Abstract: A common Modular Carrier (MC) unit shares power and control among a plurality of Optical Network Units (ONU) which are plugged into it, thereby increasing the ONU density in an existing equipment shelf. In one embodiment, the MC unit together with its four ONU units is arranged to slide into an existing card slot of the existing equipment shelf and occupy the space of the adjacent slot. The result is a doubling of the capacity over the conventional technique of using a separate slot for each ONU unit.

Abstract: A tool for extracting a press fit pin from a pin field in a backplane of an electronic system. The tool includes a shaft having first and second ends, with a chuck mounted to the first end and an abutment mounted to the second end. The chuck has a plurality of jaws adapted to grip the pin therebetween and a weight is slidably mounted on the shaft between the chuck and the abutment. After a pin is held by the chuck, the weight is slid along the shaft to contact the abutment and the kinetic energy imparted by the weight to the shaft acts to pull the pin out of the backplane.

Abstract: A universal test fixture assembly for circuit packs includes a test fixture body, a top guide plate and a bottom guide plate. Each guide plate includes tracks that extend from a front end to a second end of the guide plates and further includes an integrally formed latching channel that runs perpendicular to the tracks. The top guide plate and bottom guide plate are mounted in an opposing and matching relationship such that the circuit pack slidably engages one of the tracks in the top guide plate and a corresponding track in the bottom guide plate and are moveable relative to one another to accommodate circuit packs of varying sizes. The guide plates include tabs which mate with corresponding slots on the test fixture body to prevent misalignment and reduce tolerance build-ups. A second pair of guide plates are attachable to form a two-tiered structure such that two different circuit pack sizes can be accommodated in the same test fixture.