Abstract: Test signal circuit for testing a radio frequency receiver circuit, including: a test signal generator configured to generate a baseband test signal, a modulator configured to modulate a local oscillator signal with the baseband test signal to generate a test signal, a first transmission element coupled between the modulator and an input of an impedance transforming element, a second transmission element coupled to an output of the impedance transforming element, the impedance transforming element configured to lower a first impedance level of the first transmission element to a second impedance level of a second transmission element, a voltage level detector coupled to the first transmission element, the voltage level detector being configured to detect a voltage level of the test signal. The disclosure further relates to a semiconductor chip including the test signal circuit and a system including the test signal circuit and a control circuit.

Abstract: A device may include a receive (Rx) antenna input to couple an Rx antenna to an Rx chain, and a signal coupler to inject the test signal toward the Rx antenna. The device may include an Rx antenna switch to, in a first switch state, cause the Rx antenna to be isolated from the Rx chain and, in a second switch state, permit the test signal to probe the Rx antenna. The Rx chain may measure a phasor of a first baseband signal generated based on a first reflected test signal and a phasor of a second baseband signal generated based on a second reflected test signal. The device may include a control circuit to compute a complex ratio based on the phasors, compute a measured reflection coefficient based on the complex ratio and using a transfer function, and monitor an impedance matching of the Rx antenna.

Abstract: A method for monitoring an RF receiver includes generating of a digital test signal based on a signal, wherein the digital test signal includes a stream of digital test samples having a digital test sample; generating a monitoring signal based on the digital test signal; and coupling of the monitoring signal into a receiver path. The monitoring signal is processed in the receiver path to generate a processed monitoring signal and a stream of digital monitoring samples representing the processed monitoring signal. Information is determined indicating at least one property related to the receiver path based on a processing of a set of digital monitoring samples of the stream of digital monitoring samples. The set of digital monitoring samples includes a digital monitoring sample. The method further includes controlling the RF receiver such that the digital monitoring sample is generated a predetermined time duration after generating the digital test sample.

Abstract: Test signal circuit for testing a radio frequency receiver circuit, including: a test signal generator configured to generate a baseband test signal, a modulator configured to modulate a local oscillator signal with the baseband test signal to generate a test signal, a first transmission element coupled between the modulator and an input of an impedance transforming element, a second transmission element coupled to an output of the impedance transforming element, the impedance transforming element configured to lower a first impedance level of the first transmission element to a second impedance level of a second transmission element, a voltage level detector coupled to the first transmission element, the voltage level detector being configured to detect a voltage level of the test signal. The disclosure further relates to a semiconductor chip including the test signal circuit and a system including the test signal circuit and a control circuit.

Abstract: A device may include a receive (Rx) antenna input to couple an Rx antenna to an Rx chain, and a signal coupler to inject the test signal toward the Rx antenna. The device may include an Rx antenna switch to, in a first switch state, cause the Rx antenna to be isolated from the Rx chain and, in a second switch state, permit the test signal to probe the Rx antenna. The Rx chain may measure a phasor of a first baseband signal generated based on a first reflected test signal and a phasor of a second baseband signal generated based on a second reflected test signal. The device may include a control circuit to compute a complex ratio based on the phasors, compute a measured reflection coefficient based on the complex ratio and using a transfer function, and monitor an impedance matching of the Rx antenna.

Abstract: A method for monitoring an RF receiver includes generating of a digital test signal based on a signal, wherein the digital test signal includes a stream of digital test samples having a digital test sample; generating a monitoring signal based on the digital test signal; and coupling of the monitoring signal into a receiver path. The monitoring signal is processed in the receiver path to generate a processed monitoring signal and a stream of digital monitoring samples representing the processed monitoring signal. Information is determined indicating at least one property related to the receiver path based on a processing of a set of digital monitoring samples of the stream of digital monitoring samples. The set of digital monitoring samples includes a digital monitoring sample. The method further includes controlling the RF receiver such that the digital monitoring sample is generated a predetermined time duration after generating the digital test sample.

Abstract: Noise test systems, methods, and circuitries are provided for determining a noise characteristic of a receiver. In one example, an integrated circuit device includes an active RF receiver element configured to process a radio frequency (RF) signal to generate a receiver signal; an up-conversion mixer configured to up-convert a test signal to generate an RF test signal; an attenuator configured to selectively adjust a power of the RF test signal to generate adjusted RF test signals; and a coupler configured to couple the adjusted RF test signals to an input of the active RF receiver element. In another example, instead of or in addition to the attenuator, the integrated circuit device includes first, second, and third power sensors configured to measure a power of the test signal, the RF test signal, and the receiver signal, respectively. The power measurements are used to determine the noise characteristic.