Patents by Inventor Thomas Chabreck

Thomas Chabreck has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9236209
    Abstract: A relay fault detection and correction system includes a signal detector structured to measure primary and secondary signals, and generates a fault output signal if the signals appear to be unterminated due to a relay not connecting the signals to the loads. A cycle circuit is structured to cause a relay controller to cycle a potentially under-performing relay between its states a number of times after the signal detector generates the fault output.
    Type: Grant
    Filed: April 1, 2014
    Date of Patent: January 12, 2016
    Assignee: TEKTRONIX, INC.
    Inventors: Michael S. Overton, Robert Davies, Thomas Chabreck
  • Publication number: 20140300481
    Abstract: A relay fault detection and correction system includes a signal detector structured to measure primary and secondary signals, and generates a fault output signal if the signals appear to be unterminated due to a relay not connecting the signals to the loads. A cycle circuit is structured to cause a relay controller to cycle a potentially under-performing relay between its states a number of times after the signal detector generates the fault output.
    Type: Application
    Filed: April 1, 2014
    Publication date: October 9, 2014
    Applicant: Tektronix, Inc.
    Inventors: Michael S. Overton, Robert Davies, Thomas Chabreck
  • Publication number: 20060002603
    Abstract: Methods and apparatus for correcting defects, such as rounded corners and line end shortening, in patterns formed via lithography are provided. Such defects are compensated for “post-rasterization” by manipulating the grayscale values of pixel maps.
    Type: Application
    Filed: July 1, 2004
    Publication date: January 5, 2006
    Inventors: Robert Beauchaine, Thomas Chabreck, Samuel Howells, John Hubbard, Asher Klatchko, Peter Pirogovsky, Robin Teitzel
  • Publication number: 20060001688
    Abstract: Methods and apparatus for correcting defects, such as rounded corners and line end shortening, in patterns formed via lithography are provided. Such defects are compensated for “post-rasterization” by manipulating the grayscale values of pixel maps.
    Type: Application
    Filed: July 1, 2004
    Publication date: January 5, 2006
    Inventors: Thomas Chabreck, Samuel Howells, John Hubbard, Robin Teitzel