Abstract: A method performs test measurements on electrical components. The components are firstly subjected to an aging process before the actual test measurements are performed on them. In order to be able to handle this in a particularly simple manner, the components are firstly disposed on a carrier with a switching matrix. In this case, the switching matrix is configured in such a way that all the components are switched on for the purpose of carrying out the aging process and exclusively the components to be measured—individually or in subgroups—are switched on for the purpose of carrying out the test measurements.