Patents by Inventor Thomas Kornack

Thomas Kornack has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Pulsed vector magnetometer using a fast rotating field
    Patent number: 12517198
    Abstract: Atomic magnetometers are usually used as scalar sensors to measure the magnitude of the magnetic field. The magnetic field is converted to a frequency that can be measured with high fractional precision. There are no comparable methods for measuring vector magnetic field components. Common sensors, such as flux-gate and SQUID magnetometers, suffer from calibration and orthogonality uncertainty. Disclosed is a method of using an atomic magnetometer to measure the magnitude and two polar angles of the magnetic field vector. The two polar angles are dimensionless quantities and can be measured with high fractional precision. Also disclosed is a particular measurement procedure that is immune to systematic effects in such measurements.
    Type: Grant
    Filed: October 3, 2022
    Date of Patent: January 6, 2026
    Assignee: Trustees of Princeton University
    Inventors: Tao Wang, Wonjae Lee, Michael Romalis, Mark Limes, Thomas Kornack, Elizabeth Foley
  • PULSED VECTOR MAGNETOMETER USING A FAST ROTATING FIELD
    Publication number: 20250314721
    Abstract: Atomic magnetometers are usually used as scalar sensors to measure the magnitude of the magnetic field. The magnetic field is converted to a frequency that can be measured with high fractional precision. There are no comparable methods for measuring vector magnetic field components. Common sensors, such as flux-gate and SQUID magnetometers, suffer from calibration and orthogonality uncertainty. Disclosed is a method of using an atomic magnetometer to measure the magnitude and two polar angles of the magnetic field vector. The two polar angles are dimensionless quantities and can be measured with high fractional precision. Also disclosed is a particular measurement procedure that is immune to systematic effects in such measurements.
    Type: Application
    Filed: October 3, 2022
    Publication date: October 9, 2025
    Applicants: The Trustees of Princeton University, Twinleaf LLC
    Inventors: Tao Wang, Wonjae Lee, Michael Romalis, Mark Limes, Thomas Kornack, Elizabeth Foley