Patents by Inventor Thomas Hutter

Thomas Hutter has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8371746
    Abstract: A thermal analysis device comprising a replaceable sensor that can be contacted via a contact element of an electrical contacting means, a heating element and a cooling element. The contact element(s) is thermally connected with the heating element and can be heated essentially independently of the operating state of the cooling element even when no sensor is mounted to the device.
    Type: Grant
    Filed: November 15, 2010
    Date of Patent: February 12, 2013
    Assignee: Mettler-Toledo AG
    Inventors: Corinne Schärer, Ulrich Esser, Thomas Hütter
  • Publication number: 20120062602
    Abstract: An approach is provided for customizing map presentations based on mode of transport. A map customizing platform determines a mode of transport with respect to a mapping service. The map customizing platform then selects one or more characteristics for rendering a map display of the mapping service based, at least in part, on the mode of transport and causes, at least in part, rendering of the map display based, at least in part, on the characteristics.
    Type: Application
    Filed: August 30, 2011
    Publication date: March 15, 2012
    Applicant: Nokia Corporation
    Inventors: Chirag Jayantilal Vadhavana, Thomas Hütter, Mark Schlusnus
  • Publication number: 20110122913
    Abstract: A thermal analysis device comprising a replaceable sensor that can be contacted via a contact element of an electrical contacting means, a heating element and a cooling element. The contact element(s) is thermally connected with the heating element and can be heated essentially independently of the operating state of the cooling element even when no sensor is mounted to the device.
    Type: Application
    Filed: November 15, 2010
    Publication date: May 26, 2011
    Applicant: METTLER-TOLEDO AG
    Inventors: Corinne Schärer, Ulrich Esser, Thomas Hütter
  • Patent number: 7826993
    Abstract: Some of the embodiments of the present disclosure provide a method for analyzing a substance, where the method includes subjecting the substance to a dynamic excitation to produce an observable response, and determining a characteristic quantity of the substance based on a correlation between the excitation and the response. The correlation between the excitation and the response is expressed by a parametric model for which a specific model structure with a finite number of unspecified parameters is preset. The determining a characteristic quantity of the substance includes calculating the parameters of the model from values of the excitation and the response in a time domain, determining from the calculated parameters a transfer function in a frequency range, and calculating the characteristic quantity directly from the transfer function. Other embodiments are also described and claimed.
    Type: Grant
    Filed: January 4, 2005
    Date of Patent: November 2, 2010
    Assignee: Mettler-Toledo AG
    Inventors: Thomas Hutter, Christoph Heitz, Jurgen Schawe
  • Patent number: 7473029
    Abstract: In a thermoanalytical sensor with a substrate and a thermocouple arrangement that is formed at a measurement position on the substrate, an increase in sensitivity can be achieved by way of a special geometry of the thermocouple arrangement and/or the selection of the material for the substrate. In addition, a manufacturing method is proposed for the inventive sensor.
    Type: Grant
    Filed: June 21, 2007
    Date of Patent: January 6, 2009
    Assignee: Mettler-Toledo AG
    Inventors: Thomas Hütter, Bernd Danhamer, Urs Niedermann
  • Patent number: 7470058
    Abstract: Substance analysis based upon observed reponse to excitation described herein. When a substance is subjected to an excitation and a response is observed, a relational evaluation is made based on the concept that the parameters of a mathematical model may be determined, which emulate the relationship between the excitation and the response, and that characteristic substance properties are subsequently determined/calculated from the time series of estimated values of the mathematical model.
    Type: Grant
    Filed: July 2, 2004
    Date of Patent: December 30, 2008
    Assignee: Mettler-Toledo AG
    Inventors: Thomas Hütter, Christoph Heitz, Jürgen Schawe
  • Publication number: 20080208546
    Abstract: The invention relates to a method for analyzing substances during which a substance is subjected to an excitation and a corresponding response is observed. The evaluation ensues in such a manner that a parametric model for the correlation between the excitation and the response is predetermined. The model parameters are determined from values of the excitation and from observed values of the response in the time domain. The transfer function is calculated therefrom in the frequency range, and characteristic quantities of the substance are directly calculated from the transfer function.
