Patents by Inventor Thomas M. Parrill

Thomas M. Parrill has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20080083609
    Abstract: Methods and apparatus for operating plasmas are described. The vessel receives an oxygen containing plasma to clean and/or condition the vessel. Some embodiments of the invention feature methods and apparatus for improving ignition properties of the plasmas.
    Type: Application
    Filed: October 4, 2007
    Publication date: April 10, 2008
    Applicant: MKS Instruments, Inc.
    Inventors: Shou-Qian Shao, Jack Jerome Schuss, John Thomas Summerson, William M. Holber, Thomas M. Parrill
  • Patent number: 6287983
    Abstract: A nitride wet etch in which liquid TEOS is flowed directly into the hot phosphoric acid bath before wafer etching begins. This preloads the bath chemistry with silicate ions, and thus helps assure very high selectivity to silicon oxides.
    Type: Grant
    Filed: December 18, 1998
    Date of Patent: September 11, 2001
    Assignee: Texas Instruments Incorporated
    Inventors: Der'E Jan, Thomas M. Parrill, Brian K. Kirkpatrick
  • Publication number: 20010001728
    Abstract: A nitride wet etch in which liquid TEOS is flowed directly into the hot phosphoric acid bath before wafer etching begins. This preloads the bath chemistry with silicate ions, and thus helps assure very high selectivity to silicon oxides.
    Type: Application
    Filed: December 18, 1998
    Publication date: May 24, 2001
    Inventors: DER?apos;E JAN, THOMAS M. PARRILL, BRIAN K. KIRKPATRICK
  • Patent number: 6228741
    Abstract: A method is given for removing excess oxide from active areas after shallow trench isolation, without the use of chemical-mechanical polishing. A nitride mask protects active areas during the etch of isolation trenches. The trenches are filled with oxide, using high density plasma deposition, which simultaneously etches, providing a sloping contour around the isolation trenches. A further layer of nitride is used to provide a cap over the trench which seals to the underlying layer of nitride. The cap layer of nitride receives a patterned etch to remove the cap only over the active areas. This allows a selective etch to remove the excess oxide, which can be followed by a selective etch to remove the nitride layers.
    Type: Grant
    Filed: January 11, 1999
    Date of Patent: May 8, 2001
    Assignee: Texas Instruments Incorporated
    Inventors: Shawn T. Walsh, John E. Campbell, James B. Friedmann, Thomas M. Parrill, Der'E Jan, Joshua J. Robbins, Byron T. Ahlburn, Sue Ellen Crank