Abstract: An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.

Abstract: A light weight, portable camera having a substantially rectangular shape, a case of substantially rectangular shape, the case being hollow and having an internal rectangular recess slightly larger than the camera so as to hold the camera closely therein, an elongated strap connected at one end thereof to the outside of the camera and connected at an opposite end to the outside of the case, a button on the outside of the camera, a snap on the strap spaced from the opposite end thereof for mating with the button and for forming a shorter closed strap loop between the camera and the case and a longer closed strap loop between the snap and the one end of the strap, whereby, when the camera is inserted into the case the shorter strap loop is positioned in folded condition between the outside of the camera and the inside of the case to hold the camera and case snuggly together, the longer strap loop supporting the camera and case around the neck of a person, a lens in the camera, a shutter in the camera in alignmen