Abstract: An integrated circuit test system. The test system includes a controller and an integrated circuit coupled to a voltage source and a current monitor. The controller causes the voltage source to supply a voltage to the integrated circuit, receives a signal from the current monitor indicating a power dissipation of the integrated circuit, and causes the voltage source to reduce the voltage until the signal from the current monitor indicates the power dissipation of the integrated circuit is less than a predetermined threshold. The controller stores in the integrated circuit in a non-volatile storage register that is accessible via a subset of access pins, a value corresponding to the voltage supplied to the integrated circuit when the power dissipation of the integrated circuit is less than the predetermined threshold. The subset of access pins provides at least one function in addition to accessing the non-volatile storage register.

Abstract: Apparatus and methods are disclosed having application for use in data processing systems which include a plurality of data processing devices ("agents") coupled to a communication network and at least one system software resource. The system software resource may comprise a floppy disk drive, hard disk drive, magnetic tape, optical storage device or other data storage device. All programs, data and the like accessible to the system software resource are indexed and "clustered", such that the data/programs are grouped as they relate to one another to assure full functionality of the software being loaded. In the event that the desired program/data to be accessed by an agent is not stored in the system software resource, the method of the present invention includes the steps of suspending any further data processing operations by the agent. The system software resource, by scanning through the index of all available data/programs accessible to the system software resource.