Patents by Inventor Thomas H. Jeys

Thomas H. Jeys has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10605662
    Abstract: A device, and corresponding method, can include a pump light source configured to irradiate a target specimen. The device can also include a sensor configured to observe a probe speckle pattern based on light from a probe light source reflected from the target specimen. The device further may include a correlator configured to determine a material property of the target specimen by analyzing changes in images of the probe speckle pattern as a function of the irradiation with the pump light source. Advantages of the device and method can include much higher sensitivity than existing methods; the ability to use visible probe wavelengths for uncooled, low-cost visible detectors with high spatial resolution; and the ability to obtain target material properties without detecting infrared light.
    Type: Grant
    Filed: February 19, 2019
    Date of Patent: March 31, 2020
    Assignee: Massachusetts Institute of Technology
    Inventors: Thomas H. Jeys, William D. Herzog, Brian G. Saar, Alexander M. Stolyarov, Ryan Sullenberger, David Crompton, Shawn Michael Redmond
  • Publication number: 20190250038
    Abstract: A device, and corresponding method, can include a pump light source configured to irradiate a target specimen. The device can also include a sensor configured to observe a probe speckle pattern based on light from a probe light source reflected from the target specimen. The device further may include a correlator configured to determine a material property of the target specimen by analyzing changes in images of the probe speckle pattern as a function of the irradiation with the pump light source. Advantages of the device and method can include much higher sensitivity than existing methods; the ability to use visible probe wavelengths for uncooled, low-cost visible detectors with high spatial resolution; and the ability to obtain target material properties without detecting infrared light.
    Type: Application
    Filed: February 19, 2019
    Publication date: August 15, 2019
    Inventors: Thomas H. Jeys, William D. Herzog, Brian G. Saar, Alexander M. Stolyarov, Ryan Sullenberger, David Crompton, Shawn Michael Redmond
  • Patent number: 10228284
    Abstract: A device, and corresponding method, can include a pump light source configured to be modulated at a pump modulation and to irradiate a target specimen. The device can also include a probe light source arranged to generate a speckle pattern from the target specimen, as well as a sensor configured to detect changes in at least one of position and intensity of one or more speckle lobes of the speckle pattern having correlation with the pump modulation. The device and method can be used for non-contact monitoring and remote sensing of surfaces, gases, liquids, particles, and other target materials by analyzing speckle pattern changes as a function of pump light irradiation. Advantages can include much higher sensitivity than existing methods; the ability to use visible probe wavelengths for uncooled, low-cost visible detectors with high spatial resolution; and the ability to obtain target material properties without detecting infrared light.
    Type: Grant
    Filed: June 20, 2016
    Date of Patent: March 12, 2019
    Assignee: Massachusetts Institute of Technology
    Inventors: Thomas H. Jeys, William D. Herzog, Brian G. Saar, Alexander M. Stolyarov, Ryan Sullenberger, David Crompton, Shawn Michael Redmond
  • Publication number: 20170211977
    Abstract: A device, and corresponding method, can include a pump light source configured to be modulated at a pump modulation and to irradiate a target specimen. The device can also include a probe light source arranged to generate a speckle pattern from the target specimen, as well as a sensor configured to detect changes in at least one of position and intensity of one or more speckle lobes of the speckle pattern having correlation with the pump modulation. The device and method can be used for non-contact monitoring and remote sensing of surfaces, gases, liquids, particles, and other target materials by analyzing speckle pattern changes as a function of pump light irradiation. Advantages can include much higher sensitivity than existing methods; the ability to use visible probe wavelengths for uncooled, low-cost visible detectors with high spatial resolution; and the ability to obtain target material properties without detecting infrared light.
    Type: Application
    Filed: June 20, 2016
    Publication date: July 27, 2017
    Inventors: Thomas H. Jeys, William D. Herzog, Brian G. Saar, Alexander M. Stolyarov, Ryan Sullenberger, David Crompton, Shawn Michael Redmond
  • Patent number: 8867046
    Abstract: A method and an apparatus of measuring a position of a particle in a flow are disclosed. An embodiment of the method comprises temporally modulating and spatially pattering an illumination beam propagating along a first dimension, passing a particle across the modulated illumination beam, detecting a temporal profile of scattered light produced by the particle's passing through the modulated illumination beam, and determining the position of the particle based, in part, on the temporal profile of the detected scattered light.
