Abstract: The subject matter described herein relates to methods and systems for fast imprinting of nanometer scale features in a workpiece. According to one aspect, a system for producing nanometer scale features in a workpiece is disclosed. The system includes a die having a surface with at least one nanometer scale feature located thereon. A first actuator moves the die with respect to the workpiece such that the at least one nanometer scale feature impacts the workpiece and imprints a corresponding at least one nanometer scale feature in the workpiece.

Abstract: The subject matter described herein relates to methods and systems for fast imprinting of nanometer scale features in a workpiece. According to one aspect, a system for producing nanometer scale features in a workpiece is disclosed. The system includes a die having a surface with at least one nanometer scale feature located thereon. A first actuator moves the die with respect to the workpiece such that the at least one nanometer scale feature impacts the workpiece and imprints a corresponding at least one nanometer scale feature in the workpiece.

Abstract: The subject matter described herein relates to methods and systems for fast imprinting of nanometer scale features in a workpiece. According to one aspect, a system for producing nanometer scale features in a workpiece is disclosed. The system includes a die having a surface with at least one nanometer scale feature located thereon. A first actuator moves the die with respect to the workpiece such that the at least one nanometer scale feature impacts the workpiece and imprints a corresponding at least one nanometer scale feature in the workpiece.

Abstract: Systems and methods for performing on-machine measurements and automatic part alignment, including: a measurement component operable for determining the position of a part on a machine; and an actuation component operable for adjusting the position of the part by contacting the part with a predetermined force responsive to the determined position of the part. The measurement component consists of a transducer. The actuation component consists of a linear actuator. Optionally, the measurement component and the actuation component consist of a single linear actuator operable for contacting the part with a first lighter force for determining the position of the part and with a second harder force for adjusting the position of the part. The actuation component is utilized in a substantially horizontal configuration and the effects of gravitational drop of the part are accounted for in the force applied and the timing of the contact.

Abstract: The subject matter described herein relates to methods and systems for fast imprinting of nanometer scale features in a workpiece. According to one aspect, a system for producing nanometer scale features in a workpiece is disclosed. The system includes a die having a surface with at least one nanometer scale feature located thereon. A first actuator moves the die with respect to the workpiece such that the at least one nanometer scale feature impacts the workpiece and imprints a corresponding at least one nanometer scale feature in the workpiece.

Abstract: Systems and methods for performing on-machine measurements and automatic part alignment, including: a measurement component operable for determining the position of a part on a machine; and an actuation component operable for adjusting the position of the part by contacting the part with a predetermined force responsive to the determined position of the part. The measurement component consists of a transducer. The actuation component consists of a linear actuator. Optionally, the measurement component and the actuation component consist of a single linear actuator operable for contacting the part with a first lighter force for determining the position of the part and with a second harder force for adjusting the position of the part. The actuation component is utilized in a substantially horizontal configuration and the effects of gravitational drop of the part are accounted for in the force applied and the timing of the contact.

Abstract: A system for detecting and eliminating subterranean animals is disclosed. The system includes an infrared detector device adapted to detect animals below the ground surface from above the ground surface. A lethal event device is operatively coupled to the infrared detector device. An animal below the ground surface passing the above ground infrared detector actuates the lethal event device to eliminate the animal below the ground surface. A method for detecting subterranean animals is disclosed, as well as a method for detecting and eliminating subterranean animals.

Abstract: A polar coordinate-based profilometer includes a base, a rotary stage, a linear stage, and a probe device. The rotary stage is mounted on the base and includes a rotary table rotatable about a vertical axis oriented orthogonal to the base. The linear stage is mounted on the rotary table and is rotatable therewith. The linear stage includes a linear slide member that is translatable along a radial axis orthogonal to the vertical axis. The probe device is mounted on the linear slide member and is translatable therewith. The probe device includes a probe tip that is linearly displaceable along the radial direction and communicates with a linear displacement-sensing transducer. Alternatively, the probe device scans an object without contacting the object. Methods are provided for measuring an object based on polar coordinates, and correcting for misalignment prior to measurement.

Abstract: A polar coordinate-based profilometer includes a base, a rotary stage, a linear stage, and a probe device. The rotary stage is mounted on the base and includes a rotary table rotatable about a vertical axis oriented orthogonal to the base. The linear stage is mounted on the rotary table and is rotatable therewith. The linear stage includes a linear slide member that is translatable along a radial axis orthogonal to the vertical axis. The probe device is mounted on the linear slide member and is translatable therewith. The probe device includes a probe tip that is linearly displaceable along the radial direction and communicates with a linear displacement-sensing transducer. Alternatively, the probe device scans an object without contacting the object. Methods are provided for measuring an object based on polar coordinates, and correcting for misalignment prior to measurement.

Abstract: A turning machine includes a controller for generating both aspherical and non-symmetrical shape components defining the predetermined shape, and a controller for controlling a spindle and a positionable cutting blade to thereby form a predetermined non-rotationally symmetric shape in a workpiece surface. The apparatus includes a rotatable spindle for rotatably mounting the workpiece about an axis, a spindle encoder for sensing an angular position of the rotating workpiece, the cutting blade, and radial and transverse positioners for relatively positioning the cutting blade and workpiece along respective radial and transverse directions. The controller cooperates with a fast transverse positioner for positioning the cutting blade in predetermined varying transverse positions during a revolution of the workpiece.