    Type: Application
    Filed: January 4, 2005
    Publication date: August 28, 2008
    Applicant: METTLER-TOLEDO AG
    Inventors: Thomas Hutter, Christoph Heitz, Jurgen Schawe
  • Publication number: 20070253462
    Abstract: In a thermoanalytical sensor with a substrate and a thermocouple arrangement that is formed at a measurement position on the substrate, an increase in sensitivity can be achieved by way of a special geometry of the thermocouple arrangement and/or the selection of the material for the substrate. In addition, a manufacturing method is proposed for the inventive sensor.
    Type: Application
    Filed: June 21, 2007
    Publication date: November 1, 2007
    Applicant: Mettler-Toledo AG
    Inventors: Thomas Hutter, Bernd Danhamer, Urs Niedermann
  • Patent number: 7258482
    Abstract: In a thermoanalytical sensor with a substrate and a thermocouple arrangement that is formed at a measurement position on the substrate, an increase in sensitivity can be achieved by way of a special geometry of the thermocouple arrangement and/or the selection of the material for the substrate. In addition, a manufacturing method is proposed for the inventive sensor.
    Type: Grant
    Filed: October 27, 2004
    Date of Patent: August 21, 2007
    Assignee: Mettler-Toledo AG
    Inventors: Thomas Hütter, Bernd Danhamer, Urs Niedermann
  • Publication number: 20060256836
    Abstract: Substance analysis based upon observed reponse to excitation described herein. When a substance is subjected to an excitation and a response is observed, a relational evaluation is made based on the concept that the parameters of a mathematical model may be determined, which emulate the relationship between the excitation and the response, and that characteristic substance properties are subsequently determined/calculated from the time series of estimated values of the mathematical model.
    Type: Application
    Filed: July 2, 2004
    Publication date: November 16, 2006
    Inventors: Thomas Hütter, Christoph Heitz, Jürgen Schawe
  • Patent number: 6935776
    Abstract: A sample holder for differential thermal analysis has a substrate with a planar surface provided with a sample position for a sample material and a reference position for reference material. The substrate allows heat flow between a heat source thermally coupled to the sample holder and the sample and reference positions. A first thermoelement arrangement in the area of the sample and reference positions is provided for supplying a thermoelectric signal corresponding to a differential between the temperatures at the sample and reference positions. First connectors are formed on the substrate for tapping the thermoelectric signal corresponding to the temperature differential. A second thermoelement arrangement provides a thermoelectric signal corresponding to an absolute temperature of the sample and reference positions. Second connectors are provided on the substrate for tapping the thermoelectric signal corresponding to the absolute temperature.
    Type: Grant
    Filed: June 9, 2003
    Date of Patent: August 30, 2005
    Assignee: Mettler-Toledo GmbH
    Inventor: Thomas Hütter
  • Publication number: 20050169344
    Abstract: In a thermoanalytical sensor with a substrate and a thermocouple arrangement that is formed at a measurement position on the substrate, an increase in sensitivity can be achieved by way of a special geometry of the thermocouple arrangement and/or the selection of the material for the substrate. In addition, a manufacturing method is proposed for the inventive sensor.
    Type: Application
    Filed: October 27, 2004
    Publication date: August 4, 2005
    Inventors: Thomas Hutter, Bernd Danhamer, Urs Niedermann
  • Patent number: 6913383
    Abstract: A method and apparatus for thermally investigating a material by driving the material through a temperature profile composed of isothermal and non-isothermal segments is disclosed, which enable determination of a kinetic component in a measured heat flow signal caused by the exposure of the material to the temperature profile.
    Type: Grant
    Filed: June 9, 2003
    Date of Patent: July 5, 2005
    Assignee: Mettler-Toledo GmbH
    Inventors: Urs Jörimann, Thomas Hütter
  • Patent number: 6880385
    Abstract: In a dynamic mechanical analysis, a test specimen is coupled to an excitation device by a holder device. An excitation force made up of a static pre-tensioning force component and a time-variable force component is applied to the test specimen, and a deformation of the test specimen is measured by one or more displacement sensors. In a test phase an excitation force is applied to the test specimen, while at least one decision parameter is determined. The decision parameter is indicative of a degree of slack in the coupling of the test specimen. Based on the comparison between the decision parameter and at least one reference value it is determined whether or not the test specimen is coupled to the excitation device in a completely slack-free state, so that any measured physical values will not be subjected to errors caused by an insufficient amount of the pre-tensioning force.
