Abstract: A memory cell includes first and second p-channel transistors and first and second n-channel transistors in a cross-coupled latch configuration. Power control circuitry associated with the memory cell is coupled to selectively perform voltage transitions on the source terminals of one or more of the n-channel and/or p-channel transistors in the memory cell during a data corruption mode of operation to destroy data stored in the latch and set the memory cell to a known state. In one implementation, the power control circuitry is coupled to the source terminal of one of the n-channel transistors to transition that terminal from a low voltage reference level (present during a normal mode of operation) to a high voltage reference level and back to the low voltage reference level. In another implementation, the power control circuitry is coupled to the source terminal of one of the n-channel transistors and the source terminal of at least one of the p-channel transistors.

Abstract: An integrated circuit having a normal operating mode and a special operating mode, such as a special test mode. The special test mode is enabled by a series of signals, such as overvoltage excursions at a terminal, rather than by a single such excursion, so that it is less likely that the special test mode is entered inadvertently, such as due to noise or power-down and power-up of the device. The circuit for enabling the test mode includes a series of D-type flip-flops, each of which are clocked upon detection of the overvoltage condition together with a particular logic level applied at another terminal; multiple series of flip-flops may be provided for multiple special test modes. Additional features include the provision of a power-on reset circuit which locks out the entry into the test mode during power-up of the device.

Abstract: An integrated circuit memory is disclosed which includes redundant columns associated with a sub-array, and in which multiple input/output terminals are placed in communication with multiple columns in the sub-array in read and write cycles. The number of redundant columns per sub-array is less than the number of input/output terminals. A multiplexer connects the selected redundant column to a selected sense amplifier and write circuit for the input/output with which the replaced column was associated. The multiplexer includes pass gates connected to the bit lines of the redundant column, and fuses connected between each of the pass gates and each of the sense/write circuits selectable for the redundant column. Those of the fuses which are not associated with the selected input/output are opened, and the fuses associated with the selected input/output are left intact.

Abstract: An integrated circuit memory is disclosed which has a parallel test read mode. The memory includes comparators for comparing multiple data words, on a bit-by-bit basis, during the parallel read mode, with the result of the comparison used to enable or disable the output buffers. In test mode, in the event of a failed parallel test comparison, the comparator causes the output buffers to go into a high-impedance state; for a passing parallel test, the actual data state is presented by the output terminals. The comparison circuitry is in parallel with the output data path, so that the output data path is not adversely affected by the test circuitry, and so that the access time in test mode is the same as the access time during normal operation (assuming a passing test). The technique may be adapted to wide parallel test schemes.

Abstract: An integrated circuit memory is disclosed which has a parallel test read mode. The memory includes comparators for comparing multiple data words, on a bit-by-bit basis, during the parallel read mode, with the result of the comparison used to enable or disable the output buffers. In test mode, in the event of a failed parallel test comparison, the comparator causes the output buffers to go into a high-impedance state; for a passing parallel test, the actual data state is presented by the output terminals The comparison circuitry is in parallel with the output data path, so that the output data path is not adversely affected by the test circuitry, and so that the access time in test mode is the same as the access time during normal operation (assuming a passing test). The technique may be adapted to wide parallel test schemes.

Abstract: A read/write memory having timed-out control of certain of its peripheral circuitry is disclosed. The control circuit for controlling the time at which time-out is to occur includes two delay stages of different lengths. The shorter delay stage is used to define the time-out in a read operation, and the longer delay stage is used to define the time-out in a write operation, since a read operation can generally be accomplished sooner than a write operation. Enabling of the periphery is controlled by an address transition detection circuit, and by a data transition detection circuit. The circuit includes a short path by which enabling of the periphery is performed responsive to a data transition in the absence of an address transition, in order to perform a late write operation.

Abstract: An integrated circuit having a normal operating mode and a special operating mode, such as a special test mode, is disclosed. The special test mode is enabled by a series of signals, such as overvoltage excursions at a terminal, rather than by a single such excursion, so that it is less likely that the special test mode is entered inadvertently, such as due to noise or power-down and power-up of the device. The circuit for enabling the test mode includes a series of D-type flip-flops, each of which are clocked upon detection of the overvoltage condition together with a particular logic level applied at another terminal; multiple series of flip-flops may be provided for multiple special test modes. Additional features include the provision of a power-on reset circuit which locks out the entry into the test mode during power-up of the device.

Abstract: An integrated circuit having a normal operating mode and a special operating mode, such as a special test mode, is disclosed. The special test mode is enabled by a series of signals, such as overvoltage excursions at a terminal, rather than by a single such excursion, so that it is less likely that the special test mode is entered inadvertently, such as due to noise or power-down and power-up of the device. The circuit for enabling the test mode includes a series of D-type flip-flops, each of which are clocked upon detection of the overvoltage condition together with a particular logic level applied at another terminal; multiple series of flip-flops may be provided for multiple special test modes. In addition, sequential codes may be used for further security. Logic for evaluating both a sequence of codes received in parallel from a number of address terminals, and also a sequence of serial codes received at single address terminal, are disclosed.