Patents by Inventor Thomas Deckert

Thomas Deckert has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12537609
    Abstract: A system and method for determining an error vector magnitude (EVM) of a polarized transmission from a device-under-test (DUT). A first signal transmitted by the DUT is received via a horizontally polarized receiver antenna, and a second signal transmitted by the DUT is received via a vertically polarized receiver antenna. The second signal is coherent with the first signal. The EVM is calculated based at least in part on the first signal and the second signal and a reference signal.
    Type: Grant
    Filed: January 7, 2023
    Date of Patent: January 27, 2026
    Assignee: NATIONAL INSTRUMENTS CORPORATION
    Inventors: Gerardo Orozco, Thomas Deckert, Nan Yang
  • Patent number: 12375188
    Abstract: A system and method for testing an antenna-under-test (AUT). A multi-probe antenna array transmitter is moved to a plurality of positions within a scan area. At each position, each probe antenna element of the transmitter transmits a near-field (NF) over-the-air (OTA) signal to the AUT. An alignment procedure is performed to align transmission locations for signals transmitted by different ones of the plurality of probe antenna elements. Correction factors are determined that characterize amplitude and phase discrepancies between the probe antenna elements of the transmitter. The correction factors are applied to the signals, and the corrected signals are combined at each transmission location to obtain average signals. A far-field (FF) reception pattern for the AUT is determined based on a discrete Fourier transform of the average signals and stored in a non-transitory computer readable memory medium.
    Type: Grant
    Filed: May 3, 2023
    Date of Patent: July 29, 2025
    Assignee: National Instruments Corporation
    Inventors: Thomas Deckert, Martin Obermaier, Dirk Plettemeier
  • Patent number: 12235305
    Abstract: A system and method for testing an antenna-under-test (AUT). A multi-probe antenna array receiver is moved to a plurality of positions within a scan area. At each position, each probe antenna element of the receiver receives a near-field (NF) over-the-air (OTA) signal from the AUT. An alignment procedure is performed to align reception locations for signals received by different ones of the plurality of probe antenna elements. Correction factors are determined that characterize amplitude and phase discrepancies between the probe antenna elements of the receiver. The correction factors are applied to the received signals, and the corrected signals are combined at each reception location to obtain average signals. A far-field (FF) transmission pattern for the AUT is determined based on a discrete Fourier transform of the average signals and stored in a non-transitory computer readable memory medium.
    Type: Grant
    Filed: May 3, 2023
    Date of Patent: February 25, 2025
    Assignee: National Instruments Corporation
    Inventors: Thomas Deckert, Martin Obermaier, Dirk Plettemeier
  • Publication number: 20240372633
    Abstract: A system and method for testing an antenna-under-test (AUT). A multi-probe antenna array transmitter is moved to a plurality of positions within a scan area. At each position, each probe antenna element of the transmitter transmits a near-field (NF) over-the-air (OTA) signal to the AUT. An alignment procedure is performed to align transmission locations for signals transmitted by different ones of the plurality of probe antenna elements. Correction factors are determined that characterize amplitude and phase discrepancies between the probe antenna elements of the transmitter. The correction factors are applied to the signals, and the corrected signals are combined at each transmission location to obtain average signals. A far-field (FF) reception pattern for the AUT is determined based on a discrete Fourier transform of the average signals and stored in a non-transitory computer readable memory medium.
    Type: Application
    Filed: May 3, 2023
    Publication date: November 7, 2024
    Inventors: Thomas Deckert, Martin Obermaier, Dirk Plettemeier
  • Publication number: 20240369608
    Abstract: A system and method for testing an antenna-under-test (AUT). A multi-probe antenna array receiver is moved to a plurality of positions within a scan area. At each position, each probe antenna element of the receiver receives a near-field (NF) over-the-air (OTA) signal from the AUT. An alignment procedure is performed to align reception locations for signals received by different ones of the plurality of probe antenna elements. Correction factors are determined that characterize amplitude and phase discrepancies between the probe antenna elements of the receiver. The correction factors are applied to the received signals, and the corrected signals are combined at each reception location to obtain average signals. A far-field (FF) transmission pattern for the AUT is determined based on a discrete Fourier transform of the average signals and stored in a non-transitory computer readable memory medium.
