Patents by Inventor Thomas James Batzinger

Thomas James Batzinger has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6707297
    Abstract: A method for in-situ eddy current inspection of at least one coated component includes applying a drive pulse at a measurement position on an outer surface of the coated component, while the coated component is installed in an operational environment of the coated component. The coated component includes a base metal and a coating disposed on the base metal. The method further includes receiving a response signal from the coated component, comparing the response signal with a reference signal to obtain a compared signal, analyzing the compared signal for crack detection, and determining whether a crack near the measurement position has penetrated into the base metal, if the presence of the crack in the coating is indicated.
    Type: Grant
    Filed: April 15, 2002
    Date of Patent: March 16, 2004
    Assignee: General Electric Company
    Inventors: Shridhar Champaknath Nath, Thomas James Batzinger, Curtis Wayne Rose, Yuri Alexeyevich Plotnikov, Kenneth Gordon Herd
  • Patent number: 6680454
    Abstract: A perforated electrode has strategically distributed flushing holes through which a flushing medium is discharged. The electrode can be used for either electrochemical machining (ECM) or electrodischarge machining (EDM). The flushing medium is either electrolyte in ECM or a dielectric fluid in EDM. It is discharged from the tool electrode directly against the workpiece surface or surfaces which are undergoing material removal. This removes heat and sludge or debris.
    Type: Grant
    Filed: December 27, 2002
    Date of Patent: January 20, 2004
    Assignee: General Electric Company
    Inventors: Thomas James Batzinger, Bin Wei
  • Patent number: 6670808
    Abstract: A self referencing eddy current probe for determining conductive coating thickness includes a housing having a reference sample area, for accommodating a reference sample, and a testing edge, for positioning on a component during a coating thickness measurement. The eddy current probe further includes a reference eddy current coil situated in the housing adjacent to the reference sample area and a test eddy current coil, which is located at the testing edge. A self referencing eddy current measurement system, for measuring a thickness of a conductive coating on a component, includes the self referencing eddy current probe. The system further includes a signal generator for energizing the test and reference coils and a comparison module for comparing a test signal received from the test coil and a reference signal received from the reference coil and outputting a compared signal.
    Type: Grant
    Filed: August 27, 2001
    Date of Patent: December 30, 2003
    Assignee: General Electric Company
    Inventors: Shridhar Champaknath Nath, Curtis Wayne Rose, Carl Stephen Lester, Thomas James Batzinger
  • Patent number: 6670577
    Abstract: A method for laser shock peening a surface is disclosed. A laser beam pulse from a laser apparatus is produced. The laser pulse has a cross-section taken perpendicular to the laser beam, a fluence profile across the cross-section. The pulse against an area on said surface. The fluence profile is controlled such that process induced defects are reduced.
    Type: Grant
    Filed: September 28, 2001
    Date of Patent: December 30, 2003
    Assignee: General Electric Company
    Inventors: Phillip Randall Staver, William Taylor Lotshaw, Michael Francis X Gigliotti, Jr., Josef Robert Unternahrer, Robert Snee Gilmore, Thomas James Batzinger
  • Publication number: 20030193331
    Abstract: A method for in-situ eddy current inspection of at least one coated component includes applying a drive pulse at a measurement position on an outer surface of the coated component, while the coated component is installed in an operational environment of the coated component. The coated component includes a base metal and a coating disposed on the base metal. The method further includes receiving a response signal from the coated component, comparing the response signal with a reference signal to obtain a compared signal, analyzing the compared signal for crack detection, and determining whether a crack near the measurement position has penetrated into the base metal, if the presence of the crack in the coating is indicated.
    Type: Application
    Filed: April 15, 2002
    Publication date: October 16, 2003
    Applicant: General Electric Company
    Inventors: Shridhar Champaknath Nath, Thomas James Batzinger, Curtis Wayne Rose, Yuri Alexeyevich Plotnikov, Kenneth Gordon Herd
  • Patent number: 6591680
    Abstract: A system and method that allows for the immersion ultrasonic inspection of test samples that cannot be immersed in a fluid (e.g., water) bath. A test sample is encapsulated in a sealed evacuated bag made of nonporous flexible material. A portion of the nonporous flexible material is in contact with the surface area of the test sample where the ultrasound wave or beam will impinge. Then the sealed bag with test sample inside are immersed in an acoustic coupling medium, as is an ultrasonic transducer. The transducer is directed to transmit an interrogating ultrasound wave or beam through the vacuum bag into the component being inspected at the area of interest. The sealed bag prevents contact between the inspected component and the acoustic coupling medium.