    Type: Grant
    Filed: October 26, 2012
    Date of Patent: October 21, 2014
    Assignee: Massachusetts Institute of Technology
    Inventors: Thomas H. Jeys, Antonio Sanchez-Rubio, Ronald H. Hoffeld, Jonathan Z. Lin, Nicholas M. F. Judson, George S. Haldeman, Vincenzo Daneu
  • Patent number: 8319965
    Abstract: Aerosol and hydrosol particle detection systems without knowledge of a location and velocity of a particle passing through a volume of space, are less efficient than if knowledge of the particle location is known. An embodiment of a particle position detection system capable of determining an exact location of a particle in a fluid stream is discussed. The detection system may employ a patterned illuminating beam, such that once a particle passes through the patterned illuminating beam, a light scattering is produced. The light scattering defines a temporal profile that contains measurement information indicative of an exact particle location. However, knowledge of the exact particle location has several advantages. These advantages include correction of systematic particle measurement errors due to variability of the particle position within the sample volume, targeting of particles based on position, capture of particles based on position, reduced system energy consumption and reduced system complexity.
    Type: Grant
    Filed: August 6, 2010
    Date of Patent: November 27, 2012
    Assignee: Massachusetts Institute of Technology
    Inventors: Thomas H. Jeys, Antonio Sanchez-Rubio, Ronald H. Hoffeld, Jonathan Z. Lin, Nicholas M. F. Judson, George S. Haldeman, Vincenzo Daneu
  • Patent number: 7920261
    Abstract: A particle detection system that images and detects particles in a fluid flow stream through use of detector array(s) is described. The detection system may include light source arrays that may selectively illuminate a particle in a fluid stream. The detection system may also include a detector array employing smart binning to read the measured signals. The smart binning of the detector array may be achieved through knowledge of an exact particle location provided by a position sensitive detector. The detector array(s) may be low cost based on intelligence built into the system. This particle detection system may be particularly useful for detection and discrimination of different particle types since the read-out of the particle signals can be accomplished with low noise and can be flexible enough to optimize the read out measurements for each particle. The particle detection system may be used, for example, in early warning contamination detection systems and manufacturing processes.
    Type: Grant
    Filed: February 11, 2008
    Date of Patent: April 5, 2011
    Assignee: Massachusetts Institute of Technology
    Inventors: Thomas H. Jeys, Antonio Sanchez-Rubio, Richard J. Molnar, Robert K. Reich, Jinendra K. Ranka, David L. Spears, Richard M. Osgood, III
  • Publication number: 20110051137
    Abstract: Aerosol and hydrosol particle detection systems without knowledge of a location and velocity of a particle passing through a volume of space, are less efficient than if knowledge of the particle location is known. An embodiment of a particle position detection system capable of determining an exact location of a particle in a fluid stream is discussed. The detection system may employ a patterned illuminating beam, such that once a particle passes through the patterned illuminating beam, a light scattering is produced. The light scattering defines a temporal profile that contains measurement information indicative of an exact particle location. However, knowledge of the exact particle location has several advantages. These advantages include correction of systematic particle measurement errors due to variability of the particle position within the sample volume, targeting of particles based on position, capture of particles based on position, reduced system energy consumption and reduced system complexity.
    Type: Application
    Filed: August 6, 2010
    Publication date: March 3, 2011
    Inventors: Thomas H. Jeys, Antonio Sanchez-Rubio, Ronald H. Hoffeld, Jonathan Z. Lin, Nicholas M.F. Judson, George S. Haldeman, Vincenzo Daneu
  • Patent number: 7821636
    Abstract: Aerosol and hydrosol particle detection systems without knowledge of a location and velocity of a particle passing through a volume of space, are less efficient than if knowledge of the particle location is known. An embodiment of a particle position detection system capable of determining an exact location of a particle in a fluid stream is discussed. The detection system may employ a patterned illuminating beam, such that once a particle passes through the patterned illuminating beam, a light scattering is produced. The light scattering defines a temporal profile that contains measurement information indicative of an exact particle location. However, knowledge of the exact particle location has several advantages. These advantages include correction of systematic particle measurement errors due to variability of the particle position within the sample volume, targeting of particles based on position, capture of particles based on position, reduced system energy consumption and reduced system complexity.
