Patents by Inventor Thomas A. Wayson

Thomas A. Wayson has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Thin film device repaired using enhanced repair process
    Patent number: 6054749
    Abstract: A process for partially repairing defective Multi-Chip Module (MCM) Thin-Film (TF) wiring nets. The process comprises the steps of locating a short circuit between any two nets of the MCM, identifying a site to cut in one of the two nets, and deleting an internal portion of one of the two nets at the identified site.
    Type: Grant
    Filed: April 23, 1999
    Date of Patent: April 25, 2000
    Assignee: International Business Machines Corporation
    Inventors: Gerald K. Bartley, Peter A. Franklin, Carmine J. Mele, Arthur G. Merryman, John R. Pennacchia, Kurt A. Smith, Thomas A. Wassick, Thomas A. Wayson, Roy Yu
  • Enhanced thin film wiring net repair process
    Patent number: 5972723
    Abstract: A process for partially repairing defective Multi-Chip Module (MCM) Thin-Film (TF) wiring nets. The process comprises the steps of locating a short circuit between any two nets of the MCM, identifying a site to cut in one of the two nets, and deleting an internal portion of one of the two nets at the identified site.
    Type: Grant
    Filed: October 21, 1997
    Date of Patent: October 26, 1999
    Assignee: International Business Machines Corporation
    Inventors: Gerald K. Bartley, Peter A. Franklin, Carmine J. Mele, Arthur G. Merryman, John R. Pennacchia, Kurt A. Smith, Thomas A. Wassick, Thomas A. Wayson, Roy Yu
  • Graphics assisted manufacturing process for thin-film devices
    Patent number: 5937269
    Abstract: A Process for graphically assisting the partial repair of defective MCM TF wiring nets. The process comprises the steps of inserting the wiring layer of the thin-film device in a tester, scanning the wiring layer of the thin-film device with the tester, identifying defects in the wiring nets, prioritizing the defects based on a function of each of the defective wiring nets, and repairing the defects based on priority.
    Type: Grant
    Filed: October 29, 1997
    Date of Patent: August 10, 1999
    Assignee: International Business Machines Corporation
    Inventors: Roy Yu, Gerald K. Bartley, Peter A. Franklin, Carmine J. Mele, Arthur G. Merryman, John R. Pennacchia, Kurt A. Smith, Thomas A. Wassick, Thomas A. Wayson