    Type: Grant
    Filed: June 15, 2001
    Date of Patent: July 15, 2003
    Assignee: General Electric Company
    Inventors: Thomas James Batzinger, Francis Alexander Reed
  • Publication number: 20030080736
    Abstract: An embedded eddy current inspection apparatus includes a substrate having an opening, and a test eddy current coil (“test coil”) affixed to the substrate near the opening. An internally inspected multilayer component structure includes an upper layer, a lower layer, and an eddy current probe embedded between the upper and lower layers. The eddy current probe includes the test coil facing a subject layer selected from the upper and lower layers. A method of inspecting a multilayer component structure includes simultaneously energizing the test coil and a reference eddy current coil (“reference coil”) embedded between the upper and lower layers and facing the subject layer. The reference coil is located in a reference region of the multilayer structure. A test signal from the test coil is compared with a reference signal from the reference coil, to determine whether a flaw is present in the subject layer near the test coil.
    Type: Application
    Filed: October 31, 2001
    Publication date: May 1, 2003
    Inventors: Thomas James Batzinger, Shridhar Champaknath Nath, Kenneth Gordon Herd
  • Patent number: 6545469
    Abstract: An embedded eddy current inspection apparatus includes a substrate having an opening, and a test eddy current coil (“test coil”) affixed to the substrate near the opening. An internally inspected multilayer component structure includes an upper layer, a lower layer, and an eddy current probe embedded between the upper and lower layers. The eddy current probe includes the test coil facing a subject layer selected from the upper and lower layers. A method of inspecting a multilayer component structure includes simultaneously energizing the test coil and a reference eddy current coil (“reference coil”) embedded between the upper and lower layers and facing the subject layer. The reference coil is located in a reference region of the multilayer structure. A test signal from the test coil is compared with a reference signal from the reference coil, to determine whether a flaw is present in the subject layer near the test coil.
    Type: Grant
    Filed: October 31, 2001
    Date of Patent: April 8, 2003
    Assignee: General Electric Company
    Inventors: Thomas James Batzinger, Shridhar Champaknath Nath, Kenneth Gordon Herd
  • Patent number: 6545467
    Abstract: Eddy current inspection of a contoured surface of a workpiece is performed by forming a backing piece of flexible, resiliently yieldable material with a contoured exterior surface conforming in shape to the workpiece contoured surface. The backing piece is preferably cast in place so as to conform to the workpiece contoured surface. A flexible eddy current array probe is attached to the contoured exterior surface of the backing piece such that the probe faces the contoured surface of the workpiece to be inspected when the backing piece is disposed adjacent to the workpiece. The backing piece is then expanded volumetrically by inserting at least one shim into a slot in the backing piece to provide sufficient contact pressure between the probe and the workpiece contoured surface to enable the inspection of the workpiece contoured surface to be performed.
    Type: Grant
    Filed: October 27, 2000
    Date of Patent: April 8, 2003
    Assignee: General Electric Company
    Inventors: Thomas James Batzinger, James Paul Fulton, Curtis Wayne Rose, Lee Cranford Perocchi
  • Publication number: 20030062350
    Abstract: A method for laser shock peening a surface is disclosed. A laser beam pulse from a laser apparatus is produced. The laser pulse has a cross-section taken perpendicular to the laser beam, a fluence profile across the cross-section. The pulse against an area on said surface. The fluence profile is controlled such that process induced defects are reduced.
    Type: Application
    Filed: September 28, 2001
    Publication date: April 3, 2003
    Applicant: General Electric Company
    Inventors: Phillip Randall Staver, William Taylor Lotshaw, Michael Francis X Gigliotti, Josef Robert Unternahrer, Robert Snee Gilmore, Thomas James Batzinger
  • Publication number: 20030038628
    Abstract: A self referencing eddy current probe for determining conductive coating thickness includes a housing having a reference sample area, for accommodating a reference sample, and a testing edge, for positioning on a component during a coating thickness measurement. The eddy current probe further includes a reference eddy current coil situated in the housing adjacent to the reference sample area and a test eddy current coil, which is located at the testing edge. A self referencing eddy current measurement system, for measuring a thickness of a conductive coating on a component, includes the self referencing eddy current probe. The system further includes a signal generator for energizing the test and reference coils and a comparison module for comparing a test signal received from the test coil and a reference signal received from the reference coil and outputting a compared signal.