    Type: Grant
    Filed: May 18, 2007
    Date of Patent: October 26, 2010
    Assignee: Massachusetts Institute of Technology
    Inventors: Thomas H. Jeys, Antonio Sanchez-Rubio, Ronald H. Hoffeld, Jonathan Z. Lin, Nicholas M. F. Judson, George S. Haldeman, Vincenzo Daneu
  • Patent number: 7772579
    Abstract: Particle detection systems without knowledge of a location and velocity of a particle passing through a volume of space, are less efficient than if knowledge of the particle location is known. An embodiment of a particle position detection system capable of determining an exact location of a particle in a fluid stream is discussed. The detection system may employ a patterned illuminating beam, such that once a particle passes through the various portions of the patterned illuminating beam, a light scattering is produced. The light scattering defines a temporal profile that contains measurement information indicative of an exact particle location. However, knowledge of the exact particle location has several advantages. These advantages include correction of systematic particle measurement errors due to variability of the particle position within the sample volume, targeting of particles based on position, capture of particles based on position, reduced system energy consumption and reduced system complexity.
    Type: Grant
    Filed: May 18, 2007
    Date of Patent: August 10, 2010
    Assignee: Massachusetts Institute of Technology
    Inventors: William D. Herzog, Antonio Sanchez-Rubio, Gregory G. Cappiello, Ronald H. Hoffeld, Shane M. Tysk, Vincenzo Daneu, Thomas H. Jeys
  • Publication number: 20100053614
    Abstract: A particle detection system that images and detects particles in a fluid flow stream through use of detector array(s) is described. The detection system may include light source arrays that may selectively illuminate a particle in a fluid stream. The detection system may also include a detector array employing smart binning to read the measured signals. The smart binning of the detector array may be achieved through knowledge of an exact particle location provided by a position sensitive detector. The detector array(s) may be low cost based on intelligence built into the system. This particle detection system may be particularly useful for detection and discrimination of different particle types since the read-out of the particle signals can be accomplished with low noise and can be flexible enough to optimize the read out measurements for each particle. The particle detection system may be used, for example, in early warning contamination detection systems and manufacturing processes.
    Type: Application
    Filed: February 11, 2008
    Publication date: March 4, 2010
    Inventors: Thomas H. Jeys, Antonio Sanchez-Rubio, Richard J. Molnar, Robert K. Reich, Jinendra K. Ranka, David L. Spears, Richard M. Osgood, III
  • Patent number: 6194731
    Abstract: Biological aerosols are detected in real time by passing air, which may contain the aerosols, through a duct having a pair of photodetectors adjacent the duct for detecting fluorescence of the aerosols produced by ultraviolet laser beam illumination of the airflow. A pair of opposed mirrors, make the effective sample air volume large, by producing multiple ultra-violet beam illumination paths through adjacent portions of the duct for each single pulsed beam, in turn increasing the magnitude of the detected fluorescence signal.
    Type: Grant
    Filed: November 12, 1998
    Date of Patent: February 27, 2001
    Assignee: The United States of America as represented by the Secretary of the Air Force
    Inventors: Thomas H. Jeys, Antonio Sanchez
  • Patent number: 5751472
    Abstract: A parametric generator for efficiently converting short duration pump pulses of a first frequency to a signal beam of a desired frequency is described. The parametric generator includes a second order nonlinear parametric medium, a retro-reflector, and an optical re-imaging system. Each optical sub-path through the parametric medium is substantially distinct and non-overlapping. At least two optical sub-paths have a direction within a phase matching acceptance angle of the parametric material which corresponds to the desired wavelength. The parametric generator can be configured to be compact because it utilizes multiple transmissions through the parametric medium and it employs only a single pump beam input.
    Type: Grant
    Filed: February 8, 1996
    Date of Patent: May 12, 1998
    Assignee: Massachusetts Institute of Technology
    Inventors: Thomas H. Jeys, Tso Yee Fan