Patents by Inventor Thomas E. Furtak

Thomas E. Furtak has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7949210
    Abstract: This invention provides fundamental science and novel device architectures for surface plasmon (SP)-based, complementary metal oxide semiconductor (CMOS)-compatible, optical elements such as modulators, couplers, and switches. The primary focus of the work is on waveguides based on an ultra-long-range surface plasmon (ULRSP) waveguide mode recently discovered by our team. This mode exists at the metal-dielectric interfaces in a silicon-oxide-metal-silicon layer structure. While initial work focuses on noble metals to support the ULRSP, our analysis shows Si processing-compatible metals such as Cu and Al can also be used. Our modeling has also shown that variation in the thickness of the oxide layer can be used to give unprecedented propagation lengths in such structures. Electrically-induced free carrier modulation of the dielectric constant in the Si adjacent to the oxide can modulate the waveguide properties allowing novel Si-compatible electro-optic devices to be created.
    Type: Grant
    Filed: October 9, 2007
    Date of Patent: May 24, 2011
    Assignee: Colorado School of Mines
    Inventors: Charles G. Durfee, Reuben T. Collins, Thomas E. Furtak
  • Publication number: 20090052827
    Abstract: This invention provides fundamental science and novel device architectures for surface plasmon (SP)-based, complementary metal oxide semiconductor (CMOS)-compatible, optical elements such as modulators, couplers, and switches. The primary focus of the work is on waveguides based on an ultra-long-range surface plasmon (ULRSP) waveguide mode recently discovered by our team. This mode exists at the metal-dielectric interfaces in a silicon-oxide-metal-silicon layer structure. While initial work focuses on noble metals to support the ULRSP, our analysis shows Si processing-compatible metals such as Cu and Al can also be used. Our modeling has also shown that variation in the thickness of the oxide layer can be used to give unprecedented propagation lengths in such structures. Electrically-induced free carrier modulation of the dielectric constant in the Si adjacent to the oxide can modulate the waveguide properties allowing novel Si-compatible electro-optic devices to be created.
    Type: Application
    Filed: October 9, 2007
    Publication date: February 26, 2009
    Applicant: Colorado School of Mines
    Inventors: Charles G. Durfee, Reuben T. Collins, Thomas E. Furtak
  • Patent number: 7182982
    Abstract: The present invention provides a device that acts as an optical switch to control the intensity of a light beam through the action of a second control beam. This behavior is achieved through photoinduced anisotropy that develops in a monomolecular layer coating the inside surfaces of a liquid crystal cell. One of the surfaces is permanently aligned prior to assembly by illuminating the surface with polarized light in the presence of oxygen. The other surface retains reversible behavior, adapting anisotropy according to the orientation of the polarization of the control beam. Accordingly, an optically controlled liquid crystal light valve is provided that does not require contact-rubbing methods in order to permanently align one of the layers coating an inside surface of the cell.
    Type: Grant
    Filed: September 13, 2005
    Date of Patent: February 27, 2007
    Assignee: Colorado School of Mines
    Inventors: Thomas E. Furtak, Youngwoo Yi
  • Patent number: 6384916
    Abstract: The parallel detecting spectroscopic ellipsometer/polarimeter sensor has no moving parts and operates in real-time for in-situ monitoring of the thin film surface properties of a sample within a processing chamber. It includes a multi-spectral source of radiation for producing a collimated beam of radiation directed towards the surface of the sample through a polarizer. The thus polarized collimated beam of radiation impacts and is reflected from the surface of the sample, thereby changing its polarization state due to the intrinsic material properties of the sample. The light reflected from the sample is separated into four separate polarized filtered beams, each having individual spectral intensities. Data about said four individual spectral intensities is collected within the processing chamber, and is transmitted into one or more spectrometers. The data of all four individual spectral intensities is then analyzed using transformation algorithms, in real-time.
    Type: Grant
    Filed: November 17, 2000
    Date of Patent: May 7, 2002
    Inventor: Thomas E. Furtak