Patents by Inventor Thomas J. Pelc

Thomas J. Pelc has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8116044
    Abstract: Some embodiments of the present invention provide a system that facilitates the operation of a supercapacitor. During operation, the system measures an electrical parameter of the supercapacitor using a set of conductor rings surrounding a capacitor seal of the supercapacitor. Next, the system determines the presence of a leak in the supercapacitor based on the electrical parameter. Finally, the system manages the operation of the supercapacitor based on the presence of the leak.
    Type: Grant
    Filed: December 14, 2009
    Date of Patent: February 14, 2012
    Assignee: Oracle America, Inc.
    Inventors: Thomas J. Pelc, Jorge E. Martinez-Vargas, Jr.
  • Publication number: 20110141630
    Abstract: Some embodiments of the present invention provide a system that facilitates the operation of a supercapacitor. During operation, the system measures an electrical parameter of the supercapacitor using a set of conductor rings surrounding a capacitor seal of the supercapacitor. Next, the system determines the presence of a leak in the supercapacitor based on the electrical parameter. Finally, the system manages the operation of the supercapacitor based on the presence of the leak.
    Type: Application
    Filed: December 14, 2009
    Publication date: June 16, 2011
    Applicant: SUN MICROSYSTEMS, INC.
    Inventors: Thomas J. Pelc, Jorge E. Martinez-Vargas, JR.
  • Publication number: 20100155106
    Abstract: Implementations of the present invention may involve methods for providing an optical differentiation on a printed circuit board to assist in identifying a missing or improperly mounted component. The optical differentiation may be such that, when a component of the board is missing or improperly attached to the board, a distinct optical difference is created on the board in the visible or non-visible spectrum. Several implementations may create a visible color difference, a non-visible mark, a recognizable shape, texture change, cross hatching or other form of physical modification beneath the component or on the printed circuit board. Other implementations may include the optical differentiation within a silk-screen of the board or on an internal layer of the board.
    Type: Application
    Filed: December 22, 2008
    Publication date: June 24, 2010
    Applicant: Sun Microsystems, Inc.
    Inventors: James David Britton, Thomas J. Pelc, Jorge Eduardo Martinez-Vargas, JR.
  • Patent number: 6195613
    Abstract: A system and method for measuring the equivalent series resistance (ESR) of one or more capacitors using an impedance analyzer, whereby the capacitors are joined to the impedance analyzer with a conductive adhesive. The conductive adhesive may advantageously provide for an electrically and mechanically stable connection between the capacitor and the remainder of the electrical circuit used to measure the ESR of the capacitor. The conductive adhesive may include heat activated or cold solder, or conductive putty. The system comprises a measuring unit for sweeping a frequency range to find the minimum impedance for the capacitor and a connector assembly for holding the capacitor in an electrically and mechanically stable connection using the conductive adhesive. The connector assembly includes a mating portion adapted for electrically connecting the connector assembly to an I/O port of the measuring unit and a terminal portion that accommodates a connection to the capacitor using the conductive adhesive.
    Type: Grant
    Filed: September 8, 1998
    Date of Patent: February 27, 2001
    Assignee: Sun Microsystems, Inc.
    Inventors: Tanmoy Roy, Larry D. Smith, Raymond E. Anderson, Thomas J. Pelc, Douglas W. Forehand