Patents by Inventor Thomas Heiser

Thomas Heiser has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Fluorescent compounds of the boron thienyldipyrromethene type, and their use
    Patent number: 10566551
    Abstract: The present invention concerns fluorescent boron thienyldipyrromethene type compounds, their preparation process, as well as their use as an electron donor in the field of organic electronics, in particular for the production of a photoactive layer in photovoltaic cells of the bulk heterojunction type or for the production of field effect transistors.
    Type: Grant
    Filed: July 18, 2013
    Date of Patent: February 18, 2020
    Assignees: CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE, UNIVERSITE DE STRASBOURG
    Inventors: Thomas Bura, Nicolas Leclerc, Sandra Rihn, Raymond Ziessel, Antoine Mirloup, Thomas Heiser, Patrick Leveque, Sadiara Fall
  • FLUORESCENT COMPOUNDS OF THE BORON THIENYLDIPYRROMETHENE TYPE, AND THEIR USE
    Publication number: 20150171328
    Abstract: The present invention concerns fluorescent boron thienyldipyrromethene type compounds, their preparation process, as well as their use as an electron donor in the field of organic electronics, in particular for the production of a photoactive layer in photovoltaic cells of the bulk heterojunction type or for the production of field effect transistors.
    Type: Application
    Filed: July 18, 2013
    Publication date: June 18, 2015
    Applicant: Centre National de la Recherche Scientifique
    Inventors: Thomas Bura, Nicolas Leclerc, Sandra Rihn, Raymond Ziessel, Antoine Mirloup, Thomas Heiser, Patrick Levque, Sadiara Fall
  • Device for quantitative detection of copper in silicon by transient ionic drift and method using same
    Patent number: 6504377
    Abstract: An analyzing device for producing measurements using transient ionic drift technique and an analysis method using same. The device for the quantitative detection of copper in silicon by transient ionic drift essentially comprises a heater and a rapid cooler for the sample to be analyzed, an electrode for measuring the electrical capacity of the sample and a unit generating an energizing signal and processing the measuring electric signal. The heater (2) for the sample (4) to be analyzed consists in at least a halogen lamp, the rapid cooler (3) for the sample (4) to be analyzed is a water cooler, and the electrode for measuring the sample (4) to be analyzed is a mercury electrode.
    Type: Grant
    Filed: February 27, 2001
    Date of Patent: January 7, 2003
    Assignee: Centre National de la Recherche Scientifique
    Inventor: Thomas Heiser