Abstract: The illumination system as a part of an optical inspection system, the total inspection system itself, and the method of illuminating and inspecting a workpiece. The illumination system is computer controlled as to a level of intensity and adjustable as to angle of incidence. The illumination system includes illumination control electronics, a quad quartz halogen lamp array light source, a fiber optic line converter and an illumination collection system, having a collimator lens array and a focusing/field coverage lens. As a result of the present invention, determinations of false defects on the PCB are minimized. Human contact with the PCB is also minimized and the rate of inspections performable is increased.