Patents by Inventor Thomas Oliver Merren
Thomas Oliver Merren has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 6707032Abstract: A plasma mass spectrometer comprises a plasma torch (1) for generating ions from a sample introduced into a plasma (2), a nozzle-skimmer interface (3,5) for transmitting said ions into a first evacuated chamber (11), ion guiding means (12), an apertured diaphragm (18) dividing said first evacuated chamber (11) from a second evacuated chamber, and an ion mass-to-charge ratio analyzer in the second chamber for producing a mass spectrum. The ion guiding means comprises a multipole rod-set (13,14,15), means for applying an AC voltage between rods in the set, and means (22) for introducing into said ion guiding means an inert gas selected from the group comprising helium, neon, argon, krypton, xenon and nitrogen so that the partial pressure of said inert gas inside said rod-set is at least 10−3 torr. Interfering peaks in the spectrum, such as Ar+, are thereby reduced.Type: GrantFiled: March 14, 2003Date of Patent: March 16, 2004Assignee: Micromass LimitedInventors: James Speakman, Raymond Clive Haines, Patrick James Turner, Thomas Oliver Merren, Stuart Alan Jarvis
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Publication number: 20030160168Abstract: A plasma mass spectrometer comprises a plasma torch (1) for generating ions from a sample introduced into a plasma (2), a nozzle-skimmer interface (3,5) for transmitting said ions into a first evacuated chamber (11), ion guiding means (12), an apertured diaphragm (18) dividing said first evacuated chamber (11) from a second evacuated chamber, and an ion mass-to-charge ratio analyzer in the second chamber for producing a mass spectrum. The ion guiding means comprises a multipole rod-set (13,14,15), means for applying an AC voltage between rods in the set, and means (22) for introducing into said ion guiding means an inert gas selected from the group comprising helium, neon, argon, krypton, xenon and nitrogen so that the partial pressure of said inert gas inside said rod-set is at least 10−3 torr. Interfering peaks in the spectrum, such as Ar+, are thereby reduced.Type: ApplicationFiled: March 14, 2003Publication date: August 28, 2003Inventors: James Speakman, Raymond Clive Haines, Patrick James Turner, Thomas Oliver Merren, Stuart Alan Jarvis
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Patent number: 6545270Abstract: A plasma mass spectrometer comprises a plasma torch (1) for generating ions from a sample introduced into a plasma (2), a nozzle-skimmer interface (3,5) for transmitting said ions into a first evacuated chamber (11), ion guiding means (12), an apertured diaphragm (18) dividing said first evacuated chamber (11) from a second evacuated chamber, and an ion mass-to-charge ratio analyzer in the second chamber for producing a mass spectrum. The ion guiding means comprises a multipole rod-set (13,14,15), means for applying an AC voltage between rods in the set, and means (22) for introducing into said ion guiding means an inert gas selected from the group comprising helium, neon, argon, krypton, xenon and nitrogen so that the partial pressure of said inert gas inside said rod-set is at least 10−3 torr. Interfering peaks in the spectrum, such as Ar+, are thereby reduced.Type: GrantFiled: March 14, 2001Date of Patent: April 8, 2003Assignee: Micromass LimitedInventors: James Speakman, Raymond Clive Haines, Patrick James Turner, Thomas Oliver Merren, Stuart Alan Jarvis
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Publication number: 20010010354Abstract: A plasma mass spectrometer comprises a plasma torch (1) for generating ions from a sample introduced into a plasma (2), a nozzle-skimmer interface (3, 5) for transmitting said ions into a first evacuated chamber (11), ion guiding means (12), an apertured diaphragm (18) dividing said first evacuated chamber (11) from a second evacuated chamber, and an ion mass-to-charge ratio analyzer in the second chamber for producing a mass spectrum. The ion guiding means comprises a multipole rod-set (13, 14, 15), means for applying an AC voltage between rods in the set, and means (22) for introducing into said ion guiding means an inert gas selected from the group comprising helium, neon, argon, krypton, xenon and nitrogen so that the partial pressure of said inert gas inside said rod-set is at least 10−3 torr.Type: ApplicationFiled: March 14, 2001Publication date: August 2, 2001Applicant: MICROMASS LIMITEDInventors: James Speakman, Raymond Clive Haines, Patrick James Turner, Thomas Oliver Merren, Stuart Alan Jarvis
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Patent number: 6222185Abstract: A plasma mass spectrometer comprises a plasma torch (1) for generating ions from a sample introduced into a plasma (2), a nozzle-skimmer interface (3,5) for transmitting said ions into a first evacuated chamber (11), ion guiding means (12), an apertured diaphragm (18) dividing said first evacuated chamber (11) from a second evacuated chamber, and an ion mass-to-charge ratio analyzer in the second chamber for producing a mass spectrum. The ion guiding means comprises a multipole rod-set (13,14,15), means for applying an AC voltage between rods in the set, and means (22) for introducing into said ion guiding means an inert gas selected from the group comprising helium, neon, argon, krypton, xenon and nitrogen so that the partial pressure of said inert gas inside said rod-set is at least 10−3 torr. Interfering peaks in the spectrum, such as Ar, are thereby reduced.Type: GrantFiled: May 30, 1997Date of Patent: April 24, 2001Assignee: Micromass LimitedInventors: James Speakman, Raymond Clive Haines, Patrick James Turner, Thomas Oliver Merren, Stuart Alan Jarvis
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Patent number: 3950641Abstract: Ions are formed from an unknown substance in a first ion source of a double beam mass spectrometer and accelerated therefrom at a low accelerating voltage, e.g. 1kV or 2kV. Ions are formed from a reference substance in the second ion source and accelerated therefrom at a relatively high accelerating voltage, e.g. 8kV. The ion beams so formed pass through a common magnetic analyser to produce respective mass spectra. With pefluorokerosene as a reference substance producing a reference mass scale up to about 1000a.m.u., the mass spectrum of the unknown substance can be accurately calibrated (mass marked) up to 8000a.m.u. or 4000a.m.u. (with the above exemplary low accelerating voltages). Thus the invention enables the inherently very accurate chemical mass marking ability of a double-beam mass spectrometer to be scaled up along the mass scale of the unknown substance.Type: GrantFiled: December 31, 1974Date of Patent: April 13, 1976Assignee: Associated Electrical Industries LimitedInventors: Sydney Evans, Thomas Oliver Merren