Abstract: An image-sensing device is disclosed, the image-sensing device comprising a multispectral sensor and a processor communicably coupled to the multispectral sensor. The processor is configured to determine an ambient light source classification based on a comparison of predefined spectral data to data corresponding to an output of the multispectral sensor. Also disclosed is a method of classifying an ambient light source by sensing a spectrum of light with a multispectral sensor; and determining an ambient light source classification based on a comparison of predefined spectral data to data corresponding to an output of the multispectral sensor. An associated computer program, computer-readable medium and data processing apparatus are also disclosed.

Abstract: Disclosed are methods and devices for calibration in the field of optical sensors, e.g. characterizing and calibrating an optical sensor chip. In order to address complexity of sensor data with high accuracy the optical sensor, e.g. an optical sensor is not provided as an already calibrated unit. Rather, sensor response data may be recorded in a defined or standardized environment, e.g. at a production line, and with high precision. This high standard sensor response data can be obtained on a per device basis and, thus, is referenced with an unambiguous chip identification number, chip ID. The sensor data is complemented with a dedicated calibration algorithm which can be tailor-made to fit the optical sensor or the optical sensor chip. In order to retrieve the sensor response data and the calibration algorithm both can be made available by means of the chip ID, for example.

Abstract: An apparatus for illuminating the surface of a material, comprising an illuminating device for illuminating the surface of the material with a calibrating light, a recording device for recording a measuring light, emitted by the surface of the material in response to the calibrating light, and a processor device for recording the spectral characteristic of the measuring light that characterizes a diffuse spectral reflectance of the surface of the material, wherein the illuminating device is configured to generate an illuminating light for illuminating the surface of the material that has a spectral characteristic that corresponds to the spectral characteristic of the measuring light.

Abstract: An apparatus for illuminating the surface of a material, comprising an illuminating device for illuminating the surface of the material with a calibrating light, a recording device for recording a measuring light, emitted by the surface of the material in response to the calibrating light, and a processor device for recording the spectral characteristic of the measuring light that characterizes a diffuse spectral reflectance of the surface of the material, wherein the illuminating device is configured to generate an illuminating light for illuminating the surface of the material that has a spectral characteristic that corresponds to the spectral characteristic of the measuring light.