Patents by Inventor Thomas Giegold

Thomas Giegold has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for efficient analysis semiconductor failures
    Patent number: 6553521
    Abstract: The present invention includes a method for characterizing semiconductor failure. The method includes determining the dimensions of certain characteristics of a memory chip. The method defines a group of characteristics for a semiconductor of given dimensions. The method defines a ratio based on variables supplied by production test systems. By comparing a set of characteristics for a specific semiconductor to the ratio to determine the dominant type of failure on the semiconductor chip. The invention is an efficient method of obtaining information regarding the types of failures common on semiconductor chips.
    Type: Grant
    Filed: February 24, 2000
    Date of Patent: April 22, 2003
    Assignee: Infineon Technologies, Richmond L.P.
    Inventors: Dieter Rathei, Thomas Giegold, Joerg Wohlfahrt