Patents by Inventor Thomas Depaly

Thomas Depaly has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Identifying manufacturing disturbances using preliminary electrical test data
    Patent number: 7908109
    Abstract: A method includes receiving measured values for a plurality of electrical test parameters associated with integrated circuit devices on at least one wafer measured prior to completion of the wafer. Values of the electrical test parameters are predicted. The measured values are compared to the predicted values to generate residual values associated with the electrical test parameters. At least one performance metric associated with the devices is generated based on the residual values.
    Type: Grant
    Filed: July 8, 2008
    Date of Patent: March 15, 2011
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Richard P. Good, Lothar Waetzold, Thomas Depaly
  • IDENTIFYING MANUFACTURING DISTURBANCES USING PRELIMINARY ELECTRICAL TEST DATA
    Publication number: 20100010768
    Abstract: A method includes receiving measured values for a plurality of electrical test parameters associated with integrated circuit devices on at least one wafer measured prior to completion of the wafer. Values of the electrical test parameters are predicted. The measured values are compared to the predicted values to generate residual values associated with the electrical test parameters. At least one performance metric associated with the devices is generated based on the residual values.
    Type: Application
    Filed: July 8, 2008
    Publication date: January 14, 2010
    Inventors: Richard P. Good, Lothar Waetzold, Thomas Depaly