Abstract: A memory cell includes first and second p-channel transistors and first and second n-channel transistors in a cross-coupled latch configuration. Power control circuitry associated with the memory cell is coupled to selectively perform voltage transitions on the source terminals of one or more of the n-channel and/or p-channel transistors in the memory cell during a data corruption mode of operation to destroy data stored in the latch and set the memory cell to a known state. In one implementation, the power control circuitry is coupled to the source terminal of one of the n-channel transistors to transition that terminal from a low voltage reference level (present during a normal mode of operation) to a high voltage reference level and back to the low voltage reference level. In another implementation, the power control circuitry is coupled to the source terminal of one of the n-channel transistors and the source terminal of at least one of the p-channel transistors.

Abstract: A method and circuit are disclosed for detecting the performance of an oscillator circuit. In particular, the circuit may detect a signal, such as the output of the oscillator circuit, failing to oscillate as desired. The second circuit may be capable of detecting whether the signal oscillates at a frequency that is less than a predetermined frequency. The second circuit may include timing circuits for determining whether the signal remains in a first logic state for at least a predetermined period of time and whether the signal remains in a second logic state for at least the predetermined period of time.

Abstract: A method and circuit are disclosed for detecting the performance of an oscillator circuit. In particular, the circuit may detect a signal, such as the output of the oscillator circuit, failing to oscillate as desired. The second circuit may be capable of detecting whether the signal oscillates at a frequency that is less than a predetermined frequency. The second circuit may include timing circuits for determining whether the signal remains in a first logic state for at least a predetermined period of time and whether the signal remains in a second logic state for at least the predetermined period of time.

Abstract: An integrated circuit having a normal operating mode and a special operating mode, such as a special test mode, is disclosed. The special test mode is enabled by a series of signals, such as overvoltage excursions at a terminal, rather than by a single such excursion, so that it is less likely that the special test mode is entered inadvertently, such as due to noise or power-down and power-up of the device. The circuit for enabling the test mode includes a series of D-type flip-flops, each of which are clocked upon detection of the overvoltage condition together with a particular logic level applied at another terminal; multiple series of flip-flops may be provided for multiple special test modes. Additional features include the provision of a power-on reset circuit which locks out the entry into the test mode during power-up of the device.