    Type: Application
    Filed: May 3, 2023
    Publication date: November 7, 2024
    Inventors: Thomas Deckert, Martin Obermaier, Dirk Plettemeier
  • Publication number: 20240235699
    Abstract: A system and method for determining an error vector magnitude (EVM) of a polarized transmission from a device-under-test (DUT). A first signal transmitted by the DUT is received via a horizontally polarized receiver antenna, and a second signal transmitted by the DUT is received via a vertically polarized receiver antenna. The second signal is coherent with the first signal. The EVM is calculated based at least in part on the first signal and the second signal and a reference signal.
    Type: Application
    Filed: January 7, 2023
    Publication date: July 11, 2024
    Inventors: Gerardo Orozco, Thomas Deckert, Nan Yang
  • Patent number: 11982699
    Abstract: A system and method for testing devices such as integrated circuits (IC) with integrated antenna arrays configured for wireless signal reception. The method performs a calibration operation on a reference device under test (DUT). During the calibration operation, the DUT receives a series of first signals from a first far-field (FF) location and a series of array transmissions from a second near-field (NF) location using different beamforming settings, and determines therefrom a set of calibration parameters. The calibration parameters may be used by a probe antenna system (PAS) to transmit an array transmission to the DUT from the second NF location to emulate a single probe or multi-probe transmission from the first FF location.
    Type: Grant
    Filed: November 22, 2021
    Date of Patent: May 14, 2024
    Assignee: National Instruments Corporation
    Inventors: Martin Obermaier, Martin Laabs, Dirk Plettemeier, Marc Vanden Bossche, Thomas Deckert, Vincent Kotzsch, Johannes Dietmar Herbert Lange
  • Publication number: 20230160936
    Abstract: A system and method for testing devices such as integrated circuits (IC) with integrated antenna arrays configured for wireless signal reception. The method performs a calibration operation on a reference device under test (DUT). During the calibration operation, the DUT receives a series of first signals from a first far-field (FF) location and a series of array transmissions from a second near-field (NF) location using different beamforming settings, and determines therefrom a set of calibration parameters. The calibration parameters may be used by a probe antenna system (PAS) to transmit an array transmission to the DUT from the second NF location to emulate a single probe or multi-probe transmission from the first FF location.
    Type: Application
    Filed: November 22, 2021
    Publication date: May 25, 2023
    Inventors: Martin Obermaier, Martin Laabs, Dirk Plettemeier, Marc Vanden Bossche, Thomas Deckert, Vincent Kotzsch, Johannes Dietmar Herbert Lange
  • Patent number: 11515950
    Abstract: A system and method for testing (e.g., rapidly and inexpensively) devices such as integrated circuits (IC) with integrated antennas configured for millimeter wave transmission and/or reception. The method may first perform a calibration operation on a reference device under test (DUT). The calibration operation may determine a set of reference DUT FF base functions and may also generate a set of calibration coefficients. After the calibration step using the reference DUT, the resulting reference DUT FF base functions and the calibration coefficients (or reconstruction matrix) may be used in determining far-field patterns of DUTs based on other field measurements, e.g., measurements taken in the near field of the DUT.
    Type: Grant
    Filed: September 1, 2021
    Date of Patent: November 29, 2022
    Assignee: National Instruments Corporation
    Inventors: Martin Laabs, Dirk Plettemeier, Thomas Deckert, Johannes Dietmar Herbert Lange, Marc Vanden Bossche
  • Publication number: 20220077938
    Abstract: A system and method for testing (e.g., rapidly and inexpensively) devices such as integrated circuits (IC) with integrated antennas configured for millimeter wave transmission and/or reception. The method may first perform a calibration operation on a reference device under test (DUT). The calibration operation may determine a set of reference DUT FF base functions and may also generate a set of calibration coefficients. After the calibration step using the reference DUT, the resulting reference DUT FF base functions and the calibration coefficients (or reconstruction matrix) may be used in determining far-field patterns of DUTs based on other field measurements, e.g., measurements taken in the near field of the DUT.
