Abstract: An apparatus and method for measuring physical characteristics of an electrically conductive material by the use of eddy-current techniques and compensating measurement errors caused by changes in temperature includes a switching arrangement connected between primary and reference coils of an eddy-current probe which allows the probe to be selectively connected between an eddy current output oscilloscope and a digital ohm-meter for measuring the resistances of the primary and reference coils substantially at the time of eddy current measurement. In this way, changes in resistance due to temperature effects can be completely taken into account in determining the true error in the eddy current measurement. The true error can consequently be converted into an equivalent eddy current measurement correction.