Patents by Inventor Thomas Gerard Ebben

Thomas Gerard Ebben has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6405344
    Abstract: A method for performing design trade-off. A plurality of critical to quality parameters corresponding to features of the design are obtained. A plurality of design specifications, each design specification corresponding to one of the critical to quality parameters, are also obtained. A plurality of designs are obtained where each design includes a plurality of design values and each design value corresponds to one of the critical to quality parameters. The design values are compared to the design specifications for each of the plurality of designs. A total score is generated for each design in response to the comparison.
    Type: Grant
    Filed: May 14, 1999
    Date of Patent: June 11, 2002
    Assignee: General Electric Company
    Inventors: Mohamed Ahmed Ali, Vivek Bhatt, Bijan Dorri, Thomas Gerard Ebben, Michael Solomon Idelchik, Brian Douglas Lounsberry, Arlie Russell Martin, Michael Charles Ostrowski, Douglas J. Snyder
  • Patent number: 6351680
    Abstract: An exemplary embodiment of the invention is directed to a method for performing quality function deployment for a system having a plurality of levels. The method includes obtaining a plurality of first level critical to quality parameters and obtaining a plurality of first level key control parameters. A first level quality matrix is generated identifying an effect at least one first level key control parameter has on at least one first level critical to quality parameter. The first level key control parameters are arranged into a first group and a second group. A second level quality matrix is generated for the first group. The second level quality matrix includes second level critical to quality parameters corresponding to the first group of first level key control parameters and a second level key control parameter. The second level quality matrix identifies an effect said second level key control parameter has on at least one second level critical to quality parameter.
    Type: Grant
    Filed: May 14, 1999
    Date of Patent: February 26, 2002
    Assignee: General Electric Company
    Inventors: Mohamed Ahmed Ali, Bharat Sampathkumaran Bagepalli, Bijan Dorri, Thomas Gerard Ebben, Aniruddha Dattatraya Gadre, Michael Solomon Idelchik, Khan Mohamed Khirullah Genghis Khan, Brian Douglas Lounsberry, Arlie Russell Martin, Thomas Frederick Papallo, Jr., Mark Alan Preston, Raymond Kelsey Seymour, Douglas J. Snyder
  • Patent number: 5793210
    Abstract: A magnetic-resonance-imaging (MRI) scanner subassembly. In one subassembly, a preferably annularly-cylindrical-shaped enclosure contains a first vacuum, and an MRI gradient coil assembly is located within the enclosure in the first vacuum. Preferably, an annularly-cylindrical housing is included which is coaxially aligned with the enclosure and contains a second vacuum which is higher than the first vacuum, and an MRI superconductive main coil is located within the housing in the second vacuum. In another subassembly, an MRI gradient coil assembly has a threshold excitation frequency, and an isolation mount assemblage supports the MRI gradient coil assembly.
    Type: Grant
    Filed: August 13, 1996
    Date of Patent: August 11, 1998
    Assignee: General Electric Company
    Inventors: Frederic Ghislain Pla, Robert Arvin Hedeen, Robert James Dobberstein, Thomas Gerard Ebben, Scott Thomas Mansell, Kemakolam Michael Obasih, Michael James Radziun, Peter Ping-Liang Sue, William Alan Edelstein