Abstract: The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indication is associated with localized diffusion of a diffusant within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit.

Abstract: The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indication is associated with localized diffusion of a diffusant within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit.

Abstract: The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indication is associated with localized diffusion of a diffusant within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit.

Abstract: The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indication is associated with localized diffusion of a diffusant within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit.

Abstract: An impedance measurement system for detecting an analyte in a sample is disclosed. The system includes first, second, and third electrodes, wherein at least a portion of the third electrode is positioned between the first and second electrodes, means for generating an electromagnetic field between the first and second electrodes, means for electrically controlling the third electrode, wherein the third electrode modifies the electromagnetic field, and a processor for detecting a presence of the analyte in the sample, based at least in part on a property of the electromagnetic field.

Abstract: The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indication is associated with localized diffusion of a diffusant within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit.

Abstract: The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indication is associated with localized diffusion of a diffusant within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit.

Abstract: An impedance measurement system for detecting an analyte in a sample is disclosed. The system includes first, second, and third electrodes, wherein at least a portion of the third electrode is positioned between the first and second electrodes, means for generating an electromagnetic field between the first and second electrodes, means for electrically controlling the third electrode, wherein the third electrode modifies the electromagnetic field, and a processor for detecting a presence of the analyte in the sample, based at least in part on a property of the electromagnetic field.

Abstract: The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indication is associated with localized diffusion of a diffusant within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit.

Abstract: The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indication is associated with localized diffusion of a diffusant within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit.

Abstract: A blood oxygenation sensor is provided comprising: a first current-powered light source to produce light having a first wavelength; a second current-powered light source to produce light having a second wavelength; a light sensor to produce a current signal having a magnitude that is indicative of intensity of light incident upon it; a current level driver circuit that includes a current source configured to couple the current source to alternatively provide current to one of the first current-powered light source and the second light current-powered light source; a processor configured to predict times of occurrence of one or more first time intervals in which arterial volume at a tissue site is at one of a maximum and a minimum; wherein the processor is configured to control the current source, to provide a first pattern of higher power-dissipation current pulses to the first and second current-powered light sources during the first time intervals, and to provide a second pattern of lower power-dissipation

Abstract: According to various aspects, systems and methods for providing a soft-decoding physical unclonable function are provided. According to one embodiment, PUF circuitry includes circuit elements with impedance values that are used to generate a PUF value. For example, one or more resistors may be connected to a voltage source. The resistors may generate a resulting voltage signal that is measured and indicates a ratio of the impedance values of the resistors. Due to manufacturing variations, each impedance value may be unique, such that the impedance values may be used to provide a unique number sequence. Each ratio value may be converted into a single bit or multi-bit digital value through digitization, for example with a comparator and/or an analog to digital converter, and the series of digital values may represent or be used to generate a unique number sequence.

Abstract: The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indication is associated with localized diffusion of a diffusant within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit.

Abstract: According to various aspects, systems and methods for providing a soft-decoding physical unclonable function are provided. According to one embodiment, PUF circuitry includes circuit elements with impedance values that are used to generate a PUF value. For example, one or more resistors may be connected to a voltage source. The resistors may generate a resulting voltage signal that is measured and indicates a ratio of the impedance values of the resistors. Due to manufacturing variations, each impedance value may be unique, such that the impedance values may be used to provide a unique number sequence. Each ratio value may be converted into a single bit or multi-bit digital value through digitization, for example with a comparator and/or an analog to digital converter, and the series of digital values may represent or be used to generate a unique number sequence.

Abstract: The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indication is associated with localized diffusion of a diffusant within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit.

Abstract: The disclosed technology generally relates to integrated circuit devices with wear out monitoring. An integrated circuit device includes a core circuit and a wear-out monitor device. The wear-out monitor device configured to adjust an indication of wear out of the core circuit regardless of whether the core circuit is activated The integrated circuit further includes a sensing circuit coupled to the wear-out monitor device and configured to detect an electrical property of the wear-out monitor device that is indicative of a wear-out level of the core-circuit.

Abstract: An integrated ion-sensitive probe is provided. In an example, an ion-sensitive probe can include a semiconductor substrate and a first passive electrode attached to the semiconductor substrate. The first passive electrode can be configured to contact a solution and to provide a first electrical voltage as function of a concentration of an ion within the solution. In certain examples, a passive reference electrode can be co-located on the semiconductor substrate. In some examples, processing electronics can be integrated on the semiconductor substrate.

Abstract: The disclosed technology generally relates to integrated circuit devices with wear out monitoring. An integrated circuit device includes a core circuit and a wear-out monitor device. The wear-out monitor device configured to adjust an indication of wear out of the core circuit regardless of whether the core circuit is activated The integrated circuit further includes a sensing circuit coupled to the wear-out monitor device and configured to detect an electrical property of the wear-out monitor device that is indicative of a wear-out level of the core-circuit.

Abstract: The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indication is associated with localized diffusion of a diffusant within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit.

Abstract: A blood oxygenation sensor is provided comprising: a first current-powered light source to produce light having a first wavelength; a second current-powered light source to produce light having a second wavelength; a light sensor to produce a current signal having a magnitude that is indicative of intensity of light incident upon it; a current level driver circuit that includes a current source configured to couple the current source to alternatively provide current to one of the first current-powered light source and the second light current-powered light source; a processor configured to predict times of occurrence of one or more first time intervals in which arterial volume at a tissue site is at one of a maximum and a minimum; wherein the processor is configured to control the current source, to provide a first pattern of higher power-dissipation current pulses to the first and second current-powered light sources during the first time intervals, and to provide a second pattern of lower power-dissipation