Abstract: A semiconductor wafer may be secured to a wafer support system by causing a supported surface of the semiconductor wafer to be at a lower gas pressure than an exposed surface of the semiconductor wafer.

Abstract: A method for automatically inserting connectors and coupling test probes to circuit boards, such as computer system boards and the like. The method is implemented via an apparatus that enables connectors to be automatically inserted into mating connectors on a circuit board device under test (DUT). Connectors may be automatically inserted along 1-4 axes. The apparatus includes replaceable probe/connector plates that are DUT-type specific, as well as DUT-type specific side access units. The apparatus may also be used for inserting memory devices and microprocessors, and further enables peripheral devices to be operatively coupled to expansion bus connectors on the DUT. In one embodiment, a single actuator is employed to actuate up to four insertion axes simultaneously.

Abstract: An apparatus for automatically inserting connectors and coupling test probes to circuit boards, such as computer system boards and the like. The apparatus enables connectors to be automatically inserted into mating connectors on a circuit board device under test (DUT). Connectors may be automatically inserted along 1-4 axes. The apparatus includes replaceable probe/connector plates that are DUT-type specific, as well as DUT-type specific side access units. The apparatus may also be used for inserting memory devices and microprocessors, and further enables peripheral devices to be operatively coupled to expansion bus connectors on the DUT. In one embodiment, a single actuator is employed to actuate up to four insertion axes simultaneously.

Abstract: An apparatus and method for automatically testing circuit boards, such as computer system boards and the like. The circuit board device under test (DUT) is loaded into an automated test apparatus (tester), which includes a mechanism for automatically connecting test electronics to various DUT circuitry and I/O ports via corresponding connectors on the DUT. A type of DUT is identified, and a corresponding set of tests are performed to verify the operation of the DUT. Appropriate power signals and sequencing are also applied to the DUT, as defined by it type. Data logging is performed to log the results of the testing. The apparatus includes replaceable probe/connector plates that are DUT-type specific and corresponding universal electronics and cabling to enable a variety of different board types to be tested with the same apparatus.

Abstract: An apparatus and method for automatically testing circuit boards, such as computer system boards and the like. The circuit board device under test (DUT) is loaded into an automated test apparatus (tester), which includes a mechanism for automatically connecting test electronics to various DUT circuitry and I/O ports via corresponding connectors on the DUT. A type of DUT is identified, and a corresponding set of tests are performed to verify the operation of the DUT. Appropriate power signals and sequencing are also applied to the DUT, as defined by it type. Data logging is performed to log the results of the testing. The apparatus includes replaceable probe/connector plates that are DUT-type specific and corresponding universal electronics and cabling to enable a variety of different board types to be tested with the same apparatus.

Abstract: A semiconductor wafer may be secured to a wafer support system by causing a supported surface of the semiconductor wafer to be at a lower gas pressure than an exposed surface of the semiconductor wafer.

Abstract: A semiconductor wafer may be secured to a wafer support system by causing a supported surface of the semiconductor wafer to be at a lower gas pressure than an exposed surface of the semiconductor wafer.

Abstract: An apparatus for automatically inserting connectors and coupling test probes to circuit boards, such as computer system boards and the like. The apparatus enables connectors to be automatically inserted into mating connectors on a circuit board device under test (DUT). Connectors may be automatically inserted along 1-4 axes. The apparatus includes replaceable probe/connector plates that are DUT-type specific, as well as DUT-type specific side access units. The apparatus may also be used for inserting memory devices and microprocessors, and further enables peripheral devices to be operatively coupled to expansion bus connectors on the DUT. In one embodiment, a single actuator is employed to actuate up to four insertion axes simultaneously.

Abstract: A method for automatically inserting connectors and coupling test probes to circuit boards, such as computer system boards and the like. The method is implemented via an apparatus that enables connectors to be automatically inserted into mating connectors on a circuit board device under test (DUT). Connectors may be automatically inserted along 1-4 axes. The apparatus includes replaceable probe/connector plates that are DUT-type specific, as well as DUT-type specific side access units. The apparatus may also be used for inserting memory devices and microprocessors, and further enables peripheral devices to be operatively coupled to expansion bus connectors on the DUT. In one embodiment, a single actuator is employed to actuate up to four insertion axes simultaneously.

