Abstract: A method, in particular a computer-implemented method, is for training a data-based classification model for a configuration of a new ultrasonic sensor system including a plurality of ultrasonic transducers using training data sets. The classification model specifies, for one or more surrounding objects, at least one class for an object property. A training data set assigns an input data set from sensor data of an ultrasonic transducer and/or from sensor data features derived therefrom to a classification vector for the one or more surrounding objects. The method includes providing training data amounts for a plurality of configurations of ultrasonic sensor systems. The training data amounts each include one or more training data sets for a corresponding measurement situation. The method also includes selecting configurations of ultrasonic sensor systems that are closest to the configuration of the new ultrasonic sensor system, at least with respect to configuration features.

Abstract: A method for processing data associated with at least one ultrasonic sensor. The method includes: receiving at least one signal characterizing at least a portion of a transmitted ultrasonic signal, determining, based on the at least one signal, a two-dimensional data set having a plurality of cells characterizing potential positions of an object relative to an ultrasonic sensor associated with the at least one signal, processing the data set using a neural network.

Abstract: An inspection apparatus for optically inspecting an object, including a camera device is provided. The camera device has a focal plane that includes a focusing region and is designed for taking an image of the focusing region. The inspection apparatus further includes a handling device for gripping and/or picking up the object, and a control device for controlling the handling device. The control device is designed for controlling the handling device to position the object in the focusing region. The control device includes a model of the object; the control device being designed for controlling the handling device to position the object O in the focusing region on the basis of the model.

Abstract: A camera (1) for monitoring a monitored area (2), including a camera sensor (4) for generating at least one unmasked surveillance image (6) of the monitored area (2) and/or of a subarea of the monitored area (2), the camera sensor (4) being configured for providing raw data, the raw data encompassing the at least one unmasked surveillance image (6), and including an integrated evaluation unit (5), the evaluation unit (5) encompassing an input interface (8) for receiving the raw data and encompassing an output interface (17) for providing output image data.

Abstract: An inspection apparatus for optically inspecting an object, including a camera device is provided. The camera device has a focal plane that includes a focusing region and is designed for taking an image of the focusing region. The inspection apparatus further includes a handling device for gripping and/or picking up the object, and a control device for controlling the handling device. The control device is designed for controlling the handling device to position the object in the focusing region. The control device includes a model of the object; the control device being designed for controlling the handling device to position the object O in the focusing region on the basis of the model.

Abstract: A camera (1) for monitoring a monitored area (2), including a camera sensor (4) for generating at least one unmasked surveillance image (6) of the monitored area (2) and/or of a subarea of the monitored area (2), the camera sensor (4) being configured for providing raw data, the raw data encompassing the at least one unmasked surveillance image (6), and including an integrated evaluation unit (5), the evaluation unit (5) encompassing an input interface (8) for receiving the raw data and encompassing an output interface (17) for providing output image data.

Abstract: Dimensional parameters of structures on a substrate are measured by providing a substrate with a structured surface. The structured surface includes a number of juxtaposed structural elements. A radiation source is configured to emit a beam of radiation having a wavelength in the infrared range. The substrate is illuminated with the beam of radiation. A signal corresponding to a part of the beam of radiation being transmitted through the substrate is detected. Dimensional parameters of the structural elements are calculated based on the transmitted beam signal.