Abstract: A method for testing the error ratio BER of a device under test against a specified allowable error ratio comprises the steps: measuring ns samples of the output of the device, thereby detecting ne erroneous samples of these ns samples, defining BER(ne)=ne/ns as the preliminary error ratio and deciding to pass the device, if the preliminary error ratio BER(ne) is smaller than an early pass limit EPL(ne). The early pass limit is constructed by using an empirically or analytically derived distribution for a specific number of devices each having the specified allowable error ratio by separating a specific portion DD of the best devices from the distribution for a specific number of erroneous samples ne and proceeding further with the remaining part of the distribution for an incremented number of erroneous samples.

Abstract: A method for performing a statistical test on a device or radio channel, which has N outcomes in the form of N different events, whereby N is higher than two, with the following steps: measuring ns samples of the output of the device or radio channel under test, whereby occurs a specific number (na,nb,ne) of each event, defining a specific limit (L) for the test in a space spanned out by specific numbers of each event, erecting a N?1 dimensional likelihood distribution on several points of the limit (L), and constructing a threshold for fail of the radio channel or device and a threshold for pass of the radio channel or device by summing or integrating the N?1 dimensional likelihood distribution along unbroken paths parallel to the limit L until a predefined confidence level is reached.

Abstract: A system, a mobile communication unit and a method for analyzing a receiver performance of a mobile communication unit are provided. An information is generated in a system simulator, and is transmitted in a transmission signal from a testing device to a mobile communication unit under test via a unidirectional channel. The transmission signal is received and analyzed by the receiver the performance of which is to be tested. By analyzing the received transmission signal the information included in the transmission signal is being obtained. The information obtained from the analysis of the transmission signal is transmitted back from the mobile communication unit in a backtransmission signal via an independent backtransmission channel. The backtransmission signal received by the testing device is analyzed by the testing device for obtaining the information included in the backtransmission signal and the result is compared to the information originally generated.

Abstract: A method for testing the (Bit) Error Ratio BER of a device against a maximal allowable (Bit) Error Ratio BERlimit with an early pass and/or early fail criterion, whereby the early pass and/or early fail criterion is allowed to be wrong only by a small probability F for the entire test. Ns bits of the output of the device are measured, thereby ne erroneous bits of these ns bits are detected. PDhigh and/or PDlow are obtained, whereby PDhigh is the worst possible likelihood distribution and PDlow is the best possible likelihood distribution containing the measured ne erroneous bits with a single step wrong decision probability D, which is smaller than the probability F for the entire test. The average numbers of erroneous bits NEhigh and NElow for PDhigh and PDlow are obtained. NEhigh and NElow are compared with NElimit=BERlimit ns. If NElimit is higher than NEhigh or NElimit is lower than NElow the test is stopped. Sequential sampling with two one-tailed parametric hypothesis test for the poisson distribution.

Abstract: A method for testing the error ratio BER of a device under test against a specified allowable error ratio comprises the steps: measuring ns samples of the output of the device, thereby detecting ne erroneous samples of these ns samples, defining BER(ne)=ne/ns as the preliminary error ratio and deciding to pass the device, if the preliminary error ratio BER(ne) is smaller than an early pass limit EPL(ne). The early pass limit is constructed by using an empirically or analytically derived distribution for a specific number of devices each having the specified allowable error ratio by separating a specific portion DD of the best devices from the distribution for a specific number of erroneous samples ne and proceeding further with the remaining part of the distribution for an incremented number of erroneous samples.

Abstract: A method for testing the (Bit) Error Ratio BER of a device against a maximal allowable (Bit) Error Ratio BERlimit with a early pass and/or early fail criterion, whereby the early pass and/or early fail criterion is allowed to be wrong only by a small probability D. ns bits of the output of the device are measured, thereby ne erroneous bits of the ns bits are detected. PDhigh and/or PDlow are obtained, whereby PDhigh is the worst possible likelihood distribution and PDlow is the best possible likelihood distribution containing the measured ne erroneous bits with the probablility D. The average numbers of erroneous bits NEhigh and NElow for PDhigh and PDlow are obtained. NEhigh and NElow are compared with NElimit=BERlimit×ns. If NElimit is higher than NEhigh or NElimit is lower than NElow the test is stopped.

Abstract: A method for testing the time delay error ratio ER of a device against a maximal allowable time delay error ratio ERlimit with an early pass and/or early fail criterion, whereby the early pass and/or early fail criterion is allowed to be wrong only by a small probability D. ns time delays TD of the device are measured, thereby ne bad time delays of these ns time delays TD are detected. PDhigh and/or PDlow are obtained, whereby PDhigh is the worst possible likelihood distribution and PDlow is the best possible likelihood distribution containing the measured ne bad time delays with the probability D. The average numbers of erroneous bits NEhigh and NElow for PDhigh and PDlow are obtained. NEhigh and NElow are compared with NElimit=ERlimit ns. If NElimit is higher than NEhigh or NElimit is lower than NElow the test is stopped.

