Abstract: A circuit device may be configured to perform early detection of degradation problems associated with delamination or cratering in the device. The device may comprise a semiconductor layer comprising at least a portion of one or more power transistors, a metallization layer formed over the semiconductor layer, and a plurality of excitation elements formed into the semiconductor layer, wherein the excitation elements extend through the semiconductor layer to the metallization layer such that an excitation pulse can be delivered into a first excitation element and received from a second excitation element after passing laterally through the metallization layer.

Abstract: A method is disclosed. The method includes measuring at least one electrical parameter (R, L, C) of at least one wire (10) in a motor vehicle (100) at a certain time instance (ti) to obtain measurement data (M(ti)); comparing the measurement data (M(ti)) with comparative data (C(ti)) held in a data storage (5); and taking a predefined action (63) dependent on the comparing.

Abstract: An integrated circuit that may be employed as a smart switch is described herein. In accordance with one embodiment the integrated circuit includes a power transistor coupled between a supply pin and an output pin and further includes a control circuit configured to trigger a switch-on and a switch-off of the power transistor in accordance with an input signal. The control circuit is configured to trigger a switch-off of the power transistor when a load current passing through the power transistor is at or above a predetermined current and a supply voltage received at the supply pin is at or below a predetermined threshold voltage.

Abstract: A method is disclosed. The method includes measuring at least one electrical parameter (R, L, C) of at least one wire (10) in a motor vehicle (100) at a certain time instance (ti) to obtain measurement data (M(ti)); comparing the measurement data (M(ti)) with comparative data (C(ti)) held in a data storage (5); and taking a predefined action (63) dependent on the comparing.

Abstract: An integrated circuit that may be employed as a smart switch is described herein. In accordance with one embodiment the integrated circuit includes a power transistor coupled between a supply pin and an output pin and further includes a control circuit configured to trigger a switch-on and a switch-off of the power transistor in accordance with an input signal. The control circuit is configured to trigger a switch-off of the power transistor when a load current passing through the power transistor is at or above a predetermined current and a supply voltage received at the supply pin is at or below a predetermined threshold voltage.