Patents by Inventor Thomas Burd

Thomas Burd has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10120430
    Abstract: A system and method for managing operating modes within a semiconductor chip for optimal power and performance while meeting a reliability target are described. A semiconductor chip includes a functional unit and a corresponding reliability monitor. The functional unit provides actual usage values to the reliability monitor. The reliability monitor determines expected usage values based on a reliability target and the age of the semiconductor chip. The reliability monitor compares the actual usage values and the expected usage values. The result of this comparison is used to increase or decrease current operational parameters.
    Type: Grant
    Filed: September 7, 2016
    Date of Patent: November 6, 2018
    Assignees: Advanced Micro Devices, Inc., ATI Technologies ULC
    Inventors: Stephen V. Kosonocky, Thomas Burd, Adam Clark, Larry D. Hewitt, John Vincent Faricelli, John P. Petry
  • Publication number: 20180067535
    Abstract: A system and method for managing operating modes within a semiconductor chip for optimal power and performance while meeting a reliability target are described. A semiconductor chip includes a functional unit and a corresponding reliability monitor. The functional unit provides actual usage values to the reliability monitor. The reliability monitor determines expected usage values based on a reliability target and the age of the semiconductor chip. The reliability monitor compares the actual usage values and the expected usage values. The result of this comparison is used to increase or decrease current operational parameters.
    Type: Application
    Filed: September 7, 2016
    Publication date: March 8, 2018
    Inventors: Stephen V. Kosonocky, Thomas Burd, Adam Clark, Larry D. Hewitt, John Vincent Faricelli, John P. Petry