Abstract: An apparatus and method for automatically inserting connectors and coupling test probes to circuit boards, such as computer system boards and the like. The apparatus enables connectors to be automatically inserted into mating connectors on a circuit board device under test (DUT). Connectors may be automatically inserted along 1–4 axes. The apparatus includes replaceable probe/connector plates that are DUT-type specific, as well as DUT-type specific side access units. The apparatus may also be used for inserting memory devices and microprocessors, and further enables peripheral devices to be operatively coupled to expansion bus connectors on the DUT. In one embodiment, a single actuator is employed to actuate up to four insertion axes simultaneously.

Abstract: A semiconductor wafer may be secured to a wafer support system by causing a supported surface of the semiconductor wafer to be at a lower gas pressure than an exposed surface of the semiconductor wafer.

Abstract: An apparatus and method for supporting and aligning a circuit board, such as a computer system board and the like, during testing. The apparatus includes a carrier plate having a plurality of holes arrayed in a grid. The holes are used for coupling various alignment components to the carrier plate. These alignment components include fixed tooling pins, adjustable tooling pins, and alignment blocks. In one embodiment, a template is employed to align the alignment components based on a form factor of the circuit board to be tested, wherein different templates are employed for circuit board-types having different form factors. The circuit board is supported by a plurality of plastic threaded fasteners to form a gap between the circuit board and the carrier plate. The templates are also used to locate these plastic supports. The carrier plate further includes a pair of alignment bushings for aligning the carrier plate relative to a test apparatus in which the carrier plate is to be employed.

Abstract: An apparatus and method for automatically testing circuit boards, such as computer system boards and the like. The circuit board device under test (DUT) is loaded into an automated test apparatus (tester), which includes a mechanism for automatically connecting test electronics to various DUT circuitry and I/O ports via corresponding connectors on the DUT. A type of DUT is identified, and a corresponding set of tests are performed to verify the operation of the DUT. Appropriate power signals and sequencing are also applied to the DUT, as defined by it type. Data logging is performed to log the results of the testing. The apparatus includes replaceable probe/connector plates that are DUT-type specific and corresponding universal electronics and cabling to enable a variety of different board types to be tested with the same apparatus.

Abstract: An apparatus and method for automatically inserting connectors and coupling test probes to circuit boards, such as computer system boards and the like. The apparatus enables connectors to be automatically inserted into mating connectors on a circuit board device under test (DUT). Connectors may be automatically inserted along 1-4 axes. The apparatus includes replaceable probe/connector plates that are DUT-type specific, as well as DUT-type specific side access units. The apparatus may also be used for inserting memory devices and microprocessors, and further enables peripheral devices to be operatively coupled to expansion bus connectors on the DUT. In one embodiment, a single actuator is employed to actuate up to four insertion axes simultaneously.

Abstract: An apparatus and method for automatically testing circuit boards, such as computer system boards and the like. The circuit board device under test (DUT) is loaded into an automated test apparatus (tester), which includes a mechanism for automatically connecting test electronics to various DUT circuitry and I/O ports via corresponding connectors on the DUT. A type of DUT is identified, and a corresponding set of tests are performed to verify the operation of the DUT. Appropriate power signals and sequencing are also applied to the DUT, as defined by it type. Data logging is performed to log the results of the testing. The apparatus includes replaceable probe/connector plates that are DUT-type specific and corresponding universal electronics and cabling to enable a variety of different board types to be tested with the same apparatus.

Abstract: An earth moving machine having a frame that supports an engine and a radiator that is located proximate a rear end of the frame. A service center module is positioned between the engine and the radiator. The service center module has a support member, a support plate on an upper surface of the support member, a back plate that is perpendicular to the support plate, and at least one mounting location on the back plate for mounting one or more components that may require routine maintenance such as an air tank, an ether aid, an air dryer, or a transmission filter. The central service center module increases maintenance efficiency by locating components, which may require routine maintenance, in a single easily accessible location.