    Type: Grant
    Filed: April 2, 2003
    Date of Patent: April 19, 2005
    Assignee: Mettler-Toledo GmbH
    Inventors: Ulrich Esser, Thomas Hütter
  • Publication number: 20040001524
    Abstract: A method and apparatus for thermally investigating a material by driving the material through a temperature profile composed of isothermal and non-isothermal segments is disclosed, which enable determination of a kinetic component in a measured heat flow signal caused by the exposure of the material to the temperature profile.
    Type: Application
    Filed: June 9, 2003
    Publication date: January 1, 2004
    Inventors: Urs Jorimann, Thomas Hutter
  • Publication number: 20030231693
    Abstract: A sample holder for differential thermal analysis has a substrate with a planar surface provided with a sample position for a sample material and a reference position for reference material. The substrate allows heat flow between a heat source thermally coupled to the sample holder and the sample and reference positions. A first thermoelement arrangement in the area of the sample and reference positions is provided for supplying a thermoelectric signal corresponding to a differential between the temperatures at the sample and reference positions. First connectors are formed on the substrate for tapping the thermoelectric signal corresponding to the temperature differential. A second thermoelement arrangement provides a thermoelectric signal corresponding to an absolute temperature of the sample and reference positions. Second connectors are provided on the substrate for tapping the thermoelectric signal corresponding to the absolute temperature.
    Type: Application
    Filed: June 9, 2003
    Publication date: December 18, 2003
    Applicant: Mettler-Toledo GmbH
    Inventor: Thomas Hutter
  • Publication number: 20030188585
    Abstract: In a dynamic mechanical analysis, a test specimen (2) is coupled to an excitation device (4) by means of a holder device (3). The excitation device (4) applies an excitation force comprised of a static pre-tensioning force component and a time-variable force component to the test specimen, and a deformation of the test specimen (2) is measured by means of one or more displacement sensors (5).
    Type: Application
    Filed: April 2, 2003
    Publication date: October 9, 2003
    Applicant: Mettler-Toledo GmbH
    Inventors: Ulrich Esser, Thomas Hutter
  • Patent number: 6583391
    Abstract: A method and apparatus for thermally analyzing a sample of a material by detecting a heat flow between the sample (7) and a heat source (1) and evaluating a functional relation between the measured heat flow (HF) and an associated temperature is based on controlling the heating power of the heat source (1) so as to cause the heat source to follow a temperature program (17) as a function of time superposed with a modulation (23) of the heating power.
    Type: Grant
    Filed: January 31, 2001
    Date of Patent: June 24, 2003
    Assignee: Mettler-Toledo GmbH
    Inventors: Urs Jörimann, Thomas Hütter
  • Patent number: 6318890
    Abstract: A heat flow calorimeter comprises a single sample holder (5) in thermal contact with a heat source (1). A temperature difference over mutually spaced locations (11, 12) along a heat flow path between sample (23) and heat source (1) is measured. The measured signal (24, 25) is combined with a compensation signal from a signal source (34) to derive a compensated temperature difference signal representative of the net heat flow to sample (23), (FIG. 1).
    Type: Grant
    Filed: September 24, 1999
    Date of Patent: November 20, 2001
    Assignee: Mettler-Toledo GmbH
    Inventors: Thomas Hütter, Urs Jörimann
  • Publication number: 20010019049
    Abstract: A method and apparatus for thermally analyzing a sample of a material by detecting a heat flow between the sample (7) and a heat source (1) and evaluating a functional relation between the measured heat flow (HF) and an associated temperature is based on controlling the heating power of the heat source (1) so as to cause the heat source to follow a temperature program (17) as a function of time superposed with a modulation (23) of the heating power.
    Type: Application
    Filed: January 31, 2001
    Publication date: September 6, 2001
    Applicant: Mettler-Toledo GmbH
    Inventors: Urs Jorimann, Thomas Hutter