Abstract: Methods, systems, and devices related to built-in self-test (BIST) circuitry of a controller. The controller can be coupled to multiple memory devices. The BIST circuitry can include registers configured to store burst patterns. The BIST circuitry can perform a BIST operation on the memory devices contemporaneously and using the number of burst patterns.

Abstract: A low insertion force connector for making electrical connection between electrical contacts on a printed circuit board assembly and external circuitry, and having an improved linear cam actuating mechanism is described. An elongated outer housing having a centrally located opening with a longitudinal channel along the bottom thereof, has spaced apart ramps positioned at the bottom of the channel. The housing has an aperture at each end thereof, and has external ramps on each end of the outer housing in a predetermined relationship to the associated aperture. A plurality of contacts are mounted within the outer housing on either side of the channel, with first ends interior the housing being bowed inwardly for contacting the printed circuit board assembly, and second ends extending through said outer housing for making electrical connection to external circuitry.