Patents by Inventor Thomas Hutter
Thomas Hutter has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 8371746Abstract: A thermal analysis device comprising a replaceable sensor that can be contacted via a contact element of an electrical contacting means, a heating element and a cooling element. The contact element(s) is thermally connected with the heating element and can be heated essentially independently of the operating state of the cooling element even when no sensor is mounted to the device.Type: GrantFiled: November 15, 2010Date of Patent: February 12, 2013Assignee: Mettler-Toledo AGInventors: Corinne Schärer, Ulrich Esser, Thomas Hütter
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Publication number: 20120062602Abstract: An approach is provided for customizing map presentations based on mode of transport. A map customizing platform determines a mode of transport with respect to a mapping service. The map customizing platform then selects one or more characteristics for rendering a map display of the mapping service based, at least in part, on the mode of transport and causes, at least in part, rendering of the map display based, at least in part, on the characteristics.Type: ApplicationFiled: August 30, 2011Publication date: March 15, 2012Applicant: Nokia CorporationInventors: Chirag Jayantilal Vadhavana, Thomas Hütter, Mark Schlusnus
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Publication number: 20110122913Abstract: A thermal analysis device comprising a replaceable sensor that can be contacted via a contact element of an electrical contacting means, a heating element and a cooling element. The contact element(s) is thermally connected with the heating element and can be heated essentially independently of the operating state of the cooling element even when no sensor is mounted to the device.Type: ApplicationFiled: November 15, 2010Publication date: May 26, 2011Applicant: METTLER-TOLEDO AGInventors: Corinne Schärer, Ulrich Esser, Thomas Hütter
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Patent number: 7826993Abstract: Some of the embodiments of the present disclosure provide a method for analyzing a substance, where the method includes subjecting the substance to a dynamic excitation to produce an observable response, and determining a characteristic quantity of the substance based on a correlation between the excitation and the response. The correlation between the excitation and the response is expressed by a parametric model for which a specific model structure with a finite number of unspecified parameters is preset. The determining a characteristic quantity of the substance includes calculating the parameters of the model from values of the excitation and the response in a time domain, determining from the calculated parameters a transfer function in a frequency range, and calculating the characteristic quantity directly from the transfer function. Other embodiments are also described and claimed.Type: GrantFiled: January 4, 2005Date of Patent: November 2, 2010Assignee: Mettler-Toledo AGInventors: Thomas Hutter, Christoph Heitz, Jurgen Schawe
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Patent number: 7473029Abstract: In a thermoanalytical sensor with a substrate and a thermocouple arrangement that is formed at a measurement position on the substrate, an increase in sensitivity can be achieved by way of a special geometry of the thermocouple arrangement and/or the selection of the material for the substrate. In addition, a manufacturing method is proposed for the inventive sensor.Type: GrantFiled: June 21, 2007Date of Patent: January 6, 2009Assignee: Mettler-Toledo AGInventors: Thomas Hütter, Bernd Danhamer, Urs Niedermann
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Patent number: 7470058Abstract: Substance analysis based upon observed reponse to excitation described herein. When a substance is subjected to an excitation and a response is observed, a relational evaluation is made based on the concept that the parameters of a mathematical model may be determined, which emulate the relationship between the excitation and the response, and that characteristic substance properties are subsequently determined/calculated from the time series of estimated values of the mathematical model.Type: GrantFiled: July 2, 2004Date of Patent: December 30, 2008Assignee: Mettler-Toledo AGInventors: Thomas Hütter, Christoph Heitz, Jürgen Schawe
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Publication number: 20080208546Abstract: The invention relates to a method for analyzing substances during which a substance is subjected to an excitation and a corresponding response is observed. The evaluation ensues in such a manner that a parametric model for the correlation between the excitation and the response is predetermined. The model parameters are determined from values of the excitation and from observed values of the response in the time domain. The transfer function is calculated therefrom in the frequency range, and characteristic quantities of the substance are directly calculated from the transfer function.Type: ApplicationFiled: January 4, 2005Publication date: August 28, 2008Applicant: METTLER-TOLEDO AGInventors: Thomas Hutter, Christoph Heitz, Jurgen Schawe
