Patents by Inventor Thomas Detlef Istel

Thomas Detlef Istel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9717470
    Abstract: An X-ray imaging method includes acquiring a differential phase contrast imaging X-ray scan with an X-ray imaging system having an X-ray source, an X-ray detector, and a grating arrangement having a source grating, a phase grating and an analyzer grating. The source grating is misaligned in respect to an interferometer such that moiré fringes are detectable in the plane of the detector. A translation signal is computed for translating the source grating for achieving a predetermined moiré pattern. The positioning of the source grating is adjusted in an X-ray projection direction based on the translation signal such that at least 2 pi of phase changes are covered with the Moiré fringes over the width of the detector. And a further differential phase contrast imaging X-ray scan is acquired.
    Type: Grant
    Filed: August 20, 2013
    Date of Patent: August 1, 2017
    Assignee: KONINKLIJKE PHILIPS N.V.
    Inventors: Gerhard Martens, Heiner Daerr, Thomas Detlef Istel, Ewald Roessl, Udo Van Stevendaal
  • Publication number: 20150216499
    Abstract: The present invention relates handling misalignment in an X-ray imaging system for differential phase contrast imaging. In order to provide a reduction for the pretuning and adjustment requirements for manufacture and maintenance in a differential phase contrast imaging system, an X-ray imaging system (10) for differential phase contrast imaging, is provided that comprises a differential phase contrast setup (12) with an X-ray source (14) and an X-ray detector (16), a grating arrangement (18) comprising a source grating (20), a phase grating (22) and an analyser grating (24), wherein the source grating is arranged between the X-ray source and the phase grating, and the analyser grating is arranged between the phase grating and the detector. Further, a moving arrangement for a relative movement between an object under examination and at least one of the gratings is provided, as well as a processing unit (32), and a translation arrangement (34) for translating the source grating.
    Type: Application
    Filed: August 20, 2013
    Publication date: August 6, 2015
    Inventors: Gerhard Martens, Heiner Daerr, Thomas Detlef Istel, Ewald Roessl, Udo Van Stevendaal