Patents by Inventor Thomas Ambridge

Thomas Ambridge has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Determining semiconductor characteristic
    Patent number: 4168212
    Abstract: The electrochemical measuring technique of the present invention employs, as the barrier material, a concentrated electrolyte, which also forms a medium for the controlled dissolution of a surface of the semiconductor so as to provide a continuous depth profile. The depth profile characteristic may be determined by capacitance-voltage measurements on n-type bulk GaAs, using KOH as the electrolyte.
    Type: Grant
    Filed: April 25, 1978
    Date of Patent: September 18, 1979
    Assignee: The Post Office
    Inventors: Marc M. Faktor, Thomas Ambridge, Ean G. Bremner
  • Measuring arrangements
    Patent number: 4028207
    Abstract: The electrochemical measuring technique of the present invention employs, as the barrier material, a concentrated electrolyte, which also forms a medium for the controlled dissolution of a surface of the semiconductor so as to provide a continuous depth profile. The depth profile characteristic may be determined by capacitance-voltage measurements on n-type bulk GaAs, using KOH as the electrolyte.
    Type: Grant
    Filed: May 16, 1975
    Date of Patent: June 7, 1977
    Assignee: The Post Office
    Inventors: Marc Marian Faktor, Thomas Ambridge, Ean Grant Bremner