Patents by Inventor Thomas Jünemann

Thomas Jünemann has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9395214
    Abstract: An optical position-measuring device includes a measuring standard having a first grating in a form of a periodic incremental graduation and an absolute mark. A scanning unit is displaceable relative to the measuring standard in a measuring direction. The scanning unit has at least one second grating disposed at a scanning distance from the first grating. A first detector array is configured to obtain a first scanning signal for purposes of position determination in which the gratings are illuminated with light of a first wavelength. A second detector array is configured to obtain a second scanning signal for purposes of position determination in which the absolute mark is illuminated with light of a second wavelength. The first wavelength is shorter than the second wavelength.
    Type: Grant
    Filed: November 14, 2013
    Date of Patent: July 19, 2016
    Assignee: DR. JOHANNES HEIDENHAIN GMBH
    Inventors: Mario Himmel, Jarno Waetzig, Thomas Juenemann
  • Publication number: 20140146326
    Abstract: An optical position-measuring device includes a measuring standard having a first grating in a form of a periodic incremental graduation and an absolute mark. A scanning unit is displaceable relative to the measuring standard in a measuring direction. The scanning unit has at least one second grating disposed at a scanning distance from the first grating. A first detector array is configured to obtain a first scanning signal for purposes of position determination in which the gratings are illuminated with light of a first wavelength. A second detector array is configured to obtain a second scanning signal for purposes of position determination in which the absolute mark is illuminated with light of a second wavelength. The first wavelength is shorter than the second wavelength.
    Type: Application
    Filed: November 14, 2013
    Publication date: May 29, 2014
    Applicant: DR. JOHANNES HEIDENHAIN GmbH
    Inventors: Mario Himmel, Jarno Waetzig, Thomas Juenemann
  • Patent number: 6563853
    Abstract: An excimer or molecular fluorine laser system includes a discharge chamber containing a gas mixture, multiple electrodes connected to a power supply circuit for energizing the gas mixture, a resonator for generating a laser beam, a processor, and means for monitoring an amplified spontaneous emission (ASE) signal of the laser, such as preferably an ASE detector. The processor receives a signal from the preferred ASE detector indicative of the ASE signal of the laser. Based on the signal from the ASE detector, the processor determines whether to initiate a responsive action for adjusting a parameter of the laser system.
    Type: Grant
    Filed: April 24, 2001
    Date of Patent: May 13, 2003
    Assignee: Lambda Physik AG
    Inventors: Peter Heist, Matthias Kramer, Juergen Kleinschmidt, Sergei Govorkov, Marcus Serwazi, Thomas Jünemann
  • Patent number: 6549555
    Abstract: An excimer or molecular fluorine laser system includes a discharge chamber containing a gas mixture, multiple electrodes connected to a power supply circuit for energizing the gas mixture, a resonator for generating a laser beam, a processor, and means for monitoring an amplified spontaneous emission (ASE) signal of the laser, such as preferably an ASE detector. The processor receives a signal from the preferred ASE detector indicative of the ASE signal of the laser. Based on the signal from the ASE detector, the processor determines whether to initiate a responsive action for adjusting a parameter of the laser system.
    Type: Grant
    Filed: May 24, 2001
    Date of Patent: April 15, 2003
    Assignee: Lambda Physik AG
    Inventors: Marcus Serwazi, Thomas Jünemann