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Publication number: 20070253462Abstract: In a thermoanalytical sensor with a substrate and a thermocouple arrangement that is formed at a measurement position on the substrate, an increase in sensitivity can be achieved by way of a special geometry of the thermocouple arrangement and/or the selection of the material for the substrate. In addition, a manufacturing method is proposed for the inventive sensor.Type: ApplicationFiled: June 21, 2007Publication date: November 1, 2007Applicant: Mettler-Toledo AGInventors: Thomas Hutter, Bernd Danhamer, Urs Niedermann
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Patent number: 7258482Abstract: In a thermoanalytical sensor with a substrate and a thermocouple arrangement that is formed at a measurement position on the substrate, an increase in sensitivity can be achieved by way of a special geometry of the thermocouple arrangement and/or the selection of the material for the substrate. In addition, a manufacturing method is proposed for the inventive sensor.Type: GrantFiled: October 27, 2004Date of Patent: August 21, 2007Assignee: Mettler-Toledo AGInventors: Thomas Hütter, Bernd Danhamer, Urs Niedermann
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Publication number: 20060256836Abstract: Substance analysis based upon observed reponse to excitation described herein. When a substance is subjected to an excitation and a response is observed, a relational evaluation is made based on the concept that the parameters of a mathematical model may be determined, which emulate the relationship between the excitation and the response, and that characteristic substance properties are subsequently determined/calculated from the time series of estimated values of the mathematical model.Type: ApplicationFiled: July 2, 2004Publication date: November 16, 2006Inventors: Thomas Hütter, Christoph Heitz, Jürgen Schawe
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Patent number: 6935776Abstract: A sample holder for differential thermal analysis has a substrate with a planar surface provided with a sample position for a sample material and a reference position for reference material. The substrate allows heat flow between a heat source thermally coupled to the sample holder and the sample and reference positions. A first thermoelement arrangement in the area of the sample and reference positions is provided for supplying a thermoelectric signal corresponding to a differential between the temperatures at the sample and reference positions. First connectors are formed on the substrate for tapping the thermoelectric signal corresponding to the temperature differential. A second thermoelement arrangement provides a thermoelectric signal corresponding to an absolute temperature of the sample and reference positions. Second connectors are provided on the substrate for tapping the thermoelectric signal corresponding to the absolute temperature.Type: GrantFiled: June 9, 2003Date of Patent: August 30, 2005Assignee: Mettler-Toledo GmbHInventor: Thomas Hütter
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Publication number: 20050169344Abstract: In a thermoanalytical sensor with a substrate and a thermocouple arrangement that is formed at a measurement position on the substrate, an increase in sensitivity can be achieved by way of a special geometry of the thermocouple arrangement and/or the selection of the material for the substrate. In addition, a manufacturing method is proposed for the inventive sensor.Type: ApplicationFiled: October 27, 2004Publication date: August 4, 2005Inventors: Thomas Hutter, Bernd Danhamer, Urs Niedermann
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Patent number: 6913383Abstract: A method and apparatus for thermally investigating a material by driving the material through a temperature profile composed of isothermal and non-isothermal segments is disclosed, which enable determination of a kinetic component in a measured heat flow signal caused by the exposure of the material to the temperature profile.Type: GrantFiled: June 9, 2003Date of Patent: July 5, 2005Assignee: Mettler-Toledo GmbHInventors: Urs Jörimann, Thomas Hütter
