Abstract: In accordance with the preferred embodiments of the invention, provided is a hermetic ceramic/glass enclosure for encapsulating semiconductor components which reduces the internal cavity moisture and contamination levels, has a stronger package seal and a lower sealing temperature than hermetic ceramic/glass enclosures currently used. Included in the first embodiment is a lower substrate, with a conductive leadframe attached thereto via devitrified glass and a layer of vitreous glass on the leadframe for attaching a cap which also includes a layer of vitreous glass. To seal the enclosure, the cap is heated to a temperature T1 above the melting point of the vitreous glass, and the lower substrate, is maintained at a temperature high enough to bond to the vitreous layer on the cap on contact, but low enough to eliminate damage to the semiconductor component and additional Gold-Silicon eutectic formation between the semiconductor component and the enclosure lower substrate.