Patents by Inventor Thomas K. Myers

Thomas K. Myers has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Segmented charge limiting test algorithm for electrical components
    Patent number: 5192913
    Abstract: A method of electrically testing an electrical component containing a plurality of networks with at least one node. The method uses segmented, charge limiting testing to charge the nodes and detect shorted or disconnected nodes while preventing accumulated charges in the networks from making uncharged nodes appear charged. The method is well suited for voltage contrast electron beam testing of unpopulated high density multichip modules and interconnect substrates.
    Type: Grant
    Filed: March 16, 1992
    Date of Patent: March 9, 1993
    Assignee: Microelectronics and Computer Technology Corporation
    Inventors: Rama R. Goruganthu, Thomas K. Myers, Andrew W. Ross
  • Method of testing electrical components for defects
    Patent number: 5122753
    Abstract: A method of testing electrical circuits on a substrate for detecting shorts and opens. A plurality of electrical networks in which each network has one or more nodes are tested by selectively electrically charging certain nodes and selectively testing other nodes for detecting shorts and opens between the nodes. The method of testing allows various levels of testing to be performed for detecting more and greater different kinds of possible defects.
    Type: Grant
    Filed: December 20, 1990
    Date of Patent: June 16, 1992
    Assignee: Microelectronics and Computer Technology Corporation
    Inventors: Thomas K. Myers, John D. Ferguson