Abstract: A load driver circuit for driving an electric or electronic load is described. In accordance with one example, a circuit includes a power supply circuit operably coupled to the load and configured to provide a load current operably passing through the load in accordance with at least one control signal. A measurement circuit is coupled to the power supply circuit or the load and configured to measure, during operation of the load, at least one operation parameter of the load. A signal processing circuit receives the at least one operation parameter measured by the measurement circuit and is configured to estimate, based on the at least one operation parameter and a parametric model that characterizes the load, one or more model parameters of the parametric model.

Abstract: Methods and apparatuses related to the generation of test stimuli are described. In some embodiments, a finite state machine is generated based on a mission profile, and test stimuli are generated based on the mission profile.

Abstract: A system is described that includes a power bus, a power source configured to supply power to the power bus, and a device receiving at least some of the power supplied by the power source. The device is configured to determine a quality level of the power received from the power bus, and perform an operation of the device according to the quality level of the power. The quality level of the power may be determined on an output from a wavelet transform. For example, the device may apply a wavelet transform to a function based on the power, isolate disturbances from the output of the wavelet transform, and based on the disturbances, determine the quality level of the power.

Abstract: A system is described that includes a power bus, a power source configured to supply power to the power bus, and a device receiving at least some of the power supplied by the power source. The device is configured to determine a quality level of the power received from the power bus, and perform an operation of the device according to the quality level of the power. The quality level of the power may be determined on an output from a wavelet transform. For example, the device may apply a wavelet transform to a function based on the power, isolate disturbances from the output of the wavelet transform, and based on the disturbances, determine the quality level of the power.

Abstract: A method for determining test sets of operating parameter values for an electronic component, the method including: determining a first set of intermediate sets, each intermediate set containing a combination of a first number of operating parameters of the electronic component; determining a second set of reference sets, wherein the second set contains a union of sets, each set comprising all possible combinations of parameter values for the parameters of a respective intermediate set; selecting a third set with a second number of test sets out of a set of predefined sets, wherein each predefined set comprises a different combination of the parameter values for all parameters from the predefined parameter set, such that the second set is a subset of a union of a number of sets, each set comprising all possible combinations of the first number of parameter values for all parameters of a respective test set.

Abstract: A load driver circuit for driving an electric or electronic load is described. In accordance with one example, a circuit includes a power supply circuit operably coupled to the load and configured to provide a load current operably passing through the load in accordance with at least one control signal. A measurement circuit is coupled to the power supply circuit or the load and configured to measure, during operation of the load, at least one operation parameter of the load. A signal processing circuit receives the at least one operation parameter measured by the measurement circuit and is configured to estimate, based on the at least one operation parameter and a parametric model that characterizes the load, one or more model parameters of the parametric model.

Abstract: Methods and apparatuses related to the generation of test stimuli are described. In some embodiments, a finite state machine is generated based on a mission profile, and test stimuli are generated based on the mission profile.

Abstract: A method for determining test sets of operating parameter values for an electronic component, the method including: determining a first set of intermediate sets, each intermediate set containing a combination of a first number of operating parameters of the electronic component; determining a second set of reference sets, wherein the second set contains a union of sets, each set comprising all possible combinations of parameter values for the parameters of a respective intermediate set; selecting a third set with a second number of test sets out of a set of predefined sets, wherein each predefined set comprises a different combination of the parameter values for all parameters from the predefined parameter set, such that the second set is a subset of a union of a number of sets, each set comprising all possible combinations of the first number of parameter values for all parameters of a respective test set.

Abstract: A method for determining test sets of operating parameter values for an electronic component, the method including: determining a first set of intermediate sets, each intermediate set containing a combination of a first number of operating parameters of the electronic component; determining a second set of reference sets, wherein the second set contains a union of sets, each set comprising all possible combinations of parameter values for the parameters of a respective intermediate set; selecting a third set with a second number of test sets out of a set of predefined sets, wherein each predefined set comprises a different combination of the parameter values for all parameters from the predefined parameter set, such that the second set is a subset of a union of a number of sets, each set comprising all possible combinations of the first number of parameter values for all parameters of a respective test set.

Abstract: In accordance with a preferred embodiment of the present invention, a method of testing a device includes a circuit includes a device-under-test and an emulated apparatus. The emulated apparatus includes digital circuitry that models a real device. The circuit is powered and a response of the circuit is calculated. The calculated response is determined at least based on the emulated apparatus. An analog response signal is generated based on the digitally calculated response. The analog response signal is applied to the device under test.

Abstract: A method for determining test sets of operating parameter values for an electronic component, the method including: determining a first set of intermediate sets, each intermediate set containing a combination of a first number of operating parameters of the electronic component; determining a second set of reference sets, wherein the second set contains a union of sets, each set comprising all possible combinations of parameter values for the parameters of a respective intermediate set; selecting a third set with a second number of test sets out of a set of predefined sets, wherein each predefined set comprises a different combination of the parameter values for all parameters from the predefined parameter set, such that the second set is a subset of a union of a number of sets, each set comprising all possible combinations of the first number of parameter values for all parameters of a respective test set.

Abstract: Methods and apparatuses for generating a random sequence of commands for a semiconductor device. The method generates random state transitions within a finite state machine model of the semiconductor device. A sequence of commands is determined which are associated to the generated random state transitions based on the finite state machine model of the semiconductor device.

Abstract: Methods and apparatuses for generating a random sequence of commands for a semiconductor device. The method generates random state transitions within a finite state machine model of the semiconductor device. A sequence of commands is determined which are associated to the generated random state transitions based on the finite state machine model of the semiconductor device.

Abstract: An apparatus for generating an output signal having a higher frequency than a first signal received from a first external connector of a test equipment associated to a first channel and a second signal received on a second external connector of the test equipment associated to a second channel, having a first connector adapted to be connected to said first external connector, and adapted to receive the first signal, a second connector adapted to be connected to said second external connector, and adapted to receive the second signal, wherein the first and second signals are out of phase, an output to be connected to the device under test, and a passive circuit for combining the signals received at said first and second connector into the output signal and for providing said output signal to said output.