the incoming light field.
    Type: Grant
    Filed: July 15, 2002
    Date of Patent: December 16, 2008
    Assignee: CAMPus Technologies AG
    Inventor: Thilo Weitzel
  • Publication number: 20080152349
    Abstract: The present invention relates to a device for detecting or generating and modulating optical signals, and having an angular dispersive element arranged to change angles of the optical signals or carrier and/or reference rays brought to interference.
    Type: Application
    Filed: July 9, 2007
    Publication date: June 26, 2008
    Inventor: Thilo Weitzel
  • Patent number: 7330267
    Abstract: The invention relates to an apparatus for optical spectroscopy having means to produce an interference pattern and having a spatially resolving detector which can record the interference pattern produced. In accordance with the invention, the wavefronts of at least one of the part rays involved in the interference pattern is influenced in dependence on the wavelength by spectrally dispersive or diffractive optical elements.
    Type: Grant
    Filed: April 7, 2000
    Date of Patent: February 12, 2008
    Assignee: Campus Technologies AG
    Inventor: Thilo Weitzel
  • Patent number: 7257334
    Abstract: The present invention relates to a device for detecting or generating and modulating optical signals, and having an angular dispersive element arranged to change angles of the optical signals or carrier and/or reference rays brought to interference.
    Type: Grant
    Filed: January 15, 1999
    Date of Patent: August 14, 2007
    Assignee: CAMPus Technologies AG
    Inventor: Thilo Weitzel
  • Patent number: 7161683
    Abstract: The present invention relates to a spectrally dispersive interferometric optical apparatus having a light source, generating a phase shift, measuring the intensity of the interference signals, selectively measuring the intensity of the interference signal and determining the phase angles and/or a relative phase shift of the intensity of the interference signals. In accordance with the invention, the generating of a phase shift between components of different polarization directions in at least one of the branches of the interferometer includes a diffraction grating. The selective determination of the intensity of the interference signal in dependence on the polarization moreover permits determination of the respective intensity for the TE components and for the TM components of the interference signal with respect to the coordinate system of the diffraction grating.
    Type: Grant
    Filed: January 21, 2003
    Date of Patent: January 9, 2007
    Assignee: CAMPus Technologies AG
    Inventor: Thilo Weitzel
  • Publication number: 20050248769
    Abstract: The present invention relates to an apparatus and a method for optical spectroscopy and for optical sensory technology and to the use of the apparatus. An apparatus having high spectral resolution with simultaneously comparatively low demands on the quality of the optical components is provided in that the apparatus for optical spectroscopy comprises means for the generation of an interference pattern, means for the coupling of the incoming light field to be examined such that only one or several individual spatial modes of the field are permitted, and a detector which can record the intensity of the generated interference pattern at a plurality of spatially different positions, with the wavefronts and/or the propagation direction of at least one of the light fields involved in the interference pattern being changed by spectrally dispersive or diffractive optical elements in dependence on the wavelength.
    Type: Application
    Filed: July 15, 2002
    Publication date: November 10, 2005
    Inventor: Thilo Weitzel
  • Publication number: 20050117169
    Abstract: The present invention relates to a spectrally dispersive interferometric optical apparatus comprising a light source, means for the generation of a phase shift, means for the measurement of the intensity of the interference signals, means for the selective measurement of the intensity of the interference signal and means for the determination of the phase angles and/or of a relative phase shift of the intensity of the interference signals. In accordance with the invention, the means for the generation of a phase shift between components of different polarisation directions in at least one of the branches of the interferometer include a diffraction grating. The means for the selective determination of the intensity of the interference signal in dependence on the polarisation moreover permit a determination of the respective intensity for the TE components and for the TM components of the interference signal with respect to the coordinate system of the diffraction grating.
    Type: Application
    Filed: January 21, 2003
    Publication date: June 2, 2005
    Inventor: Thilo Weitzel
  • Patent number: 6147889
    Abstract: A high memory capacity with relatively low demands on the optical quality of the components used is possible in accordance with the invention by the means to generate the at least two light rays and/or the memory element and/or means to guide the light rays are designed in such a way that the spatial orientation of the interference sample generated in the memory element by the light rays can be changed in any spatial direction over the spatial orientation of an interference pattern stored in the memory element and/or a light diffracting structure present in the memory element. The invention further relates to a device for the readout of optical information and a method for the optical recording and for the optical readout of information.
    Type: Grant
    Filed: January 15, 1999
    Date of Patent: November 14, 2000
    Assignee: CAMPus Technologies AG
    Inventor: Thilo Weitzel