Abstract: A method for performing a statistical test on a device or radio channel, which has N outcomes in the form of N different events, whereby N is higher than two, with the following steps: measuring ns samples of the output of the device or radio channel under test, whereby occurs a specific number (na,nb,ne) of each event, defining a specific limit (L) for the test in a space spanned out by specific numbers of each event, erecting a N-1 dimensional likelihood distribution on several points of the limit (L), and constructing a threshold for fail of the radio channel or device and a threshold for pass of the radio channel or device by summing or integrating the N-1 dimensional likelihood distribution along unbroken paths parallel to the limit L until a predefined confidence level is reached.

Abstract: The invention concerns a method to evaluate whether a statistical time delay (TD) between a first event and a second event of a device under test is better than a test limit (TL). The method includes the steps: performing a minimum number N of tests and evaluating the time delay (TD) from each test; modeling a first probability distribution (P1) of the evaluated time delays (TD); obtaining a second probability distribution (P2) of the evaluated time delays (TD); performing a statistical transformation in order to obtain a third probability distribution (P3) of the evaluated time delays (TD); and deciding to pass the device under test, if a certain percentage of the area of the third probability distribution (P3) is on a good side (GS) of the test limit (TL2).

Abstract: A method for testing the time delay error ratio ER of a device against a maximal allowable time delay error ratio ERlimit with an early pass and/or early fail criterion, whereby the early pass and/or early fail criterion is allowed to be wrong only by a small probability D. ns time delays TD of the device are measured, thereby ne bad time delays of these ns time delays TD are detected. PDhigh and/or PDlow are obtained, whereby PDhigh is the worst possible likelihood distribution and PDlow is the best possible likelihood distribution containing the measured ne bad time delays with the probability D. The average numbers of erroneous bits NEhigh and NElow for PDhigh and PDlow are obtained. NEhigh and NElow are compared with NElimit=ERlimit ns. If NElimit is higher than NEhigh or NElimit is lower than NElow the test is stopped.

Abstract: A method for testing the (Bit) Error Ratio BER of a device against a maximal allowable (Bit) Error Ratio BERlimit with an early pass and/or early fail criterion, whereby the early pass and/or early fail criterion is allowed to be wrong only by a small probability F for the entire test. Ns bits of the output of the device are measured, thereby ne erroneous bits of these ns bits are detected. PDhigh and/or PDlow are obtained, whereby PDhigh is the worst possible likelihood distribution and PDlow is the best possible likelihood distribution containing the measured ne erroneous bits with a single step wrong decision probability D, which is smaller than the probability F for the entire test. The average numbers of erroneous bits NEhigh and NElow for PDhigh and PDlow are obtained. NEhigh and NElow are compared with NElimit=BERlimit ns. If NElimit the test is stopped. Sequential sampling with two one-tailed parametric hypothesis test for the poisson distribution.

Abstract: The invention concerns a method to evaluate whether a statistical time delay (TD) between a first event and a second event of a device under test is better than a test limit (TL). The method comprises the steps of: performing a minimum number N of tests and evaluating the time delay (TD) from each test; modelling a first probability distribution (P1) as a function of the elapsed time from the first occurrence of the first event to the first occurrence of the second event; obtaining a second probability distribution (P2) as a function of the elapsed time from the first occurrence of the first event to the N-th occurrence of the second event; performing a statistical transformation in order to obtain a third probability distribution (P3) as a function of the N-th occurence of the second event; deciding to pass the device under test according to the comparison of P3 with the test limite.

Abstract: A method for testing the (Bit) Error Ration BER of a device against a maximal allowable (Bit) Error Ratio BERlimit with a early pass and/or early fail criterion, whereby the early pass and/or early fail criterion is allowed to be wrong only by a small probability D. ns bits of the output of the device are measured, thereby ne erroneous bits of the ns bits are detected. PDhigh and/or PDlow are obtained, whereby PDhigh is the worst possible likelihood distribution and PDlow is the best possible likelihood distribution containing the measured ne erroneous bits with the probablility D. The average numbers of erroneous bits NEhigh and NElow for PDhigh and PDlow are obtained. NEhigh and NElow are compared with NElimit=BERlimit×ns. If NElimit is higher than NEhigh or NElimit is lower than NElow the test is stopped.

Abstract: For generating an RF signal modulated by a message and distorted by a predetermined fading profile for testing RF receivers, a sequence of digital phase and amplitude values which corresponds to the message modulation is arithmetically processed by a predetermined fading profile and stored in memory, and an RF carrier is amplitude and phase modulated by the stored values to produce a testing signal for the RF receivers.

Abstract: A sine-wave oscillator produces a sine-wave signal of a digitally predetermined frequency f in successive steps by only one multiplication and one addition under control by a clock generator having a clock frequency p. During a first step the value A.sub.(i+l) =A.sub.i +B.sub.i .multidot.k is determined and during a subsequent second step the value B.sub.(i+l) =B.sub.i -A.sub.(i+l) .multidot.k is determined therefrom, A.sub.(i+l) and B.sub.(i+l) being the respective newly calculated values, A.sub.i and B.sub.i being the respective previous values calculated in a preceding step, and k being a factor k=2.multidot.sin (.pi..multidot.f/p) calculated in a computer. The period of the successive steps is selected to be 1/2 p, and for the first step A.sub.(o) =0 and B.sub.(o) =cos (.pi..multidot.f/p) are selected. At least one of the two factors A.sub.(i+l) and B.sub.(i+l) is finally converted to an analog sine-wave signal in a digital-to-analog converter.