Patents by Inventor Thomas L. Harvill

Thomas L. Harvill has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Automated positioning method for contouring measurements using a mobile range measurement system
    Patent number: 6922252
    Abstract: The present invention relates generally to high-temperature vessels lined with refractory material. More specifically, the present invention relates to a method for implementation of tracking and contouring systems, automated collection of data, and processing of the measured data in either a stationary or a mobile configuration to accurately determine profiles of localized refractory thickness and/or bath height of molten material in the high-temperature vessel using the tracking system to fix the position of the contouring system with respect to the vessel.
    Type: Grant
    Filed: September 19, 2002
    Date of Patent: July 26, 2005
    Assignee: Process Matrix, LLC
    Inventors: Thomas L. Harvill, Michel P. Bonin, Soren T. Jensen
  • Automated positioning method for countouring measurements using a mobile range measurement system
    Publication number: 20040056217
    Abstract: The present invention relates generally to high-temperature vessels lined with refractory material. More specifically, the present invention relates a method for implementation of a tracking and contouring systems, automated collection of data, and processing of the measured data in either a stationary or a mobile configuration to accurately determine profiles of localized refractory thickness and/or bath height of molten material in said high-temperature vessel using the tracking system to fix the position of the contouring system with respect to said vessel.
    Type: Application
    Filed: September 19, 2002
    Publication date: March 25, 2004
    Inventors: Thomas L. Harvill, Michel P. Bonin, Soren T. Jensen
  • Method for measuring particle size in the presence of multiple scattering
    Patent number: 5619324
    Abstract: A method applicable to an ensemble laser diffraction (ELD) instrument computes a particle size distribution in real time after correction for the multiple scattering phenomena. In one embodiment, a numerical method, similar to the Newton's method, is provided to iteratively calculate the single scattering mode. The present method is hence suitable for use, with high accuracy, in real time controlling and monitoring applications.
    Type: Grant
    Filed: December 29, 1995
    Date of Patent: April 8, 1997
    Assignee: Insitec Measurement Systems
    Inventors: Thomas L. Harvill, Donald J. Holve