    Type: Application
    Filed: August 27, 2001
    Publication date: February 27, 2003
    Inventors: Shridhar Champaknath Nath, Curtis Wayne Rose, Carl Stephen Lester, Thomas James Batzinger
  • Publication number: 20020190724
    Abstract: A pulsed eddy current two-dimensional sensor array probe for electrically conducting component inspection includes a drive coil disposed adjacent to a structure under inspection, a pulse generator connected to the drive coil and operable to energize in a pulsed manner the drive coil to transmit transient electromagnetic flux into the structure under inspection, and an array of sensors arranged in a two-dimensional array and substantially surrounded by the drive coil and operable to sense and generate output signals from the transient electromagnetic flux in the structure under inspection.
    Type: Application
    Filed: June 12, 2001
    Publication date: December 19, 2002
    Inventors: Yuri Alexeyevich Plotnikov, Shridhar Champaknath Nath, Curtis Wayne Rose, Thomas James Batzinger, Kenneth Gordon Herd
  • Publication number: 20020189359
    Abstract: A system and method that allows for the immersion ultrasonic inspection of test samples that cannot be immersed in a fluid (e.g., water) bath. A test sample is encapsulated in a sealed evacuated bag made of nonporous flexible material. A portion of the nonporous flexible material is in contact with the surface area of the test sample where the ultrasound wave or beam will impinge. Then the sealed bag with test sample inside are immersed in an acoustic coupling medium, as is an ultrasonic transducer. The transducer is directed to transmit an interrogating ultrasound wave or beam through the vacuum bag into the component being inspected at the area of interest. The sealed bag prevents contact between the inspected component and the acoustic coupling medium.
    Type: Application
    Filed: June 15, 2001
    Publication date: December 19, 2002
    Inventors: Thomas James Batzinger, Francis Alexander Reed
  • Patent number: 6466643
    Abstract: A system and method for radiographic inspection of aircraft fuselages includes a radiation source preferably located inside of the fuselage and a radiation detector preferably located outside of the fuselage. A source positioning system is provided for moving the radiation source longitudinally with respect to the fuselage, and a detector positioning system is provided for positioning the radiation detector in longitudinal alignment with the radiation source. The detector positioning system also moves the radiation detector circumferentially with respect to the fuselage. In operation, the radiation detector is moved over the fuselage in a circumferential direction while the radiation source illuminates an adjacent region of the fuselage with radiation.
    Type: Grant
    Filed: August 22, 2000
    Date of Patent: October 15, 2002
    Assignee: General Electric Company
    Inventors: Clifford Bueno, Kenneth Gordon Herd, Gregory Alan Mohr, Thomas James Batzinger, Dennis Michael Walsh
  • Patent number: 6414483
    Abstract: A method of inspecting a preselected area of an electrically conductive component to determine whether flaws are present. The method includes the steps of permanently mounting an eddy current element on the component over the preselected area and energizing the element to generate alternating magnetic fields proximate the component. An electrical signal generated by a secondary magnetic field formed proximate the component is detected using the element and the detected electrical signal is compared to a reference signal to determine whether the detected signal is different than the reference signal. Differences indicate the presence of a flaw in the component. Inspection apparatus for performing this method is also disclosed.
    Type: Grant
    Filed: July 27, 2000
    Date of Patent: July 2, 2002
    Assignee: General Electric Company
    Inventors: Shridhar Champaknath Nath, Thomas James Batzinger, Curtis Wayne Rose, Paul Peter Stryjek
  • Patent number: 6182494
    Abstract: A transducer position adjustment method, performed to compensate for initial ultrasonic beam alignment error, includes the steps of providing a manipulator of an ultrasonic immersion testing system having a pointing direction and supporting a transducer generating an ultrasonic beam, providing a calibration body defining a target thereon, immersing the transducer of the manipulator and the calibration body in a coupling fluid in an immersion tank of the system, setting the manipulator initially at a first position such that the pointing direction of the manipulator is aligned with the calibration body target at known coordinates, and adjusting the manipulator subsequently to a second position such that the ultrasonic beam of the transducer is brought into alignment with the calibration body target at the known coordinates for initiating an inspection of a test object after replacing the calibration body with the test object.
    Type: Grant
    Filed: September 27, 1999
    Date of Patent: February 6, 2001
    Assignee: General Electric Company
    Inventors: Francis Alexander Reed, Thomas James Batzinger