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Patent number: 6880385Abstract: In a dynamic mechanical analysis, a test specimen is coupled to an excitation device by a holder device. An excitation force made up of a static pre-tensioning force component and a time-variable force component is applied to the test specimen, and a deformation of the test specimen is measured by one or more displacement sensors. In a test phase an excitation force is applied to the test specimen, while at least one decision parameter is determined. The decision parameter is indicative of a degree of slack in the coupling of the test specimen. Based on the comparison between the decision parameter and at least one reference value it is determined whether or not the test specimen is coupled to the excitation device in a completely slack-free state, so that any measured physical values will not be subjected to errors caused by an insufficient amount of the pre-tensioning force.Type: GrantFiled: April 2, 2003Date of Patent: April 19, 2005Assignee: Mettler-Toledo GmbHInventors: Ulrich Esser, Thomas Hütter
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Publication number: 20040001524Abstract: A method and apparatus for thermally investigating a material by driving the material through a temperature profile composed of isothermal and non-isothermal segments is disclosed, which enable determination of a kinetic component in a measured heat flow signal caused by the exposure of the material to the temperature profile.Type: ApplicationFiled: June 9, 2003Publication date: January 1, 2004Inventors: Urs Jorimann, Thomas Hutter
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Publication number: 20030231693Abstract: A sample holder for differential thermal analysis has a substrate with a planar surface provided with a sample position for a sample material and a reference position for reference material. The substrate allows heat flow between a heat source thermally coupled to the sample holder and the sample and reference positions. A first thermoelement arrangement in the area of the sample and reference positions is provided for supplying a thermoelectric signal corresponding to a differential between the temperatures at the sample and reference positions. First connectors are formed on the substrate for tapping the thermoelectric signal corresponding to the temperature differential. A second thermoelement arrangement provides a thermoelectric signal corresponding to an absolute temperature of the sample and reference positions. Second connectors are provided on the substrate for tapping the thermoelectric signal corresponding to the absolute temperature.Type: ApplicationFiled: June 9, 2003Publication date: December 18, 2003Applicant: Mettler-Toledo GmbHInventor: Thomas Hutter
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Publication number: 20030188585Abstract: In a dynamic mechanical analysis, a test specimen (2) is coupled to an excitation device (4) by means of a holder device (3). The excitation device (4) applies an excitation force comprised of a static pre-tensioning force component and a time-variable force component to the test specimen, and a deformation of the test specimen (2) is measured by means of one or more displacement sensors (5).Type: ApplicationFiled: April 2, 2003Publication date: October 9, 2003Applicant: Mettler-Toledo GmbHInventors: Ulrich Esser, Thomas Hutter
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Patent number: 6583391Abstract: A method and apparatus for thermally analyzing a sample of a material by detecting a heat flow between the sample (7) and a heat source (1) and evaluating a functional relation between the measured heat flow (HF) and an associated temperature is based on controlling the heating power of the heat source (1) so as to cause the heat source to follow a temperature program (17) as a function of time superposed with a modulation (23) of the heating power.Type: GrantFiled: January 31, 2001Date of Patent: June 24, 2003Assignee: Mettler-Toledo GmbHInventors: Urs Jörimann, Thomas Hütter
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Patent number: 6318890Abstract: A heat flow calorimeter comprises a single sample holder (5) in thermal contact with a heat source (1). A temperature difference over mutually spaced locations (11, 12) along a heat flow path between sample (23) and heat source (1) is measured. The measured signal (24, 25) is combined with a compensation signal from a signal source (34) to derive a compensated temperature difference signal representative of the net heat flow to sample (23), (FIG. 1).Type: GrantFiled: September 24, 1999Date of Patent: November 20, 2001Assignee: Mettler-Toledo GmbHInventors: Thomas Hütter, Urs Jörimann
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Publication number: 20010019049Abstract: A method and apparatus for thermally analyzing a sample of a material by detecting a heat flow between the sample (7) and a heat source (1) and evaluating a functional relation between the measured heat flow (HF) and an associated temperature is based on controlling the heating power of the heat source (1) so as to cause the heat source to follow a temperature program (17) as a function of time superposed with a modulation (23) of the heating power.Type: ApplicationFiled: January 31, 2001Publication date: September 6, 2001Applicant: Mettler-Toledo GmbHInventors: Urs Jorimann, Thomas Hutter