Abstract: A method of operating a computer having a graphical display device to allow a user to input data. The user is provided with an entry focus group and one or more secondary focus groups, no more than one of the focus groups being active at any given time. Each focus group has one or more data entry fields. At any given time, the user is restricted to the data entry fields in the currently active focus group. Initially, the entry focus group is active. The program accepts data entered by the user into at least one of the data entry fields in the entry focus group. One of the secondary focus groups is caused to become active in response to the user entering data into a predetermined one of the data entry fields in the entry focus group. In one embodiment of the present invention, the user is provided with at least two secondary focus groups. The secondary focus groups that becomes active is determined by examining the data entered in at least one of the data entry fields in the entry focus group.

Abstract: Disclosed is a control system and methodology used for defining and executing parametric test sequences using automated test equipment. The control system is divided into components which separate fixed, reusable information from information which is specific to particular tests. One component contains reference data which describes the configuration of the wafer being tested as well as specifications for the tests to be carried out. Another component contains a set of measurement algorithms that describe individual tests to be performed on generic types of devices or parametric test structures. Execution of a test is carried out by a general test program which retrieves stored reference and test definition information and supplies it to the measurement algorithms to enable them to perform measurements on specific devices in the user specified sequence.