    Type: Application
    Filed: September 1, 2021
    Publication date: March 10, 2022
    Inventors: Martin Laabs, Dirk Plettemeier, Thomas Deckert, Johannes Dietmar Herbert Lange, Marc Vanden Bossche
  • Patent number: 10942214
    Abstract: Antenna characterization systems and methods are described for hardware-timed testing of integrated circuits (IC) with integrated antennas configured for over-the-air transmission and/or reception. An IC to be tested (e.g., the device under test (DUT)) may be mounted to an adjustable positioner in an anechoic chamber. Radio frequency (RF) characteristics (e.g., including transmission characteristics, reception characteristics, and/or beamforming characteristics) of the IC may be tested over-the-air using an array of antennas or probes within the anechoic chamber while continually transitioning the adjustable positioner through a plurality of orientations. Counters and reference trigger intelligence may be employed to correlate measurement results with orientations of the DUT.
    Type: Grant
    Filed: September 25, 2018
    Date of Patent: March 9, 2021
    Assignee: National Instruments Corporation
    Inventors: Gerardo Orozco Valdes, Thomas Deckert, Johannes D. H. Lange, Christopher N. White, Karl F. Grosz
  • Patent number: 10725080
    Abstract: Antenna characterization systems and methods are described for hardware-timed testing of integrated circuits (IC) with integrated antennas configured for over-the-air transmission and/or reception. An IC to be tested (e.g., the device under test (DUT)) may be mounted to an adjustable positioner in an anechoic chamber. Radio frequency (RF) characteristics (e.g., including transmission characteristics, reception characteristics, and/or beamforming characteristics) of the IC may be tested over-the-air using an array of antennas or probes within the anechoic chamber while continually transitioning the adjustable positioner through a plurality of orientations. Counters and reference trigger intelligence may be employed to correlate measurement results with orientations of the DUT.
    Type: Grant
    Filed: September 25, 2018
    Date of Patent: July 28, 2020
    Assignee: National Instruments Corporation
    Inventors: Gerardo Orozco Valdes, Thomas Deckert, Johannes D. H. Lange, Christopher N. White, Karl F. Grosz
  • Publication number: 20200096547
    Abstract: Antenna characterization systems and methods are described for hardware-timed testing of integrated circuits (IC) with integrated antennas configured for over-the-air transmission and/or reception. An IC to be tested (e.g., the device under test (DUT)) may be mounted to an adjustable positioner in an anechoic chamber. Radio frequency (RF) characteristics (e.g., including transmission characteristics, reception characteristics, and/or beamforming characteristics) of the IC may be tested over-the-air using an array of antennas or probes within the anechoic chamber while continually transitioning the adjustable positioner through a plurality of orientations. Counters and reference trigger intelligence may be employed to correlate measurement results with orientations of the DUT.
    Type: Application
    Filed: September 25, 2018
    Publication date: March 26, 2020
    Inventors: Gerardo Orozco Valdes, Thomas Deckert, Johannes D. H. Lange, Christopher N. White, Karl F. Grosz
  • Publication number: 20200096554
    Abstract: Antenna characterization systems and methods are described for hardware-timed testing of integrated circuits (IC) with integrated antennas configured for over-the-air transmission and/or reception. An IC to be tested (e.g., the device under test (DUT)) may be mounted to an adjustable positioner in an anechoic chamber. Radio frequency (RF) characteristics (e.g., including transmission characteristics, reception characteristics, and/or beamforming characteristics) of the IC may be tested over-the-air using an array of antennas or probes within the anechoic chamber while continually transitioning the adjustable positioner through a plurality of orientations. Counters and reference trigger intelligence may be employed to correlate measurement results with orientations of the DUT.
    Type: Application
    Filed: September 25, 2018
    Publication date: March 26, 2020
    Inventors: Gerardo Orozco Valdes, Thomas Deckert, Johannes D. H. Lange, Christopher N. White, Karl F. Grosz