Abstract: A method for checking the integrity of functional units that are reloadable during runtime of an electronic component in a dynamically reconfigurable region of the electronic component, wherein the electronic component, which is formed as a programmable logic circuit, has, in addition to a static region, a dynamically reconfigurable region and the reloadable functional units have predefined interfaces, where an associated twin functional unit is configured in a specified subregion of the dynamically reconfigurable region for each reloadable functional unit, a reloadable functional unit is loaded into a specified subregion of the dynamically reconfigurable region, supplied with identical input data to the associated twin functional unit, and executed in parallel with the twin functional unit, and where output data of the reloaded functional unit and associated twin functional unit are compared and the reloaded functional unit is enabled if a match between the two output data is found.

Abstract: A method for realizing an artificial neural network via an electronic integrated circuit (FPGA), wherein artificial neurons grouped into different interlinked layers for the artificial neural network, where a functional description is created for each neuron of the artificial neural network, taking into account a specifiable starting weighting, a synthesis is performed for each neuron based on the associated functional description with the associated specified starting weighting, a network list is determined as the synthesis result, in which at least a base element and a starting configuration belonging to the base element are stored for each neuron, a base element is formed as a lookup table (LUT) unit and an associated dynamic configuration cell, in which a current configuration for the LUT unit or the base element is stored, and where the network list is implemented as a starting configuration of the artificial neural network in the electronic integrated circuit.

Abstract: A system and method for the predictive maintenance of electronic components that includes sensors at at least one position via which present values of system parameters, such as temperature and voltage, and a signal propagation time at the at least one position are determined, where values of the system parameters and the signal propagation time presently determined by the sensors are retrieved by a central monitoring unit, an individual valid limit value is determined for the signal propagation time at each of the at least one position via the central monitoring unit based on the presently determined values of the system parameters, and the presently determined signal propagation time at each of the at least one position is compared with the associated valid limit value, and a notification is sent to a superordinate level, if the signal propagation time exceeds the limit value to trigger replacement of the electronic component.

Abstract: A method for storing key data in an electronic component formed as an integrated programmable circuit, such as a field programmable gate array, which includes a base structure consisting of base elements, wherein configuration data is loaded, for each current program, onto the base elements and stored in a volatile matter, the key data is divided into key sub-data blocks, and a base element position is selected for each key sub-data block, where upon generating the configuration data for each current program or circuit function of the electronic component, selected base element positions of the key sub-data blocks are considered, while loading the configuration data, key sub-data blocks are stored in the base elements defined by selected base element positions, and after successfully programming the electronic component, the key sub-data blocks of base elements specified by selected base element positions are ascertained and assembled to form the key data.

Abstract: A method for realizing an artificial neural network via an electronic integrated circuit (FPGA), wherein artificial neurons grouped into different interlinked layers for the artificial neural network, where a functional description is created for each neuron of the artificial neural network, taking into account a specifiable starting weighting, a synthesis is performed for each neuron based on the associated functional description with the associated specified starting weighting, a network list is determined as the synthesis result, in which at least a base element and a starting configuration belonging to the base element are stored for each neuron, a base element is formed as a lookup table (LUT) unit and an associated dynamic configuration cell, in which a current configuration for the LUT unit or the base element is stored, and where the network list is implemented as a starting configuration of the artificial neural network in the electronic integrated circuit.

Abstract: A system and method for the predictive maintenance of electronic components that includes sensors at at least one position via which present values of system parameters, such as temperature and voltage, and a signal propagation time at the at least one position are determined, where values of the system parameters and the signal propagation time presently determined by the sensors are retrieved by a central monitoring unit, an individual valid limit value is determined for the signal propagation time at each of the at least one position via the central monitoring unit based on the presently determined values of the system parameters, and the presently determined signal propagation time at each of the at least one position is compared with the associated valid limit value, and a notification is sent to a superordinate level, if the signal propagation time exceeds the limit value to trigger replacement of the electronic component.

Abstract: A method for optimal arrangement of a random generator on an electronic component, which includes a programmable integrated circuit and a basic structure consisting of a plurality of basic blocks, wherein during an initialization phase, starting from a starting configuration for a respective current arrangement of the random generator, the following are performed with a predefined number of repetitions, i.e., a predefined test sequence is performed for the current arrangement of the random generator, a test result is forwarded to a reconfiguration module and the current arrangement on the electronic component is reconfigured via the reconfiguration module, where upon each repetition, the test result of the current arrangement of the random generator is compared with the test result of a previous arrangement, and the current arrangement is saved in the reconfiguration module, if the test result for the current arrangement has a better test result than the previous arrangement.

Abstract: A method for determining system reliability of a logic circuit, wherein a functional component model for design/simulation of a circuit model of the logic circuit is created, where functional components model are expanded by adding an associated power model, a temperature model, and a reliability, where the logic circuit is constructed with expanded model components and, based on simulation of the logic circuit aided by the constructed circuit model, a functional, a power-dependent, and a temperature-dependent behavior and a temperature-dependent failure rate are derived for each component in a component specific manner for a specified application case, and where in addition to the functional behavior, a power and temperature behavior and a total failure rate can be determined simply and dynamically, based on the derived data and dependent on temperature and simulation time for the logic circuit for the specified application case.

Abstract: A method for optimal arrangement of a random generator on an electronic component, which includes a programmable integrated circuit and a basic structure consisting of a plurality of basic blocks, wherein during an initialization phase, starting from a starting configuration for a respective current arrangement of the random generator, the following are performed with a predefined number of repetitions, i.e., a predefined test sequence is performed for the current arrangement of the random generator, a test result is forwarded to a reconfiguration module and the current arrangement on the electronic component is reconfigured via the reconfiguration module, where upon each repetition, the test result of the current arrangement of the random generator is compared with the test result of a previous arrangement, and the current arrangement is saved in the reconfiguration module, if the test result for the current arrangement has a better test result than the previous arrangement.

Abstract: A method for determining system reliability of a logic circuit, wherein a functional component model for design/simulation of a circuit model of the logic circuit is created, where functional components model are expanded by adding an associated power model, a temperature model, and a reliability, where the logic circuit is constructed with expanded model components and, based on simulation of the logic circuit aided by the constructed circuit model, a functional, a power-dependent, and a temperature-dependent behavior and a temperature-dependent failure rate are derived for each component in a component specific manner for a specified application case, and where in addition to the functional behavior, a power and temperature behavior and a total failure rate can be determined simply and dynamically, based on the derived data and dependent on temperature and simulation time for the logic circuit for the specified application case.