Patents by Inventor Tho X. Do

Tho X. Do has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Accurate image acquisition for structured-light system for optical shape and positional measurements
    Patent number: 8220335
    Abstract: A system and method for the analysis of composite materials. Improved techniques for the measurement of the shape and position of the composite article are provided, which include improved scanning rates using structured light.
    Type: Grant
    Filed: May 16, 2008
    Date of Patent: July 17, 2012
    Assignee: Lockheed Martin Corporation
    Inventors: Marc Dubois, Thomas E. Drake, Jr., Mark A. Osterkamp, David L. Kaiser, Tho X. Do
  • ACCURATE IMAGE ACQUISITION FOR STRUCTURED-LIGHT SYSTEM FOR OPTICAL SHAPE AND POSITIONAL MEASUREMENTS
    Publication number: 20090284593
    Abstract: A system and method for the analysis of composite materials. Improved techniques for the measurement of the shape and position of the composite article are provided, which include improved scanning rates using structured light.
    Type: Application
    Filed: May 16, 2008
    Publication date: November 19, 2009
    Applicant: LOCKHEED MARTIN CORPORATION
    Inventors: Marc Dubois, Thomas E. Drake, JR., Mark A. Osterkamp, David L. Kaiser, Tho X. Do
  • VISION SYSTEM FOR SCAN PLANNING OF ULTRASONIC INSPECTION
    Publication number: 20090287450
    Abstract: A system and method for the analysis of composite materials. Structured light measurements are used to determine the 3-dimensional shape of an object, which is then analyzed to minimize the number of scans when performing laser ultrasound measurements.
    Type: Application
    Filed: May 16, 2008
    Publication date: November 19, 2009
    Applicant: LOCKHEED MARTIN CORPORATION
    Inventors: Marc Dubois, Thomas E. Drake, JR., Mark A. Osterkamp, David L. Kaiser, Tho X. Do, Kenneth R. Yawn